記録された日時: May 22 2018

Duration: 01 hours 10 minutes 55 seconds

X-ray Powder Diffractometers are versatile instruments that often come with a variety of optics and accessories that can be exchanged to optimize measurements. While these options provide flexibility, they can also leave one unsure about the best configuration to use. This presentation will teach ways to navigate all of the choices and select the best configuration and measurement parameters to collect powder diffraction data from a variety of samples.

This presentation will:

  • review the common optics used for X-ray powder diffraction and discuss their impact on data quality;
  • discuss how configuration affects resolution, intensity, beam size, etc;
  • identify the most critical criteria for collecting accurate data;
  • discuss how different sample types (clinker, mining, chemical, pharmaceutical, advanced materials) place different requirements on measurements;
  • discuss strategies for optimizing measurement parameters.
Table of contents
1. Introduction to X-ray powder diffractometry:
03:06
2. Objective
01:14
3. downloads
00:54
4. Common optics for x-ray powder diffraction
00:08
5. Why do we need optics for XRPD?
02:03
6. Why do we need optics for XRPD?
03:25
7. Soller Slits reduce axial divergence
02:53
8. Divergence Slits limit equatorial divergence
03:46
9. Other slits and optics
01:37
10. Why do we need optics for XRPD?
01:20
11. Beta-filter
01:08
12. Monochromator
01:51
13. Incident-beam prefix modules
02:28
14. Incident-beam prefix modules
01:01
15. Detectors
00:15
16. Criteria for accurate xrpd data
00:07
17. Collecting accurate data
01:25
18. Anode type
01:48
19. Anode Type
00:34
20. Anode type
00:22
21. Anode type
02:11
22. Sample fluorescence
01:52
23. Instrument configuration criteria
01:19
24. Instrument configuration criteria
00:41
25. X-ray penetration depth
01:08
26. Video 1
00:00
27. X-ray penetration depth
01:29
28. Instrument configuration
01:28
29. Instrument configuration
00:11
30. Instrument configuration criteria
00:10
31. Instrument configuration criteria
00:11
32. Video 2
00:00
33. Instrument parameters for accurate data
00:25
34. Instrument parameters for accurate data
00:48
35. Instrument parameters for accurate data
01:51
36. Instrument parameters for accurate data
01:33
37. Instrument alignment
00:41
38. Optimizing measurement parameters
00:08
39. Measurement parameters
00:12
40. Program type
00:06
41. Video 3
00:00
42. Scan types (Scan axis)
01:52
43. Measurement parameters
00:49
44. Step size
01:28
45. Step size
00:54
46. Step size
02:06
47. Scan rate
03:02
48. Scan rate
01:17
49. Scan Rate
00:45
50. Scan Rate
00:22
51. Video 4
00:00
52. Scan Rate
01:07
53. Scan repetition
02:25
54. Video 5
00:00
55. Improving crystallite statistics
00:57
56. Improving crystallite statistics
00:36
57. Video 6
00:00
58. Improving crystallite statistics
01:10
59. Concerns and recommendations for various sample types
00:16
60. Want to know more?
00:48
61. Appendix A:illustrated reference guide for Prefix modules
00:14
62. Question & Answer SessionUse the Q & A icon and type your question.If listening on demand send your questions to: events@malvernpanalytical.comThank you for attending
02:58