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X-ray diffractometers

Compact & floorstanding XRD solutions

X-ray diffractometers are designed for obtaining the ultimate quality diffraction data, combined with ease of use and flexibility to quickly switch to different applications.

Malvern Panalytical's X-ray diffraction (XRD) solutions are used in many environments, from universities and research institutes to industrial process control labs. Whatever your need, we offer the right diffractometer, backed up by our worldwide sales and service organization. For our x-ray diffractometer prices, please contact sales. 

Our multipurpose diffractometers, Aeris, Empyrean and X’Pert3 MRD (XL), are all equipped with PreFIX (pre-aligned, fast interchangeable X-ray) modules, making a change in the optical path effortless for the user. For this reason, we offer the most applications on a single diffractometer platform. 

Our range of crystal orientation solutions are designed with ingot, wafer and crystal applications in mind. Crystal orientation is made simple in a range of environments with our instruments - from on-line analysis to desktop research, we have you covered.  

Aeris

Prepare to be surprised by our highly accurate, fast XRD system. Precise results can be ready in less than five minutes.

Aeris

Empyrean range

Our newly designed MultiCore Optics enable the largest variety of measurements without any manual intervention.

Empyrean range

X'Pert³

The long and successful history of our Materials Research Diffractometers continues with a new generation of X'Pert³.

X'Pert³

Crystal orientation range

Our Crystal Orientation solutions are designed with boule, ingot, puck and wafer applications in mind.

Crystal orientation range
Aeris

Aeris

Compact X-ray diffractometer

Empyrean range

Empyrean range

Multipurpose X-ray diffractometer

X'Pert³

X'Pert³

Thin Film Analysis XRD Systems

Crystal orientation range

Crystal orientation range

Fast and accurate orientation of wafers and ingots

Technology
X-ray Diffraction (XRD)
Measurement type
Particle shape
Particle size
Crystal structure determination
Phase identification
Phase quantification
Contaminant detection and analysis
Epitaxy analysis
Interface roughness
3D structure / imaging
Thin film metrology
Residual stress
Crystal orientation
Cleanroom ISO 4
SECS/GEM