Dynamic Light Scattering (DLS) is a mature and proven technology for nanomaterial characterization. Nanoparticle Tracking Analysis (NTA) is a more recent addition to the spectrum of particle characterization techniques and has many similarities to DLS, leading to some confusion as to their relative capabilities. The broad range of measurement capabilities for each technique is complementary in nature, providing a wealth of valuable information. The differences between the two techniques allow the data from one technology to validate and support the other.
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