Measuring particle size, particle shape and zeta potential is important in the electronics industry especially during the manufacture of raw materials for integrated circuits used in most electronic equipment such as computers, mobile phones and digital appliances. The presence of a single oversize particle can cause damage to a wafer or a failure in an LCD.

Throughout research and design and in the manufacture and quality control of electronic components Malvern Panalytical’s easy-to-use instrumentation, combined with its industry and applications knowledge, can help you characterize materials including:

  • CMP slurries used in polishing silicon and other wafers for photovoltaic cells production
  • Solder particles and screen print inks used in printed circuit boards
  • Silver, conductive carbon and pastes used for PCBs and a variety of displays (EL, LCD, LED)
  • Nanoparticles used for dye materials in colored liquid crystal display devices.

Mastersizer range

Zetasizer range

Morphologi range

Epsilon 1 for Small Spot Analysis

Epsilon 4

Mastersizer range

World's most popular particle size analyzers

Zetasizer range

The world’s most widely-used systems for nanoparticle, colloid and protein size and charge measurements

Morphologi range

Automated imaging for advanced particle characterization

Epsilon 1 for Small Spot Analysis

Focus on the details to capture the bigger picture

Epsilon 4

Fast and accurate at-line elemental analysis

More details More details More details More details More details
Measurement type Particle size Molecular size, Particle size, Molecular weight, Zeta potential Particle shape, Particle size Contaminant detection and analysis, Elemental analysis, Elemental quantification Elemental analysis, Elemental quantification, Contaminant detection and analysis, Thin film metrology
Particle size range 0.01µm - 3500µm 0.3nm - 10µm 0.5µm - 1300µm
Temperature range 0°C - 120°C
Elemental range Na-Am C-Am
Sample throughput 40per 8h day - 80per 8h day Up to - 160per 8h day
Resolution (Mn-Ka) 145eV 135eV
Technology Laser Diffraction, Light Scattering Dynamic Light Scattering, Static Light Scattering, Electrophoretic Light Scattering, Light Scattering Image analysis X-ray Fluorescence (XRF) Energy Dispersive X-ray Fluorescence (EDXRF)
LLD 1 ppm - 100% 1 ppm - 100%
Dispersion type Dry, Wet, Wet and Dry Wet Wet, Dry
Sample cell type Cuvette