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Trademarks
| Trademark | Status |
|---|---|
| AERIS | ® |
| AERIS PANALYTICAL | ® |
| (ASD Inc) logo | ® |
| Archimedes | ® |
| AXIOS | ® |
| Bohlin | ™ |
| CHI-BLUE | ® |
| Claisse | ® |
| CUBIX | ® |
| CUBIX3 (superindex the 3) | ® |
| dCore | ™ |
| EAGON | ® |
| Eagon 2 | ® |
| EASY SAXS | ® |
| EMPYREAN | ® |
| EPSILON | ® |
| EPSILON X-FLOW | ® |
| EXPERT SAXS | ® |
| EASY SAXS | ® |
| FieldSpec | ® |
| FIPA | ® |
| FLUOR’X | ® |
| GALIPIX 3D | ® |
| Gemini | ™ |
| goLab | ™ |
| HandHeld 2 | ™ |
| HIGHSCORE | ® |
| Hydrosight | ™ |
| iCore | ™ |
| (i logo) | ® |
| Indico Pro | ™ |
| Insitec | ® |
| (Insitec logo) | ® |
| (Insitec Measurement Systems logo) | ® |
| ISys | ® |
| LabSizer | ™ |
| LabSpec | ® |
| LeNeo | ® |
| LeDoser | ™ |
| LeDoser-12 | ™ |
| M3 PALS | ™ |
| M4 | ™ |
| MADLS | ® |
| Malvern | ® |
| (Triangular hills logo + Malvern Instruments) | ® |
| Malvern in Chinese characters | ® |
| Malvern Instruments | ® |
| Malvern Instruments in Chinese characters | ® |
| Malvern Link | ™ |
| (Malvern Plus Hills Logo) | ® |
| Mastersizer | ® |
| Mastersizer 2000 | ™ |
| MC (stylised) | ® |
| MDRS | ® |
| Microcal | ® |
| Morphologi | ® |
| (Triangular hills logo) | ® |
| Nanosight | ® |
| NIBS | ™ |
| OIL-TRACE | ® |
| OMNIAN | ® |
| OMNISEC | ® |
| PANALYTICAL | ® |
| PANALYTICAL LOGO (picture) | ® |
| PANTOS | ® |
| PEAQ-ITC | ® |
| PIXCEL | ® |
| PIXCEL 1D | ® |
| PIXCEL 3D | ® |
| QualitySpec | ® |
| (r logo) | ® |
| (Realogica logo) | ® |
| Spraytec | ™ |
| SST | ® |
| SST-MAX | ® |
| SUPER SHARP TUBE | ® |
| STRATOS | ® |
| SUPER Q | ® |
| SyNIRgi | ® |
| TerraSpec | ® |
| TheOx® Advanced | ® |
| Ultrasizer | ® |
| VENUS MINILAB | ® |
| ViewSpec | ™ |
| Viscogel | ® |
| Viscotek | ® |
| X’CELERATOR | ® |
| XPERT3 (superindex the 3) | ® |
| Zetasizer | ® |
| ZETIUM | ® |
| ZS Helix | ® |
Patents
Malvern Panalytical has a range of unique, market leading, products that are protected by the following patent and patent applications
Mastersizer
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| EP1167946B1 (GB, FR, DE60135521D1) | Sample handling system | Hydro MV, Hydro LV, Hydro EV |
| GB2364774B
US6800251B2 | Sample handling system for use in a particle characterisation apparatus | Hydro MV, Hydro LV |
| GB2494735B | Apparatus for measuring particle-size distribution by light scattering | MS3000, MS3000E |
| CN104067105B
EP2756283B1 (GB, FR, DE602012015707.0) US9869625B2 JP6154812B | Apparatus and method for measuring particle-size distribution by light scattering | MS3000, MS3000E |
| US10837889B2
GB2494734B | Apparatus and method for measuring particle-size distribution by light scattering | MS3000, MS3000E |
Zetasizer
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US7217350B2
| Mobility and Effects Arising from Surface Charge | Zetasizer Advance Range, Nano ZS, Nano Z, Nano ZS90, Nano ZSP, Helix |
| EP2467701A1
CN102575984B US9279765B2 JP5669843B2 US10317339B2 US20200096443A1 | Dynamic Light Scattering Based Microrheology of Complex Fluids with Improved Single-Scattering Mode Detection | Zetasizer Advance Range, Nano ZSP, Helix |
| CN103608671B
CN105891304B EP2721399B1 (BE, CH+LI, DK, FR, GB, NL, DE602012031338.2, IT502017000050268) JP06023184B2 US9829525B2 US10274528B2 US20200072888A1 | Surface Charge Measurement | Zeta Plate Cell Accessory |
| US8702942B2
CN103339500B EP2652490B1 (GB, FR, DE602011046775.1) JP06006231B2 JP06453285B2 US10648945B2 | Laser Doppler Electrophoresis Using a Diffusion Barrier | Zetasizer Advance Range, Nano ZS, Nano S, Nano ZS90, S90, Nano ZSP |
