Profiling pollution sources with X-ray fluorescence
X-ray fluorescence (XRF) is a non-destructive technology used for elemental analysis on the aerosols collected at air filters. The main advantage of XRF is that filters can be directly loaded in the spectrometer without any dissolution of the filter material. After analysis, the sample can still be analyzed further with other air quality analysis techniques.
The air-quality edition of our Epsilon 4 can analyze elemental concentration according to the requirements of the internationally accepted test method, EPA IO-3.3. Alongside this highly accurate particulate matter analysis, the spectrometer can also handle air filters from 25 mm to 52 mm.
The Epsilon 4 can be equipped with EPA IO-3.3-compliant factory calibration, enabling accurate analysis from the day of installation. If the 10-position carousel is not sufficient, Malvern Panalytical offers a 60-position sample changer to enable 24-hour operation without operator interference.