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Trademarks
Malvern Panalytical, and/or its associated entities, have rights in the following trademarks. Trademarks denoted with TM are unregistered in any country/region (although there may be pending applications in one or more countries/regions). Trademarks denoted with ® are registered in at least one country/region. Any use of these trademarks without the express written consent of the trademark owner is strictly prohibited.
This listing may not be all-inclusive. To the extent that a name or logo is absent from the list does not constitute a waiver of any intellectual property rights that Malvern Panalytical and/or its associated entities has established in any of its trademarks and logos.
Trademarks listing last updated: 20 March 2025
| Trademark | Status |
|---|---|
| 1DER | ® |
| AERIS | ® |
| AERIS PANALYTICAL | ™
|
| ASD | ™
|
| (ASD Inc) logo | ® |
| AMASS | ® |
| AMPLIFY ANALYTICS | ® |
| AMPLIFY ANALYTICS (+ Logo) | ® |
| Archimedes | ® |
| AXIOS | ® |
| CHI-BLUE | ® |
| CLAISSE | ® |
| Claisse (+ Logo) | ® |
| CREOPTIX | ® |
| CUBIX | ® |
| CubiX3 | ® |
| dCore | ™ |
| EAGON | ® |
| Eagon 2 | ™
|
| EasySAXS | ® |
| EMPYREAN | ® |
| EPSILON | ® |
| EPSILON Xflow | ® |
| ExpertSAXS | ® |
| FIELDSPEC | ® |
| FIPA | ™ |
| FLUOR’X | ® |
| FORJ | ™
|
| GaliPIX3D | ® |
| Gemini | ™ |
| goLab | ™ |
| HandHeld 2 | ™ |
| HighScore | ® |
| Hydrosight | ™ |
| iCore | ™ |
| Indico Pro | ™ |
| INSITEC | ® |
| (Insitec logo) | ® |
| (Insitec Measurement Systems logo) | ® |
| ISYS | ® |
| LabSizer | ™ |
| LABSPEC | ® |
| LeNeo | ® |
| LeDoser | ™ |
| LeDoser-12 | ™ |
| M3 PALS | ™ |
| M4 | ™ |
| MADLS | ® |
| MALVERN | ® |
| (Triangular hills logo + Malvern Instruments) | ® |
| 马尔文 (Malvern in Chinese characters) | ® |
| MALVERN INSTRUMENTS | ® |
| 马尔文仪器 (Malvern Instruments in Chinese characters) | ™
|
| Malvern Link | ™ |
| (Malvern Plus Hills Logo) | ® |
| MALVERN PANALYTICAL | ® |
| 马尔文帕纳科 (MALVERN PANALYTICAL in Chinese characters) | ® |
| マルバーン·パナリティカル (MALVERN PANALYTICAL in Katakana) | ® |
| 말번 파날리티칼 (MALVERN PANALYTICAL in Korean script) | ® |
| MALVERN PANALYTICAL (+ X Logo) | ® |
| MASTERSIZER | ® |
| Mastersizer 2000 | ™ |
| MC (stylised) | ™
|
| MDRS | ® |
| MICROCAL | ® |
| MORPHOLOGI | ® |
| (Triangular hills logo) | ® |
| NanoSight | ® |
| NIBS | ™ |
| Oil-Trace | ® |
| Omnian | ® |
| OmniSEC | ® |
| OmniTrust | ® |
| PANALYTICAL | ® |
| 帕纳科 (PANALYTICAL in Chinese characters) | ® |
| パナリティカル (PANALYTICAL in Katakana) | ® |
| PANalytical AERIS | ® |
| PANalytical + logo | ® |
| PANTOS | ™
|
| PEAQ-ITC | ® |
| PIXcel | ® |
| PIXcel1D | ® |
| PIXcel3D | ® |
| PIXIRAD | ® |
| QUALITYSPEC | ® |
| REVONTIUM
| ® |
| SMART RETURN
| ™ |
| Spraytec | ™ |
| SST | ® |
| SST-mAX | ® |
| SUPER SHARP TUBE | ® |
| Stratos | ® |
| SuperQ | ® |
| SyNIRgi | ™ |
| TERRASPEC | ® |
| TheOx | ® |
| Ultrasizer | ™ |
| VENUS MINILAB | ™
|
| ViewSpec | ™ |
| Viscogel | ™ |
| VISCOTEK | ® |
| Viscotek SEC-MALS | ™ |
| WAVEchip | ® |
| WAVEcore | ® |
| waveRAPID
| ® |
| WE'RE BIG ON SMALL | ®
|
| (X Logo) | ® |
| X’CELERATOR | ® |
| X'Pert3 | ® |
| ZETASIZER | ® |
| ZETIUM | ® |
| ZS Helix | ™ |
Patents
Malvern Panalytical, and/or its associated entities, have a range of unique, market leading products that are protected by the following patents, pending patent applications, registered designs and/or pending design applications.
