See the current 2830 ZT . Learn more
Learn more
The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.
Looking for more information?
To request support or get more information, please select an option below.
Contact support Service Agreement| Title | Version | Date | Download |
|---|---|---|---|
| {{ row.title }} | {{ row.softwareVersion }} | {{ row.date }} | Download |
Sorry, no manuals are available for this product
| Title | Version | Date | Download |
|---|---|---|---|
| {{ row.title }} | {{ row.softwareVersion }} | {{ row.date }} | Download |
Sorry, no software downloads are available for this product
Find out how to upgrade to the latest version of your instrument, speak to our sales team.
Find a sales or a support contact for your country or region.
Access technical support, training, software resources, and expert assistance for your instrument.
Keep instruments reliable, accurate and available with preventive maintenance, service agreements, repairs and proactive monitoring.
Get support for hardware, software, diagnostics or repairs, and manage your requests through the customer support portal.
Develop instrument and application knowledge through user courses, tailored training and expert-led online learning.