Extending the CT capability of your multipurpose diffractometer

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Computed tomography (CT) is a non-destructive analysis method that provides information about the structure, material, defects and pore distribution in solid objects by means of 3D reconstruction. This information can be obtained due to the difference in transmission through sample regions with different densities and/or chemical composition.

Earlier we already presented Empyrean - the only XRD instrument that allows performing computed tomography measurements on a standard laboratory X-ray diffractometer. In this way the CT solution provides the possibility to combine conventional XRD applications (powder XRD, stress & texture, μ-XRD etc.) with computed tomography on one multipurpose diffraction platform.
So far this has only been possible because of PANalytical’s high-performance detectors, PIXcel3D and PIXcel3D 2x2 together with dedicated CT sample stages.

The webinar will demonstrate how the CT capability on PANalytical systems can be extended from pharmaceutical products, polymer composites and other relatively light materials to metal- or heavy-element-containing objects by means of high-energy radiation and the new PANalytical GaliPIX3D detector.

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Author

Natalia Dadivanyan has studied chemistry at the Moscow State University (Russia). After completing her master thesis on synthesis and characterization of polymer liquid crystalline films Natalia moved to the University of Freiburg (Germany) to obtain her PhD degree working on liquid crystalline elastomers. This was followed by a post-doc position at the Eindhoven University of Technology (the Netherlands), where Natalia focused on organic semi-conductors. In 2012 Natalia joined PANalytical as an application specialist XRD, in Almelo (the Netherlands).