This website is made available to you for the purpose of research, to provide our competitors with constructive notice, and to satisfy the virtual patent marking provisions of various jurisdictions (including section 16 of the America Invents Act and 35 U.S.C. § 287 of the patent laws of the United States of America, and under section 62(1) of the UK Patents Act).
For convenience, publication numbers are provided below. Those suffixed by ‘A’, ‘A1’, ‘A2’ or ‘A3’ refer to pending applications. Those suffixed by ‘B’, ‘B1’ or ‘B2’ refer to granted patents.
Whilst efforts are made to ensure completeness, the patent process is dynamic and the content of this list will change over time (for reasons, such as: new filings, publications, issuance, abandonment, expiration, lapsing, product changes, licensing, or other circumstances).
This listing may not be all-inclusive. The products listed may be protected by additional patents or pending patents, and other products not listed here may be protected by one or more patents or pending patents. The absence of any patent or product from this list does not prevent enforcing any and all legal rights associated with the patent or product.
Patents listing last updated: 20 March 2025
Mastersizer
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| GB2494735B | Apparatus for measuring particle-size distribution by light scattering | Mastersizer 3000, Mastersizer 3000E, Mastersizer 3000+ range |
| CN104067105B (ZL201280042740.0)
EP2756283B1 (GB, FR, DE602012015707.0) US9869625B2 JP6154812B2 | Apparatus and method for measuring particle-size distribution by light scattering | Mastersizer 3000, Mastersizer 3000+ Ultra |
| US10837889B2
GB2494734B | Apparatus and method for measuring particle-size distribution by light scattering | Mastersizer 3000, Mastersizer 3000E, Mastersizer 3000+ range |
| WO2024023498A2
EP4312015A1 | PARTICLE CHARACTERISATION | Mastersizer 3000+: Pro and Ultra |
| WO2024023497A1 | Data Quality | Mastersizer 3000+: Pro and Ultra |
| WO2024180386A1 | PARTICLE CHARACTERISATION | Mastersizer 3000+: Ultra |
Zetasizer
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| EP2467701B1 (CH+LI, GB, FR, DE602010067652.8)
CN102575984B (ZL201080036806.6) US9279765B2 JP5669843B2 US10317339B2 US11237106B2 | Dynamic Light Scattering Based Microrheology of Complex Fluids with Improved Single-Scattering Mode Detection | Zetasizer Advance Range, Nano ZSP, Helix |
| CN103608671B (ZL201280027695.1)
CN105891304B (ZL201610324224.7) EP2721399B1 (BE, CH+LI, DK, FR, GB, NL, DE602012031338.2, IT502017000050268) JP6023184B2 US9829525B2 US10274528B2 US11079420B2 | Surface Charge Measurement | Zeta Plate Cell Accessory |
| US8702942B2
CN103339500B (ZL201180060863.2) EP2652490B1 (GB, FR, DE602011046775.1) JP6006231B2 JP6453285B2 US10648945B2 US11988631B2 | Laser Doppler Electrophoresis Using a Diffusion Barrier | Zetasizer Advance Range, Nano ZS, Nano S, Nano ZS90, S90, Nano ZSP |
| EP2742337B1 (GB, FR, DE602012018122.2)
US9816922B2 | Dual mode characterization of particulates | Zetasizer Helix |
| US10197485B2
US10520412B2 US10845287B2 US11435275B2 EP3353527B1 (GB, FR, DE602016077138.1) JP6936229B2 CN108291861B (ZL201680068213.5) JP7361079B EP4215900A1 | Particle characterization | Zetasizer Advance range |
| US10119910B2 | Particle characterization instrument | Zetasizer Advance: Ultra and Pro |
