Practical small spot mapping. Analysis of a ceramic inclusion using SumXcore technology

Ideal for detailed characterization of materials in research and process control

X-ray fluorescence analysis is a nondestructive, straightforward and fast approach to carry out quality control checks on ceramics. However, the size of ceramic inclusions typically requires analysis of a much smaller spot size compared to traditional bulk XRF techniques. This study illustrates the capability of Zetium to perform small spot analysis and elemental distribution mapping of an inclusion in a ceramic.

Ceramics comprise a wide range of materials and are used in a wide range of applications. These include high-performance industrial tools (such as ball bearings and cutting tools), structural products (such as bricks, tiles, roof tiles) and household items (such as art decors and sanitary ware). Quality control of ceramics has become an important challenge to manufacturers. A slight sample contamination or impurity can heavily influence the chemical and physical properties of the ceramic and can potentially have harmful effects on the user. This can lead to rejects during the production process, which results in a revenue loss for the manufacturer. 


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