| EP2742337B1 (GB, FR, DE602012018122.2)
US9816922B2 | Dual mode characterization of particulates | Zetasizer Helix |
| US10197485B2
US10520412B2 US10845287B2 EP3353527A1 JP2018535429A CN108291861A | Particle characterization | Zetasizer Advance range |
| US10119910B2 | Particle characterization instrument | Zetasizer Advance: Ultra and Pro |
| US8675197B2
JP6059872B2 EP2404157B1 | Particle characterization | Zetasizer Advance accessory |
| EP3521806A1
US20210063295A1 CN111684261A WO2019154882A1 | Multi-angle dynamic light scattering | Zetasizer Advance: Ultra |
Insitec
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US7418881B2
EP1592957B1 (GB) | Dilution system and method | Insitec (some products) |
| US7871194B2
EP1869429A2 | Dilution system and method | Insitec (some products) |
| EP2640499B1 (GB) | In-line disperser and powder mixing method | Insitec dry |
Morphologi
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| EP2106536B1 (GB, FR, DE602008039489.1)
US8111395B2 US8564774B2 | Spectrometric Investigation of hetrogeneity | Morphologi G3-ID |
| GB2522735B
JP6560849B2 | Method and Apparatus for Powder Dispersion | Morphologi G3-ID, Morphologi G3 |
Viscosizer
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US2018067901A1
JP2018511129A EP3274864A1 CN107430593A | Multi-Component Model Parameterisation | Viscosizer TD |
Hydro Sight
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US8456633B2 | Spectrometric Process Monitoring | Hydro Sight |
| CN104704343B
EP2864760A2 US10509976B2 | Heterogeneous Fluid Sample Characterisation | Hydro Sight |
NanoSight
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US7751053B2
JP04002577B2 EP1499871B1 (FR, DE60335872.1) GB2388189B US7399600B2 | Optical Detection for Analysis of Particles | NanoSight NS300
NanoSight NS500 NanoSight LM10 |
| EP3071944B1 (GB, FR, DE602014059002.0)
US9909970B2 JP6505101B2 CN105765364A | Improvements in or relating to calibration of instruments | NanoSight NS300 |
MicroCal ITC
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| CN101855541B
EP2208057A1 JP05542678B2 US8449175C1 US8827549C1 | Isothermal Titration Microcalorimeter apparatus and method of use | MicroCal ITC Range |
| CN102232184B
EP2352993B1 (CH+LI, GB, FR, DE602009044685.1) JP5476394B2 US9103782B2 US9404876B2 US10036715B2 US10254239B2 EP3144666B1 (CH+LI, GB, FR, DE602009059932.1) US20200025698A1 EP3647776A1 | Automatic Isothermal Titration Microcalorimeter Apparatus and method of Use | MicroCal ITC Range |
MicroCal DSC
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US8635045B2
CN103221808B EP2646811A1 IN336472 JP5925798B2 | Method for Automatic Peak Finding in Calorimetric Data | MicroCal DSC Range |
OMNISEC
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US9759644B2
US10551291B2 | Balanced Capillary Bridge Viscometer | OMNISEC |
| US9612183B2
EP2619543B1 (GB, FR, DE602011011174.4) JP05916734B2 CN103168223B IN341558 | Modular Capillary Bridge Viscometer | OMNISEC |
Floor standing XRF
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US8210000B2
JP5554163B2 CN101941789B EP2270410B1 (GB, FR, NL, DE602009003389.1) | Bead furnace | Zetium
Axios FAST Epsilon5 |
| US6823043B2 | Determination of material parameters
| Zetium*
Axios FAST* 2830 ZT (wafer analyser)* Epsilon5* SEMYOS* |
| US7949092B2
| Device and method for performing X-ray analysis
| Zetium*
Axios FAST* 2830 ZT (wafer analyser)* Epsilon5* SEMYOS |
| US6574305B2
| Device and method for the inspection of the condition of a sample | Zetium*