| US8675197B2
JP6059872B2 EP2404157B1 (GB, FR, DE602010066495.3) | Particle characterization | Zetasizer Advance accessory |
| EP3521806B1 (AT, FR, GB, DE602018077164.6)
US11441991B2 CN111684261B (ZL201980011816.5) JP7320518B2 | Multi-angle dynamic light scattering | Zetasizer Advance: Ultra |
| Designs:
DM/100202 (EM: D100202-0001, D100202-0002; GB: 81002020001000, 81002020002000; JP: JP1614066S; US: D878227S) CN304816039S (ZL201730635419.9) | Particle characterization devices | Zetasizer Advance Range |
Insitec
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US7871194B2
EP1869429B1 (GB, FR, DE602006060213.8) | Dilution system and method | Insitec (some products) |
| EP2640499B1 (GB) | In-line disperser and powder mixing method | Insitec dry |
Morphologi
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| EP2106536B1 (GB, FR, DE602008039489.1)
US8111395B2 US8564774B2 | Spectrometric Investigation of hetrogeneity | Morphologi G3-ID, Morphologi 4-ID |
| GB2522735B
JP6560849B2 | Method and Apparatus for Powder Dispersion | Morphologi G3-ID, Morphologi G3, Morphologi 4, Morphologi 4-ID |
| EP3510526B1 (GB, FR, DE60217072468.8)
US11068740B2 CN109716355B (ZL201780054158.9) JP7234106B2 | Particle Boundary Identification | Morphologi 4, Morphologi 4-ID |
| US8004662B2
US8842266B2 | PHARMACEUTICAL MIXTURE EVALUATION | Morphologi 4-ID |
| Designs:
DM/100537 (EM: D100 537-0001, D100 537-0002; GB: 81005370001000, 81005370002000; JP: JP1622788S, JP1623345S; US: D862261S1) CN304677453S (ZL201730616458.4) | Measuring instruments [other than for measuring time] | Morphologi 4, Morphologi 4-ID |
Viscosizer
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US11113362B2
JP6917897B2 EP3274864A1 CN107430593B (ZL201680017577.0) | Multi-Component Model Parameterisation | Viscosizer TD |
Hydro Sight
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| CN104704343B (ZL201380044016.6)
EP2864760B1 (GB, FR, DE602013085354.1) US10509976B2 | Heterogeneous Fluid Sample Characterisation | Hydro Sight |
NanoSight
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| EP3071944B1 (GB, FR, DE602014059002.0)
US9909970B2 JP6505101B2 CN105765364B (ZL201480063550.6) | Improvements in or relating to calibration of instruments | NanoSight NS300, NanoSight Pro |
| WO2023148528A1
EP4476523A1 CN118984933A JP2025505204A | PARTICLE ANALYSIS | NanoSight Pro |
| WO2024094987A1 | APPARATUS FOR AND METHOD OF CHARACTERISING PARTICLES | NanoSight Pro |
MicroCal ITC
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| CN101855541B (ZL200880114826.3)
EP2208057B1 (CH+LI, GB, FR, DE602008065108.8) JP05542678B2 US8449175B2 US8827549B2 | Isothermal Titration Microcalorimeter apparatus and method of use | MicroCal ITC Range |
| CN102232184B (ZL200980149081.9)
EP2352993B1 (CH+LI, GB, FR, DE602009044685.1) JP5476394B2 US9103782B2 US9404876B2 US10036715B2 US10254239B2 EP3144666B1 (CH+LI, GB, FR, DE602009059932.1) US20200025698A1 EP3647776B1 (CH+LI, GB, FR, DE602009065333.4) | Automatic Isothermal Titration Microcalorimeter Apparatus and method of Use | MicroCal ITC Range |
MicroCal DSC
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US8635045B2
CN103221808B (ZL201180057401.5) EP2646811B1 (GB, FR, DE 602011071793.6) IN336472 JP5925798B2 | Method for Automatic Peak Finding in Calorimetric Data | MicroCal DSC Range |
