Using all currently accepted analytical models

Quantify delivers complete, automated quantitative calibration-line based XRD phase analysis including measurement, data extraction and correction routines. Using all currently accepted analytical models, Quantify incorporates as many as ten calibration models and a wealth of intensity correction methods. 

Capable of working independently or with other software like Data Collector, Quantify accepts peak-intensity measurements and integrated-area measurements. It saves scans in Malvern Panalytical's open XRDML data format, and stores quantitative results in a Microsoft Access database. Measurement and analysis are independent of each other, so Quantify can also evaluate data off-line, allowing users to extract and/or analyze relevant intensities from previously acquired measurements.

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Easy setup and reporting, comprehensive online help

An intuitive Windows-based user interface ensures easy setup and predefined reports allow fast access to results. There are full reporting facilities, from result reports for a single sample or batch to complete daily, weekly or monthly reports and control graphs of, for example, intensity. Quantify also features a scheduler that allows the diffractometer to start up automatically at any pre-set time and a comprehensive online Help.

Wide range of quantification models with advanced intensity correction

Quantify offers the most complete range of quantification models including General, Straight-Line, Matrix Flushing, Internal Standard, Single- and Dual-line Addition, Relative Intensity Ratio (RIR), and Thin Layer Models. All models are based on a direct measurement of the individual reflections rather than on the interpretation of a complete scan.

Advanced intensity corrections for optimal analytical integrity

A broad range of correction algorithms helps obtain the net intensity of a peak with the highest accuracy. These include overlap corrections using either a fixed correction factor or calibration with a linear multivariate regression formula, monitor drift correction, and background corrections using a range of correction techniques. Counting statistical errors are used to estimate results accuracy in all related measured intensities.

Quick start guides

Download our quick start guides to get up and running easily with Quantify:


Current version

Version 1.2

Powerful and easy tool

Quantify is a complete analysis package that includes data acquisition, evaluation, correction routines and calibration models. It supports gonio-scans (θ is always half of 2θ) and 2θ-omega scans.

Quantify software itself is compatible with Windows 7, Windows 10 and Windows XP. 

Quantify can control the following generations of diffraction systems, and their sample changers:

  • PW1710 controlled systems
  • PW1800
  • PW3710 controlled systems (X’Pert-APD)
  • X’Pert-MPD
  • X’Pert PRO MPD
  • CubiX-XRD
  • CubiX PRO
  • CubiX³ range
  • X’Pert Powder
  • X’Pert³ Powder

The following parts are included in the delivery:

  • Quantify
  • Explorer add-ons
  • Instrument control software
  • Microsoft .NET Framework 4

Help and a Quick Start Guide are provided for both Quantify and Explorer add-ons. 

Printed versions of the Quick Start Guides are only delivered with license to use and upgrade versions and not with updates.

Recommended configuration

  • Quantify software itself is tested to run correctly on Windows 10, Windows 7 Professional edition (64-bit) and on Windows XP Professional edition (32-bit) with SP3.
  • Internet Explorer version 7.0 or later should be installed on your system for displaying the Help topics.
  • Adobe Acrobat Reader or an equivalent PDF file viewer should be installed on your system for displaying the Quick Start Guides and the generated reports in PDF format.
  • For handling of large quantities of data 4 GB of RAM is recommended.

Minimum configuration

The minimal PC configuration to run the software can be found on the Microsoft Internet site:

  • Windows 7
  • Windows XP

The software is delivered on a DVD (drive required) or as an electronic update.

For measuring data a COM port is required for the communication with the diffractometer and one extra COM port is required if the instrument is equipped with an X’Changer or X’Handler sample changer.

For upgrading the instrument control software a minimal screen resolution of 1280 x 1024 is required.