Axios FAST* 2830 ZT (wafer analyser)* Epsilon5* SEMYOS* |
| JP4111336B2 | Device for testing the sample with X-ray
| Epsilon5
|
| US7042978B2 | Examination of material samples | Zetium*
Axios FAST* Epsilon5 SEMYOS* |
| JP5782451B2
EP2510397B1 (GB, FR, NL, DE602010021859.7) | Method for manufacturing a multilayer structure with a lateral pattern for application in the xuv wavelength range, and bf and Imag structures manufactured according to this method | Zetium*
Axios FAST 2830 ZT (wafer analyser)* Epsilon5* SEMYOS* |
| US9658352B2
CN104833557B JP656263B2 JP6804594B2 | Method of making a standard | Zetium
Axios FAST |
| EP2787342B1 (GB, FR, NL, DE602013028642.6)
JP6360151B2 | Preparation of sample-pellets by pressing | Zetium
Axios FAST |
| US10107551B2
EP2966039B1 (GB, FR, NL, DE602014024004.2) JP6559486B2 CN105258987B | Preparation of samples for XRF using flux and platinum crucible | Zetium
Axios FAST |
| US9784699B2
JP6861469B2 CN105937890B EP3064931B1 (GB, FR, NL, CH, DE) | Quantitative X-ray Analysis - Matrix thickness correction | Zetium*
Axios FAST |
| US9739730B2
JP6706932B2 CN105938113B EP3064933B1 (GB, FR, NL, CH, DE) | Quantitative X-ray Analysis - Multi optical path instrument | Zetium*
Axios FAST |
| US9851313B2
JP6762734B2 CN105938112B EP3064932B1 (GB, FR, NL, CH+LI, DE602016024126.9) | Quantitative X-ray Analysis - Ratio correction | Zetium*
Axios FAST |
| JP3936912B2 | Sample container with floating cover for x-ray analysis of liquids | Zetium
Axios FAST 2830 ZT (wafer analyser) Epsilon5 SEMYOS |
| US9239305B2 | Sample holder | Zetium*
Axios FAST* Epsilon5 |
| US7978820B2
| X-ray diffraction and fluorescence | Zetium
Axios FAST* 2830 ZT (wafer analyser)* Epsilon5* SEMYOS* |
| US7720192B2
JP5574575B2 CN101311708B | X-ray fluorescence apparatus | Zetium*
Axios FAST* 2830 ZT (wafer analyser)* Epsilon5* SEMYOS* |
| US7194067B2
| X-ray optical system | Zetium
Axios FAST* 2830 ZT (wafer analyser)* Epsilon5* SEMYOS* |
| US8223923B2
JP5266310B2 CN101720491B EP1983547B1 (GB, FR, NL, DE602008000361D1) | X-ray source with metal wire cathode | Zetium
Axios FAST 2830 ZT (wafer analyser) Epsilon5 SEMYOS |
| US9911569B2
JP2016131150A CN105810541B EP3043371B2 (GB, FR, NL, DE602015012421.9) | X-ray Tube Anode Arrangement
| Zetium
Axios FAST 2830 ZT (wafer analyser) Epsilon5 SEMYOS |
| US10281414B2
EP3330701B1 (CH+LI, GB, FR, NL, DE602017006751.2) EP3480587A1 US10393683B2 JP6767961B2 CN108132267A | Conical collimator for X-ray measurements | Zetium* |
| *· Optional / not standard in product | ||
Benchtops XRF
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US8210000B2
JP5554163B2 CN101941789B EP2270410B1 (GB, FR, NL, DE602009003389.1) | Bead furnace | Epsilon 1 range
Epsilon 3X spectrometers Epsilon 4 Air Quality edition |
| US6823043B2 | Determination of material parameters
| Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US7949092B2
| Device and method for performing X-ray analysis
| Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US6574305B2
| Device and method for the inspection of the condition of a sample | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US7042978B2 | Examination of material samples | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US9658352B2
CN104833557B JP6562635B2 JP6804594B2 | Method of making a standard | Epsilon 1 range
Epsilon 3X spectrometers Epsilon 4 Air Quality edition |
| EP2787342B1 (GB, FR, NL, DE602013028642.6)
JP6360151B2 | Preparation of sample-pellets by pressing | Epsilon 1 range
Epsilon 3X spectrometers Epsilon 4 Air Quality edition |
| US10107551B2