| Designs:
DM/097302 (EM: D097 302; GB: 80973020001000; JP: JP1619772S, JP1643496S; US: D826739S1) CN304227374S (ZL201730043139.9) | Differential scanning microcalorimeter | PEAQ-DSC range |
OMNISEC
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US9759644B2
US10551291B2 | Balanced Capillary Bridge Viscometer | OMNISEC |
| US9612183B2
EP2619543B1 (GB, FR, DE602011011174.4) JP5916734B2 CN103168223B (ZL201180046166.1) IN341558 | Modular Capillary Bridge Viscometer | OMNISEC |
QualitySpec 7000
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US8164747B2
CA2667650C EP2092296B1 (CH+LI, NL, SE, DK, DE602007045593.6) | Apparatus, system and method for optical spectroscopic measurements | QualitySpec 7000 |
TerraSpec Halo
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US9207118B2 | Apparatus, system and method for scanning monochromator and diode array spectrometer instrumentation | TerraSpec Halo |
QualitySpec Trek
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US9207118B2 | Apparatus, system and method for scanning monochromator and diode array spectrometer instrumentation | QualitySpec Trek |
Floor standing XRF
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US8210000B2
JP5554163B2 CN101941789B (ZL201010223406.8) EP2270410B1 (GB, FR, NL, DE602009003389.1) AU2010202662B2 | Bead furnace | Zetium
Axios FAST Epsilon5 |
| JP4950523B2
| Apparatus and method for correcting abberations
| Zetium*
Axios FAST* 2830 ZT (wafer analyser)* Epsilon5* SEMYOS* |
| US7949092B2
| Device and method for performing X-ray analysis
| Zetium*
Axios FAST* 2830 ZT (wafer analyser)* Epsilon5* SEMYOS |
| US9658352B2
CN104833557B (ZL201510120748.X) JP656263B2 JP6804594B2 | Method of making a standard | Zetium
Axios FAST |
| EP2787342B1 (GB, FR, NL, DE602013028642.6)
JP6360151B2 | Preparation of sample-pellets by pressing | Zetium
Axios FAST |
| US10107551B2
EP2966039B1 (GB, FR, NL, DE602014024004.2) JP6559486B2 CN105258987B (ZL201510504763.4) | Preparation of samples for XRF using flux and platinum crucible | Zetium
Axios FAST |
| US9784699B2
JP6861469B2 CN105937890B (ZL201610119027.1) EP3064931B1 (GB, FR, NL, CH, DE602016057221.4) | Quantitative X-ray Analysis - Matrix thickness correction | Zetium*
Axios FAST |
| US9739730B2
JP6706932B2 CN105938113B (ZL201610121520.7) EP3064933B1 (GB, FR, NL, CH, DE602016056347.9) | Quantitative X-ray Analysis - Multi optical path instrument | Zetium*
Axios FAST |
| US9851313B2
JP6762734B2 CN105938112B (ZL201610121518.X) EP3064932B1 (GB, FR, NL, CH+LI, DE602016024126.9) | Quantitative X-ray Analysis - Ratio correction | Zetium*
Axios FAST |
| US9239305B2 | Sample holder | Zetium*
Axios FAST* Epsilon5 |
| US7720192B2
JP5574575B2 CN101311708B (ZL200810127759.0) | X-ray fluorescence apparatus | Zetium*
Axios FAST* 2830 ZT (wafer analyser)* Epsilon5* SEMYOS* |
| US8223923B2
JP5266310B2 CN101720491B (ZL200880018575.9) EP1983547B1 (GB, FR, NL, DE602008000361D1) | X-ray source with metal wire cathode | Zetium
Axios FAST 2830 ZT (wafer analyser) Epsilon5 SEMYOS |
| US9911569B2
JP7154731B2 CN105810541B (ZL201610016276.8) EP3043371B2 (GB, FR, NL, DE602015012421.9) | X-ray Tube Anode Arrangement
| Zetium
Axios FAST 2830 ZT (wafer analyser) Epsilon5 SEMYOS |
| US10281414B2
