Process control and quality control in the metal industry - whether it concerns primary metals or special products - are driven by rapid and accurate chemical analysis, by structural characterization of metals and alloys as well as particle size and particle size distribution, particle shape, surface area, and density.

This requires robust and reliable technology. We provide solutions that can satisfy these demands, streamline production and save time for high throughput environments such as iron and steel, aluminium, copper and titanium industries. 

Malvern Panalytical’s instrumentation makes it easy to test in both wet and dry environment during research and development and for quality control during manufacture to:

  • Improve final product performance
  • Optimize production processes 
  • Understand the mechanical properties of the metals

Mastersizer range

Mastersizer range

World's most popular particle size analyzers

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Measurement Particle size
Particle size range 0.01µm - 3500µm
Technology Light Scattering, Laser Diffraction
Dispersion type Wet, Dry, Wet and Dry

Morphologi range

Morphologi range

Automated imaging for advanced particle characterization

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Measurement Particle shape, Particle size
Particle size range 0.5µm - 1300µm
Technology Image analysis
Dispersion type Wet, Dry

Empyrean

Empyrean

The intelligent diffractometer

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Measurement Crystal structure determination, Phase identification, Phase quantification, Contaminant detection and analysis, Residual stress, Epitaxy analysis, Interface roughness, Texture analysis, 3D structure / imaging, Reciprocal space analysis
Goniometer configuration Vertical goniometer, Θ-Θ
Particle size range 1 - 100 nm
Technology X-ray Diffraction (XRD)

Aeris Metals edition

Aeris Metals edition

Optimize the steel making process

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Measurement Crystal structure determination, Phase identification, Phase quantification
X-ray tube anode material Co / Cu (option)
Detector PIXcel1D
Technology X-ray Diffraction (XRD)

The Metals edition of Zetium

The Metals edition of Zetium

The new element in metals

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Measurement Thin film metrology, Elemental analysis, Contaminant detection and analysis, Elemental quantification
Sample throughput 160per 8h day - 240per 8h day
Power 2,4-4 kW
Technology X-ray Fluorescence (XRF), Wavelength Dispersive X-ray Fluorescence (WDXRF), Energy Dispersive X-ray Fluorescence (EDXRF)

Axios FAST

Axios FAST

High sample throughput

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Measurement Thin film metrology, Elemental analysis, Elemental quantification
Elemental range Be-U
Resolution (Mn-Ka) 35eV
LLD 0.1 ppm - 100%
Sample throughput Up to - 480per 8h day
Technology X-ray Fluorescence (XRF), Wavelength Dispersive X-ray Fluorescence (WDXRF)

Mastersizer range

Mastersizer range

World's most popular particle size analyzers

Morphologi range

Morphologi range

Automated imaging for advanced particle characterization

Empyrean

Empyrean

The intelligent diffractometer

Aeris Metals edition

Aeris Metals edition

Optimize the steel making process

The Metals edition of Zetium

The Metals edition of Zetium

The new element in metals

Axios FAST

Axios FAST

High sample throughput

More details More details More details More details More details More details
Measurement Particle size Particle shape, Particle size Crystal structure determination, Phase identification, Phase quantification, Contaminant detection and analysis, Residual stress, Epitaxy analysis, Interface roughness, Texture analysis, 3D structure / imaging, Reciprocal space analysis Crystal structure determination, Phase identification, Phase quantification Thin film metrology, Elemental analysis, Contaminant detection and analysis, Elemental quantification Thin film metrology, Elemental analysis, Elemental quantification
Particle size range 0.01µm - 3500µm 0.5µm - 1300µm 1 - 100 nm      
Goniometer configuration     Vertical goniometer, Θ-Θ      
X-ray tube anode material       Co / Cu (option)    
Detector       PIXcel1D    
Sample throughput         160per 8h day - 240per 8h day Up to - 480per 8h day
Power         2,4-4 kW  
Elemental range           Be-U
Resolution (Mn-Ka)           35eV
LLD           0.1 ppm - 100%
Technology Light Scattering, Laser Diffraction Image analysis X-ray Diffraction (XRD) X-ray Diffraction (XRD) X-ray Fluorescence (XRF), Wavelength Dispersive X-ray Fluorescence (WDXRF), Energy Dispersive X-ray Fluorescence (EDXRF) X-ray Fluorescence (XRF), Wavelength Dispersive X-ray Fluorescence (WDXRF)
Dispersion type Wet, Dry, Wet and Dry Wet, Dry        

Mastersizer range

Morphologi range

Empyrean range

Aeris Metals edition

The Metals edition of Zetium

Axios FAST

Mastersizer range Morphologi range Empyrean range Aeris Metals edition The Metals edition of Zetium Axios FAST

World's most popular particle size analyzers

Automated imaging for advanced particle characterization

Multipurpose X-ray diffractometers for your analytical needs

Optimize the steel making process

The new element in metals

High sample throughput

More details More details More details More details More details More details
Technology
Laser Diffraction
Image analysis
X-ray Diffraction (XRD)
X-ray Fluorescence (XRF)
Wavelength Dispersive X-ray Fluorescence (WDXRF)
Energy Dispersive X-ray Fluorescence (EDXRF)