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Epsilon Xline 0
Epsilon Xline 1
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Epsilon Xline

In-line control for continuous roll-to-roll processes

  • Advanced energy-dispersive XRF with in-line functionality
  • Real-time monitoring in roll-to-roll (R2R) coating
  • Direct analysis for continuous optimization

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To request a quote, more information or download a brochure select an option below.

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Overview

Epsilon Xline combines our advanced energy dispersive XRF (EDXRF) technology with in-line functionality. This advanced solution enables real-time materials monitoring and process control in roll-to-roll (R2R) coating processes. Direct analysis allows continuous optimization of material composition and loading, helping to minimize off-specification production and maximize cost-efficiency. The adaptable Epsilon Xline can deliver precise and accurate process control across a wide range of surfaces and elements.  

Features

  • Full in-line automation: Enjoy continuous R2R production thanks to seamless integration capabilities, suitable for a range of thin-film and coating applications. 

  • Simple and safe: fully X-ray safe and easy to use, unlike handheld or legacy instruments, and delivers highly accurate analytical data. 

  • A lifetime of experience: Drawing on Malvern Panalytical’s more than 70 years’ experience in elemental analysis, the Epsilon Xline was developed in collaboration with our industry partners to meet their needs of today, and at the same time looking to the industry’s future together. 

  • Maximized yield: Achieve cost-competitive production with real-time monitoring and no disruption – giving you the direct insights and control you need to get the most out of your operations. 

  • Optimum materials efficiency: Eliminate inconsistencies, avoid wasting precious materials, and ensure a high-quality product with our industry-standard solution. 

  • Proven, patented accuracy: Developed and tested with customers, the Epsilon Xline features patented height-correction technology that ensures stable analysis for accurate results. 

Why Epsilon Xline?

  • Non-destructive in-line process control – no sampling required
  • Range of scanning modes to accommodate patch continuously, and multi-lane coating processes
  • Easy to integrate into production processes with standard communication protocols 
  • Able to measure all valuable elements of interest, including platinum and cerium 
  • Capable of measuring thin layers with excellent precision
  • Accommodates a range of roll widths
  • Unique patented robotic arm that provides optimal distance control by hovering the measurement head over the production line in all directions

Facing the challenges of fuel cell production

With platinum catalysts accounting for more than 20% of your overall fuel cell costs, optimizing catalyst coating through uniform dispersion and consistent layering is essential. And fast, accurate process monitoring is the ideal solution! The Epsilon Xline makes efficient operational control easy, helping you to:  

  • Minimize your off-specification production  
  • Save valuable platinum from being wasted  
  • Produce cost-competitive end-products 

Elemental analysis within your process

X-ray fluorescence  (XRF) is a non-destructive elemental analysis technology that enables in-line monitoring during the coating processes of catalytic membranes – without the need to take samples and without chemical or physical changes.  

The resulting real-time in-line analysis enables the rapid optimization of many process parameters and product properties. 

Highly repeatable and accurate measurements with low maintenance

The proven and robust technology used in the Epsilon Xline and throughout our series of Epsilon instruments is powered by the latest advances in excitation and detection technology. 

A well-designed optical path, a wide range of excitation capabilities for light and heavier elements, and a fast high-resolution SDD detector system contribute to the power of the Epsilon Xline. These innovations result in highly repeatable and accurate results with low maintenance. 

Specification

Sample handling

Sample types
Coating line
Coating types
Continuous, lanes, patches
Line speed continuous coating
Maximum 30 m/min
Line speed patch coating
Maximum 11 m/min

X-ray tube

Type
Metal-ceramic, 50 µm (Be) side window
Anode material Ag
Tube setting
Software controlled, applicable voltages 4 - 50 kV, max. 3 mA, max. tube power 15 W
X-Ray filtering
Six, software selectable (Cu 300 µm; Cu 500 µm; Al 50 µm; Al 200 µm; Ti 7 µm; Ag 100 µm

Detector

Type
High-resolution Si drift detector SDD10
Window: 8 µm (Be)
Resolution
< 145 eV @ 5.9 keV/1000 cps
Typically 135 eV @ 5.9 keV/1000 cps

Safety Standards

Radiation levels
< 1 µSv/h at 10 cm of the outside surface

Accessories

Built-in connectivity

Integrate the Epsilon Xline into your production lines seamlessly with built-in OPC connectivity. The dedicated software package included makes it simple to set up your Epsilon Xline for different materials and measurement modes. By entering commands directly into the instrument – or via a remote console – the easy-to-use interface displays an overview of complete tracking data.  

Epsilon software

Analytical EDXRF software package for Epsilon benchtop systems

Epsilon software is the XRF analysis software platform that is used with PANalytical’s range of Epsilon 1 and Epsilon 4 benchtop EDXRF systems. The software offers all the functions required to set up and operate an Epsilon benchtop system. The analytical program assembly is greatly facilitated by the high degree of intelligence built into the software, allowing users to benefit from half a century of applications expertise. Daily XRF analysis is a routine task that can be readily carried out by inexperienced personnel after a minimum of instruction. Many features are present to enhance the usability of the software.

Stratos

Determination of composition and thickness of coatings and multi-layers

The Stratos software module features an algorithm which enables simultaneous determination of chemical composition and thickness of layered materials from measurements taken. The software provides a rapid, simple and non-destructive means of analyzing coatings, surface layers and multi-layered structures. The Virtual Analyst provides intelligence during the setup of measurement programs for complicated stacks. 


Available for both the Epsilon 4 EDXRF and Zetium XRF spectrometers, Stratos delivers fast and reliable results regardless of sample type or matrix.

User manuals

Please contact support for the latest user manuals.

Software downloads

Please contact support for the latest software version.

Support

Solutions to maximize the return on your investment

To assure that your instrument remains in top condition and performs on the highest level, Malvern Panalytical offers a wide range of services. Our expertise and support services assure an optimal functioning of your instrument.

Support

Service for a lifetime

  • Phone and remote support
  • Preventive maintenance and checkups
  • Flexible Customer Care Agreements
  • Performance certificates
  • Hardware and software upgrades
  • Local and global support

Expertise

Adding value to your processes 

  • Sample preparation development/optimization
  • Analytical methodologies 
  • Turnkey solutions for XRD 
  • Operations via IQ/OQ/PQ, quality assurance (GLP, ISO17025) or round robins/inter laboratory studies
  • Consultancy services

Training and education

  • Training on-site or at our competence centers
  • Broad range of basic and advanced courses on products, applications and software
In-line control made simple.

In-line control made simple.

Advanced elemental analysis for in-line on-product inspection. Making continuous, reliable monitoring easy.

Contact sales Request a quote Request a demo