EP3330701B1 (CH+LI, GB, FR, NL, DE602017006751.2) EP3480587B1 (GB, FR, NL, DE602017061400.9) US10393683B2 JP6767961B2 CN108132267B (ZL201711251653.7) | Conical collimator for X-ray measurements | Zetium* |
| *· Optional / not standard in product | ||
Benchtops XRF
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US8210000B2
JP5554163B2 CN101941789B (ZL201010223406.8) EP2270410B1 (GB, FR, NL, DE602009003389.1) | Bead furnace | Epsilon 1 range
Epsilon 3X spectrometers Epsilon 4 Air Quality edition |
| JP4950523B2
| Apparatus and method for correcting abberations
| Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US7949092B2
| Device and method for performing X-ray analysis
| Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US9658352B2
CN104833557B (ZL201510120748.X) JP6562635B2 JP6804594B2 | Method of making a standard | Epsilon 1 range
Epsilon 3X spectrometers Epsilon 4 Air Quality edition |
| EP2787342B1 (GB, FR, NL, DE602013028642.6)
JP6360151B2 | Preparation of sample pellets by pressing | Epsilon 1 range
Epsilon 3X spectrometers Epsilon 4 Air Quality edition |
| US10107551B2
JP6559486B2 CN105258987B (ZL201510504763.4) EP2966039B1 (GB, FR, NL, DE602014024004.2) | Preparation of samples for XRF using flux and platinum crucible | Epsilon 1 range
Epsilon 3X spectrometers Epsilon 4 Air Quality edition |
| US9784699B2
JP6861469B2 CN105937890B (ZL201610119027.1) EP3064931B1 (GB, FR, NL, CH, DE602016057221.4) | Quantitative X-ray Analysis - Matrix thickness correction | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US9739730B2
JP6706932B2 CN105938113B (ZL201610121520.7) EP3064933B1 (GB, FR, NL, CH, DE602016056347.9) | Quantitative X-ray Analysis - Multi optical path instrument | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US9851313B2
JP6762734B2 CN105938112B (ZL201610121518.X) EP3064932B1 (GB, FR, NL, CH+LI, DE602016024126.9) | Quantitative X-ray Analysis - Ratio correction | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US9239305B2 | Sample holder | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US9547094B2
CN104849295B (ZL201510155965.2) EP2908127B1 (CH+LI, GB, FR, NL, DE602014011398.2) JP6526983B2 | X-ray analysis apparatus
| Epsilon 1 range
Epsilon 3X spectrometers Epsilon 4 Air Quality edition |
| US8223923B2
JP5266310B2 CN101720491B (ZL200880018575.9) EP1983547B1 (GB, FR, NL, DE602008000361D1) | X-ray source with metal wire cathode | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US9911569B2
JP7154731B2 CN105810541B (ZL201610016276.8) EP3043371B2 (GB, FR, NL, DE602015012421.9) | X-ray Tube Anode Arrangement
| Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US11183355B2
EP3675148A1 JP7601502B2 CN111383876B (ZL201911390180.8) | X-ray Tube | Revontium |
| EP24169034.6 (not yet published)
| Iteratively calculated complementary background fitting | Revontium |
| EP24169094.0 (not yet published)
| A sample handling apparatus | Revontium |
| * Optional / not standard in product | ||
Floor standing XRD
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| JP4950523B2
| Apparatus and method for correcting abberations | Empyrean
X'Pert³ Powder X'Pert³ MRD (XL) CubiX³ range |
| US9506880B2
CN104251870B (ZL201410299083.9) EP2818851B1 (CH+LI, GB, FR, NL, DE602013084303.1) JP6403452B2 | Diffraction imaging | Empyrean#
X'Pert³ Powder# X'Pert³ MRD (XL)# CubiX³ range# |
| US7858945B2
JP5254066B2 CN101521246B (ZL200910129197.8) EP2088451B1 (GB, FR, NL, DE602008041760.3) | Imaging Detector | Empyrean#