JP6559486B2 CN105258987B EP2966039B1 (GB, FR, NL, DE602014024004.2) | Preparation of samples for XRF using flux and platinum crucible | Epsilon 1 range
Epsilon 3X spectrometers Epsilon 4 Air Quality edition |
| US9784699B2
JP6861469B2 CN105937890B EP3064931B1 (GB, FR, NL, CH, DE) | Quantitative X-ray Analysis - Matrix thickness correction | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US9739730B2
JP6706932B2 CN105938113B EP3064933B1 (GB, FR, NL, CH, DE602016056347.9) | Quantitative X-ray Analysis - Multi optical path instrument | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US9851313B2
JP6762734B2 CN105938112B EP3064932B1 (GB, FR, NL, CH+LI, DE602016024126.9) | Quantitative X-ray Analysis - Ratio correction | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| JP3936912B2 | Sample container with floating cover for x-ray analysis of liquids | Epsilon 1 range
Epsilon 3X spectrometers Epsilon 4 Air Quality edition |
| US9239305B2 | Sample holder | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US9547094B2
CN104849295B EP2908127B1 (CH+LI, GB, FR, NL, DE602014011398.2) JP6526983B2 | X-ray analysis apparatus
| Epsilon 1 range
Epsilon 3X spectrometers Epsilon 4 Air Quality edition |
| US7978820B2
| X-ray diffraction and fluorescence | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US7194067B2
| X-ray optical system | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US8223923B2
JP5266310B2 CN101720491B EP1983547B1 (GB, FR, NL, DE602008000361D1) | X-ray source with metal wire cathode | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US9911569B2
JP2016131150A CN105810541B EP3043371B2 (GB, FR, NL, DE602015012421.9) | X-ray Tube Anode Arrangement
| Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| * Optional / not standard in product | ||
Floor standing XRD
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US6815684B2
| Analytical X-ray apparatus provided with a solid state position sensitive X-ray detector | Empyrean
X'Pert³ Powder X'Pert³ MRD (XL) CubiX³ range |
| US6823043B2 | Determination of material parameters
| Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US6574305B2
| Device and method for the inspection of the condition of a sample | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US9506880B2
CN104251870B EP2818851A1 JP6403452B2 | Diffraction imaging | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US7116754B2 | Diffractometer | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US8488740B2
JP6009156B2 CN102565108B EP2455747B1 (GB, FR, NL, DE602011022779.3) | Diffractometer
| Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US7858945B2
JP5254066B2 CN101521246B EP2088451B1 (GB, FR, NL, DE602008041760.3) | Imaging Detector | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| EP2088625B1 (GB, FR, NL, CH + LI, DE602009040563.2) | Imaging detector | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US9110003B2
CN103383363B EP2634566B1 (GB, FR, NL, DE602012058202.2) JP6198406B2 | Microdiffraction
| Empyrean
X'Pert³ Powder X'Pert³ MRD (XL) CubiX³ range |
| US6704390B2
| X-ray analysis apparatus provided with a multilayer mirror and an exit collimator | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US9640292B2
CN104777179B EP2896960B1 (GB, FR, NL, DE602014012155.1) JP6564683B2 | X-ray apparatus
| Empyrean
X'Pert³ Powder CubiX³ range |
| US7756248B2
JP5145263B2 CN101545873B EP2090883B1 (GB, FR, NL, DE602008002143D1) | X-ray detection in packaging
| Empyrean
X'Pert³ Powder X'Pert³ MRD (XL) |
| US8477904B2
