The future is compact

Prepare to be surprised by our highly accurate, fast XRD system: Aeris. Precise results can be ready in less than five minutes. Such rapid acquisition of high-quality data has only been previously achieved by large, floorstanding xrd systems. The compact Aeris is small, powerful, and the first of its kind. 

Take the one-step sample loading in combination with its controlled user access and the option to design data collection programs offline, the result is a practical and versatile system for all users, from beginners to experts.   

No matter where your application falls on the spectrum between versatility and specialization, Aeris can support you.  

Om_logo.png   Works with OmniTrust: Malvern Panalytical's compliance solution for the regulated environment

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Features and benefits


As a modern, multi-purpose* diffractometer, Aeris’ modular design makes optional upgrades and additions a breeze – and guaranteed product availability means peace of mind for the future. 

*Non-ambient, reflection, transmission, grazing incidence, 2D diffraction.


Plug-and-play simplicity

With Aeris, not every user needs XRD expertise. Its intuitive interface, pre-loaded measurement programs, and easy sample placement make reproducible great results accessible to all.

Plug-and-play simplicity

Easy, reproducible sample loading

Aeris’ precision-built sample holders and external loading system make it easy for all users to load samples correctly every time – for every sample type, from powders to solids. 

Easy, reproducible sample loading

Compatibility with regulated environments

With controlled user access and compliance software, Aeris is ready for all regulated workflows (according to 21 CFR Part 11 regulation). Multiple users are easily managed.

Compatibility with regulated environments

Fast and accurate

With its classic goniometer and onboard computer, Aeris’ high-performance components and precision sample stages deliver accurate results in as few as five minutes. 

Fast and accurate

The future is compact


Great value to purchase, fast and easy to use, fantastic data; it's a winner!

Damian G. Research


Sample Handling
Sample Loading External sample loading
Sample holders Variety of full-sized sample holders capable meeting all requirements
Sample changing 6-position full-sized sample changer
Automation Compatible with automation integration
X-ray Generation
Wavelengths Cu or Co
Tube setting From 300 W to 600 W options in 30 kV or 40 kV setting
Tube housing Patented design with Corrosion-resistant incident smart beam path technology (CRISP)*.
*CRISP technology prevents corrosion in the incident beam path caused by X-ray induced ionized air. Patent no. US 8437451 B2.
Configuration Vertical goniometer, coupled and decoupled θ-θ, samples always horizontal
Geometry Bragg-Brentano, Transmission, Grazing Incidence
Radius 145 mm
Maximum 2θ range -4° < 2θ ≤ 142° (with scanning detector and full active length)
Angle positioning Direct optical position sensing (DOPS3) with lifetime positioning accuracy
Scan Speed Max 2.17°/s
Achievable resolution < 0.04° 2θ on LaB6 (with 0.01 rad Soller slits)
2θ linearity < 0.04° 2θ
Smallest addressable increment 0.001 degree
Spinning Choice of spinner stages
Non-Ambient Heating stage option (BTS-500, BTS-150)
Exchange of stages Alignment-free PreFIX exchange of stages
Special stages On request (manual, MPSS, In-Situ)
Detector Choose between the PIXcel1D, PIXcel3D and 1Der detectors
Dimensions (H x W x D) 690 mm x 770 mm x 786 mm/ 27-inch x 30 inch x 31 inch
Dust protection Closed system with external sample loading
External cooling water supply Not needed
Compressed air supply Not needed
Power supply 100 – 240 V, single phase
Computer Internal instrument PC
Operation Intuitive user interface with 10.4” touch screen
Interfaces LAN, USB, HDMI

Software solutions

Aeris instruments and measurements are run by its onboard data collection software with preloaded measurement programs. Users can also write their own programs. 

For phase quantification, amorphous content and more, the onboard RoboRiet software can perform automated analysis providing immediate on-screen viewing and transfer to results databases. 

Measurement and analysis can also be automated via X’Pert Industry. Industry offers a unique scripting facility to customize data collection and calibration-line based quantification methods for any process control application. Result reporting is fully configurable also for LIMS systems. 

Alternatively, you can perform your own in-depth analyses using our software packages, HighScore Plus or Stress Plus

For regulatory compliance and data integrity, Omnitrust covers your user management and data audit requirements in a regulated environment.


A special ‘execution-only’ implementation of the Rietveld method and profile fits for XRD phase quantification, amorphous quantification and more. 



Software for routine X-ray diffraction analysis in an industrial environment, ranging from non-regulated to fully regulated, and from manually controlled to completely automated systems.


HighScore Plus

After identification of all phases present in your sample, this all-in-one software suite continues to support your analysis from quantification with or without the Rietveld method to profile fitting and pattern treatment.

HighScore Plus

Stress Plus

Stress Plus software is dedicated to the X-ray diffraction (XRD) analysis of residual stress in polycrystalline coatings. The software performs sin²ψ residual stress analysis using both single-directional and multi-directional techniques. 

Stress Plus

Expertise editions

Aeris makes it easy to characterise and analyze any sample across both research and industrial environments. But sometimes, your application needs a specialist solution – or you need your alternative to a benchtop xrd system to be calibrated and ready for action.

To meet this need, industry-specific, tailored editions of Aeris are also available out-of-the-box. These specialized industry versions come with customizable expertise packages, pre-calibrated for your specific analytical methods or sample material. Your Aeris will be prepared for automated measurement and analysis using the built-in Roboriet software. Ready when you are! 

Find your edition below:

Aeris Research edition

Provides versatile and accurate material analyses solutions for all your needs.
Aeris Research edition

Aeris Cement edition

Directly probes the mineralogical composition of cement and its intermediates.
Aeris Cement edition

Aeris Minerals edition

Makes the versatile analysis of ores accessible for everyone in the mining industry.
Aeris Minerals edition

Aeris Metals edition

For rapid and reliable analysis of sinter, direct reduced iron and retained austenite.
Aeris Metals edition



Solutions to maximize the return on your investment

To assure that your instrument remains in top condition and performs on the highest level, Malvern Panalytical offers a wide range of services. Our expertise and support services assure an optimal functioning of your instrument.


Service for a lifetime

  • Phone and remote support
  • Preventive maintenance and checkups
  • Flexible Customer Care Agreements
  • Performance certificates
  • Hardware and software upgrades
  • Local and global support


Adding value to your processes 

  • Sample preparation development/optimization
  • Analytical methodologies 
  • Turnkey solutions for XRD 
  • Operations via IQ/OQ/PQ, quality assurance (GLP, ISO17025) or round robins/inter laboratory studies
  • Consultancy services

Training and education

  • Training on-site or at our competence centers
  • Broad range of basic and advanced courses on products, applications and software

The instrument is desktop, easy to use, analyzes the samples very quickly and is economic.

Sacari Sacari Elisban Juani — Universidad Nacional Jorge Basadre Grohmann
A small footprint with a BIG impact.

A small footprint with a BIG impact.

Fast high quality XRD, tailored for your requirements. Ready for automation and integration. The modern compact.

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