X'Pert³ Powder# X'Pert³ MRD (XL)# CubiX³ range# |
| EP2088625B1 (GB, FR, NL, CH + LI, DE602009040563.2) | Imaging detector | Empyrean#
X'Pert³ Powder# X'Pert³ MRD (XL)# CubiX³ range# |
| US9110003B2
CN103383363B (ZL201310069293.4) EP2634566B1 (GB, FR, NL, DE602012058202.2) JP6198406B2 | Microdiffraction
| Empyrean#
X'Pert³ Powder# X'Pert³ MRD (XL)# CubiX³ range# |
| US9640292B2
CN104777179B (ZL201410833194.3) EP2896960B1 (GB, FR, NL, DE602014012155.1) JP6564683B2 | X-ray apparatus
| Empyrean
X'Pert³ Powder CubiX³ range |
| US7756248B2
JP5145263B2 CN101545873B (ZL200910134609.7) EP2090883B1 (GB, FR, NL, DE602008002143D1) | X-ray detection in packaging
| Empyrean
X'Pert³ Powder X'Pert³ MRD (XL) |
| US8477904B2
JP5752434B2 CN102253065B (ZL201110072597.7) EP2365319B1 (GB, FR, NL, DE602011055847.1) | X-ray diffraction and computed tomography | Empyrean
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US7542547B2
JP5280057B2 CN101256160B (ZL200810095161.8) EP1947448B1 (CH+LI, GB, FR, NL, DE602007031351.1) | X-ray diffraction equipment for X-ray scattering
| X'Pert³ Powder*
X'Pert³ MRD (XL)* |
| US7477724B2
| X-ray instrument | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range |
| US8437451B2
JP5999901B2 CN102610290B (ZL201210007967.3) EP2477191B1 (CH+LI, GB, FR, NL, DE602011035906.1) | X-ray shutter arrangement | Empyrean
X'Pert³ Powder X'Pert³ MRD (XL) CubiX³ range |
| US9911569B2
JP7154731B2 CN105810541B (ZL201610016276.8) EP3043371B1 (GB, FR, NL, DE602015012421.9) | X-ray Tube Anode Arrangement
| Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| EP3553508A2
US11035805B2 JP7398875B2 CN110389142B (ZL201910295269.X) | X-ray analysis apparatus and method | Empyrean* |
| US10359376B2
EP3273229B1 (CH+LI, GB, FR, NL, DE602017069169.0) JP6701133B2 CN107643308B (ZL201710593858.7) | Sample holder for X-ray analysis | Empyrean* |
| US10782252B2
CN110376231A EP3553506A2 JP7258633B2 | Apparatus and method for x-ray analysis with hybrid control of beam divergence | Empyrean*
|
| US10753890B2
EP3372994B1 (AT, CZ, GB, FR, NL, PL, DE602018003874.4) CN108572184B (ZL201810190461.8) JP6709814B2 | High resolution X-ray diffraction method and apparatus | Empyrean* |
| EP3553509B1 (AT, GB, FR, NL, DE602019017362.8)
JP7208851B2 US10900912B2 CN110389143B (ZL201910300453.9) | X-ray analysis apparatus | Empyrean* |
| US10352881B2
EP3343209B1 (GB, FR, NL, DE602017032595.3) CN108240998B (ZL201711404282.1) JP6839645B2 | Computed tomography | Empyrean* |
| US9753160B2
CN104285164B (ZL201380025271.6) EP2850458B1 (GB, FR, NL, DE602013040524.7, IT502018000029139) JP6277351B2 | Digital X-ray sensor | Empyrean
X'Pert³ CubiX³ range |
| EP3719484B1 (AT, CZ, FR, GB, NL, PL, DE602019046393.6, IT502024000012301)
US12007343B1 CN113661389B (ZL202080027081.8) JP7503076B2 | X-ray beam shaping apparatus and method | Empyrean* |
| EP4111184A1
US20230296538A1 CN116368379A JP2023538446A | X-ray detector for X-ray diffraction analysis apparatus | Empyrean* (with 1Der detector) |
| EP4094073A1
US20230293127A1 CN116438449A JP2023538445A | Identifying charge sharing in X-ray diffraction | Empyrean* (with 1Der detector) |
| * Optional / not standard in product
# Available by special request | ||
Benchtops XRD
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| JP4950523B2
