X-ray fluorescence spectroscopy & XRF applications
X-ray fluorescence is an analytical technique that can be used to determine the chemical composition of a wide variety of sample types including solids, liquids, slurries and loose powders. XRF is also used to determine the thickness and composition of layers and coatings. It can analyze elements from beryllium (Be) to uranium (U) in concentration ranges from 100 wt% to sub-ppm levels.
XRF is an atomic emission method, similar in this respect to optical emission spectroscopy (OES), ICP and neutron activation analysis (gamma spectroscopy). Such methods measure the wavelength and intensity of ‘light’ (X-rays in this case) emitted by energized atoms in the sample. In XRF, irradiation by a primary X-ray beam from an X-ray tube causes emission of fluorescent X-rays with discrete energies characteristic of the elements present in the sample.
XRF is a versatile analytical technique that finds application across an extensive spectrum of industries and scientific fields. Its adaptability and precision have made it an indispensable tool for understanding and manipulating the elemental composition of materials. From aiding in material identification and quality control i industries to preserving cultural heritage and advancing scientific research, XRF continues to play a pivotal role in enhancing our understanding of the elemental world.
XRF is widely used in quality and process control. Users can quickly get accurate and precise results with limited effort on sample preparation, and it can be readily automated for use in high-throughput industrial environment, such as: XRF's precision and non-destructive nature make it an invaluable tool for quality control in various manufacturing sectors, such as:
XRF plays a pivotal role in materials research and development:
In the pharmaceutical and medical fields, XRF also has diverse applications:
XRF analysis is a robust technique, combining high precision and accuracy with straightforward, fast sample preparation. It can be readily automated for use in high-throughput industrial environments, plus XRF provides both qualitative and quantitative information on a sample.
The technology used for the separation (dispersion), identification and intensity measurement of a sample’s X-ray fluorescence spectrum gives rise to two main types of spectrometer: wavelength dispersive (WDXRF) and energy dispersive (EDXRF) systems.
We offer a wide range of X-ray Fluorescence solutions and XRF analyzers for the analysis of elemental composition of a wide range of materials and applications, and comprising both Wavelength and energy-dispersive solutions. For more information on XRF analyzer prices, read our how much does an XRF analyzer cost page. Or discover our solution portfolio in the table below.
Our range of XRF software packages can support you to extract the maximum value from your XRF instrumentation. Our commitment to excellence means that our software is continuously evolving. We invest in research and development to stay at the forefront of XRF analysis technology to ensure that you have access to the latest advancements and features.
![]() ZetiumSmart Zetium for reliable results and robust operation |
![]() Epsilon rangeFast and accurate at- and on-line elemental analysis |
![]() Axios FASTXRF of choice for highest throughput or shortest measurement time |
![]() 2830 ZTAdvanced semiconductor thin film metrology solution |
|
---|---|---|---|---|
Measurement type | ||||
Thin film metrology | ||||
Elemental analysis | ||||
Contaminant detection and analysis | ||||
Elemental quantification | ||||
Chemical identification | ||||
Technology | ||||
Wavelength Dispersive X-ray Fluorescence (WDXRF) | ||||
Energy Dispersive X-ray Fluorescence (EDXRF) | ||||
Elemental range | Be-Am | F-Am | B-Am | B-Am |
LLD | 0.1 ppm - 100% | 1 ppm - 100% | 0.1 ppm - 100% | 0.1 ppm - 100% |
Resolution (Mn-Ka) | 35eV | 145eV | 35eV | 35eV |
Sample throughput | Up to - 240per 8h day | Up to - 160per 8h day | Up to - 480per 8h day | up to 25 wafers per hour |