Ask an Expert: Transmission vs reflection XRD measurements

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In almost every powder diffractometer, the reflection geometry is used. This is where the detector is on the same side of the sample surface. This geometry works very well for inorganic materials that can be prepared as flat samples with randomly oriented crystallites. However, it is very difficult to measure reflections below 5 degrees 2Theta accurately using reflection geometry. For instance, special care is needed to keep the background to a reasonable level. And the peak position is very sensitive to any error in sample preparation.

Transmission geometry on the other hand is easy and straightforward for measuring reflections at low angles. Moreover, transmission measurements let you minimize preferred orientation effects. They are an especially great match for low-absorbing organic materials such as those used in the pharmaceutical industry.

During this webinar, our senior application scientist, Dr. Daniel Lee will introduce the basics of transmission and reflection measurements. He will share which types of samples and experiments would be more viable for transmission measurement. Look out for his tips when conducting such research too. He will showcase the benefits and data quality of transmission measurements on various samples. For instance the intense peaks and clear visibility of reflections. Dr. Lee will demonstrate data collected from Malvern Panalytical’s Empyrean floor standing as well as the Aeris compact XRD. For the Aeris XRD, this is part of the suite of new and powerful features recently added to its capabilities.

Join our free series of webinars: "Ask our Expert: Better XRD data analysis":

- Webinar 1: Introduction to powder XRD. More info

- Webinar 2: XRD Phase quantification: step-by-step tutorial. More info

- Webinar 3: Transmission vs reflection measurements: practical tips on when to use which.

- Webinar 4: Advanced in-situ experiments on Metal Organic Frameworks. More info


Dr Daniel Lee, Malvern Panalytical's senior application specialist for XRD, based in South Korea

Dr Lee has a PhD in Materials Science and Engineering. his expertise is on PVD, thin-film analysis, phorphors, solar cells, lithium ion batteries and thin-film battery research. He has been instrumental in providing application support using X-ray diffraction analysis to various industries including electronics, batteries, pharmaceuticals, building materials and more. These include powder diffraction, Rietveld refinement, small angle X-ray scattering, stress and texture research. Prior to joining Malvern Panalytical in 2013, he worked as a senior researcher with GS Nanotech. He was involved in the process engineering process for thin film lithium ion batteries. He also held prior appointments within the R and D team at Telio Solar Korea for CIGS solar cell development.


Who should attend?

  • Researchers involved in materials characterization analysis who want to expand their knowledge in X-ray diffraction
  • Relevant industries include (but are not limited to) those researching on battery, powder metallurgy, cement, mining and minerals, environmental monitoring, pharmaceuticals and more
  • R and D and manufacturing leaders responsible for appropriate analytics selection
  • Scientists engaged in method development for new materials or in supporting root cause analysis investigations in support of product manufacturing

How long is this webinar?

  • 40 minutes is the intended speaker time with additional time for addressing queries.