JP5752434B2 CN102253065B EP2365319B1 (GB, FR, NL, DE602011055847.1) | X-ray diffraction and computed tomography | Empyrean
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US7542547B2
JP5280057B2 CN101256160B EP1947448B1 (CH+LI, GB, FR, NL, DE602007031351.1) | X-ray diffraction equipment for X-ray scattering
| X'Pert³ Powder*
X'Pert³ MRD (XL)* |
| EP1287342B1 (GB, FR, DE60147121.0) | X-ray diffractometer | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US7477724B2
EP1703276B1 (GB, FR, NL, DE602005033962.0) | X-ray instrument | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range |
| US7194067B2
| X-ray optical system | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US8437451B2
JP5999901B2 CN102610290B EP2477191B1 (CH+LI, GB, FR, NL, DE602011035906.1) | X-ray shutter arrangement | Empyrean
X'Pert³ Powder X'Pert³ MRD (XL) CubiX³ range |
| US9911569B2
JP2016131150A CN105810541B EP3043371B1 (GB, FR, NL, DE602015012421.9) | X-ray Tube Anode Arrangement
| Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| EP3553508A2
US20190317030A1 JP2019184609A CN110389142A | X-ray analysis apparatus and method | Empyrean* |
| US10359376B2
EP3273229A1 JP6701133B2 CN107643308A | Sample holder for X-ray analysis | Empyrean* |
| * Optional / not standard in product | ||
QualitySpec 7000
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US8164747B2
CA2667650C EP2092296B1 (CH+LI, NL, SE, DK, DE602007045593.6) | Apparatus, system and method for optical spectroscopic measurements | QualitySpec 7000 |
TerraSpec Halo
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US9207118B2 | Apparatus, system and method for scanning monochromator and diode array spectrometer instrumentation | TerraSpec Halo |
QualitySpec Trek
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US9207118B2 | Apparatus, system and method for scanning monochromator and diode array spectrometer instrumentation | QualitySpec Trek |
Benchtops XRD
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US6815684B2
| Analytical X-ray apparatus provided with a solid state position sensitive X-ray detector | Aeris*
|
| US6823043B2 | Determination of material parameters
| Aeris*
|
| US9506880B2
CN104251870B EP2818851A1 JP6403452B2 | Diffraction imaging | Aeris*
|
| US7116754B2 | Diffractometer | Aeris*
|
| US8488740B2
JP6009156B2 CN102565108B EP2455747B1 (GB, FR, NL, DE602011022779.3) | Diffractometer | Aeris* |
| US7858945B2
JP5254066B2 CN101521246B EP2088451B1 (GB, FR, NL, DE602008041760.3) | Imaging Detector | Aeris* |
| EP2088625B1 (CH+LI, GB, FR, NL, DE602009040563.2) | Imaging detector | Aeris*
|
| US6704390B2
| X-ray analysis apparatus provided with a multilayer mirror and an exit collimator | Aeris* |
| US9640292B2
JP6564572B2 CN104777179B EP2896960B1 (GB, FR, NL, DE602014012155.1) | X-ray apparatus | Aeris |
| US8477904B2
JP5752434B2 CN102253065B EP2365319B1 (GB, FR, NL, DE602011055847.1) | X-ray diffraction and computed tomography | Aeris*
|
| US7542547B2
JP5280057B2 CN101256160B EP1947448B1 (CH+LI, GB, FR, NL, DE602007031351.1) | X-ray diffraction equipment for X-ray scattering
| Aeris*
|
| EP1287342B1 (GB, FR, DE60147121.0) | X-ray diffractometer | Aeris*
|
| US7477724B2
EP1703276B1 (GB, FR, NL, DE602005033962.0) | X-ray instrument | Aeris*
|
| US7194067B2
| X-ray optical system | Aeris*
|
| US8437451B2
JP5999901B2 CN102610290B EP2477191B1 (CH+LI, GB, FR, NL, DE602011035906.1) | X-ray shutter arrangement | Aeris
|
| US9911569B2
JP2016131150A CN105810541B EP3043371B1 (GB, FR, NL, DE602015012421.9) | X-ray Tube Anode Arrangement
| Aeris*
|
* Optional / not standard in product | ||