| Apparatus and method for correcting abberations | Aeris
|
| US9506880B2
CN104251870B (ZL201410299083.9) EP2818851B1 (CH+LI, GB, FR, NL, DE602013084303.1) JP6403452B2 | Diffraction imaging | Aeris*
|
| EP2088625B1 (CH+LI, GB, FR, NL, DE602009040563.2) | Imaging detector | Aeris*
|
| US9640292B2
JP6564572B2 CN104777179B (ZL201410833194.3) EP2896960B1 (GB, FR, NL, DE602014012155.1) | X-ray apparatus | Aeris |
| US8477904B2
JP5752434B2 CN102253065B (ZL201110072597.7) EP2365319B1 (GB, FR, NL, DE602011055847.1) | X-ray diffraction and computed tomography | Aeris*
|
| US7542547B2
JP5280057B2 CN101256160B (ZL200810095161.8) EP1947448B1 (CH+LI, GB, FR, NL, DE602007031351.1) | X-ray diffraction equipment for X-ray scattering
| Aeris*
|
| US7477724B2
| X-ray instrument | Aeris*
|
| US8437451B2
JP5999901B2 CN102610290B (ZL201210007967.3) EP2477191B1 (CH+LI, GB, FR, NL, DE602011035906.1) | X-ray shutter arrangement | Aeris
|
| US9911569B2
JP7154731B2 CN105810541B (ZL201610016276.8) EP3043371B1 (GB, FR, NL, DE602015012421.9) | X-ray Tube Anode Arrangement
| Aeris*
|
| US10753890B2
EP3372994B1 (AT, CZ, DE602018003874.4, GB, FR, NL, PL) CN108572184B (ZL201810190461.8) JP6709814B2 | High resolution X-ray diffraction method and apparatus
| Aeris*
|
| EP4094073A1
US20230293127A1 CN116438449A JP2023538445A | Identifying charge sharing in X-ray diffraction
| Aeris* (with 1Der detector) |
* Optional / not standard in product | ||
Sample preparation
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| WO2024164079A1 | FUSION SYSTEM AND METHOD OF PERFORMING SAMPLE FUSION THEREWITH | FORJ |
| WO2024164080A1 | FUSION SYSTEM AND METHOD OF PERFORMING SAMPLE FUSION THEREWITH | FORJ |
| WO2024164081A1 | FUSION SYSTEM AND METHOD OF PERFORMING SAMPLE FUSION THEREWITH | FORJ |
| WO2024164082A1 | FUSION SYSTEM AND METHOD OF PERFORMING SAMPLE FUSION THEREWITH | FORJ |
| WO2024164086A1 | FUSION SYSTEM AND METHOD OF PERFORMING SAMPLE FUSION THEREWITH | FORJ* |
| WO2024164083A1 | PILL DELIVERY SYSTEM FOR FUSION DEVICE | FORJ* |
| Designs:
US 29/873,668 (not yet published) CA 224,605;235,581; 235,582; 235,583; 235,584; 235,585; 235,586; 235,587 (all registered) DM/232583: EM, GB (both registered); BR (not yet published) AU202316700 AU202410300 CN308681450S (ZL202330644590.1) ZA: A2023/01083, A2023/01084, A2023/01085, A2023/01086 | Sample holder | FORJ crucible and/or mold cassette |
| * Optional / not standard in product | ||
WAVEsystem (Creoptix)
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| EP3824469B1 (CH+LI, GB, FR, SE, DE602019066157.6) | Method for calculating kinetic parameters of a reaction network | WAVEdelta, WAVEcontrol |
| CN113811771B (ZL202080036463.7)
EP3969910B2 (CH+LI, FR, GB, SE, DE602021016832.2) JP2022532479A US20220162697A1 | Methods For Determining Kinetic Parameters of a Reaction Between Analyte and Ligands | WAVEdelta, WAVEcontrol |
| CN115667930A
EP4172625B2 (CH+LI, FR, GB, SE, DE602021016832.2) JP2023531046A US20230273202A1 | A Method For Determining Kinetic Parameters of a Reaction | WAVEdelta, WAVEcontrol |
| EP3448564B1 (CH+LI, FR, GB, SE, DE602017039989.2)
CN108883414B (ZL201780021418.2) JP6846434B2 US11135581B2 | Methods and Assemblies For Molecule Recovery | WAVEdelta |
| EP2137514B1 (CH+LI, FR, GB, SE, DE502008016144.9)
US8325347B2 | Integrated optical sensor | WAVE, WAVEdelta, WAVEchip |