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X-ray diffractometers

Compact & floorstanding XRD solutions

X-ray diffractometers

X-ray diffractometers are designed for obtaining the ultimate quality diffraction data, combined with ease of use and flexibility to quickly switch to different applications.

XRD solutions

Malvern Panalytical's X-ray diffraction (XRD) solutions are used in many environments, from universities and research institutes to industrial process control labs. Whatever your need, we offer the right diffractometer, backed up by our worldwide sales and service organization. For our x-ray diffractometer prices, please contact sales. 

Our multipurpose diffractometers, Aeris, Empyrean and X’Pert3 MRD (XL), are all equipped with PreFIX (pre-aligned, fast interchangeable X-ray) modules, making a change in the optical path effortless for the user. For this reason, we offer the most applications on a single diffractometer platform. 

Aeris

Prepare to be surprised by our highly accurate, fast XRD system. Precise results can be ready in less than five minutes.
Aeris

Empyrean range

Our newly designed MultiCore Optics enable the largest variety of measurements without any manual intervention.
Empyrean range

X'Pert³

The long and successful history of our Materials Research Diffractometers continues with a new generation of X'Pert³.
X'Pert³

Crystal orientation solutions

Crystal orientation range

Crystal orientation range

Our Crystal Orientation solutions are designed with boule, ingot, puck and wafer applications in mind.

Our range of crystal orientation solutions are designed with ingot, wafer and crystal applications in mind. 

Crystal orientation is made simple in a range of environments with our instruments - from on-line analysis to desktop research, we have you covered.  

How our products compare

  • Aeris

    Compact benchtop X-ray diffractometers

    Aeris

    Technology

    • X-ray Diffraction (XRD)

    Measurement type

    • Particle shape
    • Particle size
    • Crystal structure determination
    • Phase identification
    • Phase quantification
    • Contaminant detection and analysis
    • Epitaxy analysis
    • Interface roughness
    • 3D structure / imaging
    • Thin film metrology
    • Residual stress
    • Crystal orientation
    • Cleanroom ISO 4
    • SECS/GEM
  • Empyrean range

    Multipurpose X-ray diffractometers

    Empyrean range

    Technology

    • X-ray Diffraction (XRD)

    Measurement type

    • Particle shape
    • Particle size
    • Crystal structure determination
    • Phase identification
    • Phase quantification
    • Contaminant detection and analysis
    • Epitaxy analysis
    • Interface roughness
    • 3D structure / imaging
    • Thin film metrology
    • Residual stress
    • Crystal orientation
    • Cleanroom ISO 4
    • SECS/GEM
  • X'Pert³

    Versatile research and development XRD system

    X'Pert³

    Technology

    • X-ray Diffraction (XRD)

    Measurement type

    • Particle shape
    • Particle size
    • Crystal structure determination
    • Phase identification
    • Phase quantification
    • Contaminant detection and analysis
    • Epitaxy analysis
    • Interface roughness
    • 3D structure / imaging
    • Thin film metrology
    • Residual stress
    • Crystal orientation
    • Cleanroom ISO 4
    • SECS/GEM
  • Crystal orientation range

    Fast, accurate crystal orientation

    Crystal orientation range

    Technology

    • X-ray Diffraction (XRD)

    Measurement type

    • Particle shape
    • Particle size
    • Crystal structure determination
    • Phase identification
    • Phase quantification
    • Contaminant detection and analysis
    • Epitaxy analysis
    • Interface roughness
    • 3D structure / imaging
    • Thin film metrology
    • Residual stress
    • Crystal orientation
    • Cleanroom ISO 4
    • SECS/GEM