Understanding the basic principles of any analytical technique is vital in providing the fundamental building blocks on which to expand one’s knowledge. Within particle size analysis one short document has proven very popular over the years - “The Basic Principles of Particle Size Analysis". This has been Malvern Instruments' most popular document in both digital and paper formats. It was first written in 1993 (based on an earlier conference submission) and has been revised on a couple of occasions.

This webinar will be based on that Basics document and will be presented by the author of that document – Dr Alan Rawle. In line with that document the webinar will introduce you to the basics of particle sizing including:
• Terminology
• International standards
• Math – what the important numbers on the analysis report mean
• Outline of the main techniques (sieves, sedimentation, electrical sensing zone)
• Other techniques (SAXS, NTA, RMM)
• Overview of light scattering techniques - in particular, Dynamic light scattering (DLS) and Laser diffraction