Up to one third of the production cost of an additive manufacturing component produced by powder bed processes (particularly metals) is the cost of the powder used, with commercial viability resting on establishing a robust supply chain and effective powder recycling strategies. More importantly, the chemical and physical properties of the powder directly impact the build process and final component quality and must be controlled and optimized to ensure process robustness and consistency. To achieve this, powder properties must be characterized at various stages in the supply chain, from new alloy development through to powder recycling. 

This online seminar, with a duration of 1h 45min, will provide an overview of four key analytical techniques that are commonly used to characterise additive manufacturing powders, including laser diffraction, automated image analysis, X-ray fluorescence and X-ray diffraction, and the benefits they offer.


October 22 2019 - October 22 2019
10:30 - 12:15
(GMT-05:00) Eastern [US & Canada]
Event type:
Webinar - Live


Anne Virden Ph.D. 

Product Technical Specialist for Diffraction and Analytical Imaging. Anne joined Malvern in 2007 with a PhD in Physics from the University of York. She has since been supporting Malvern’s Mastersizer and Spraytec customers and has built up wide ranging experience of particle sizing in industries including paints and pigments, pharmaceuticals, mining and minerals, and is a particular expert in the measurement of spray systems. Anne has also recently taken on responsibility for Malvern’s Analytical Imaging systems.

Marco Sommariva

Marco Sommariva is currently Team Leader XRD in the Malvern Panalytical Application Competence Center, in Almelo, The Netherlands. He studied Material Science in Milan (Italy), with a thesis on synthesis and characterization of solid electrolytes for lithium batteries. Marco then moved on as a post-doc at the Rutherford Laboratory in the UK, working on a project about complex hydrides for hydrogen storage, before joining PANalytical in 2011 as application specialist XRD, in Almelo (the Netherlands).

Robert Taylor Ph.D. 

Having spent nearly 4 postgraduate years firing lasers at precious metals, Rob moved into developing electrochemical and spectroscopic applications in pharmaceutical development. The following 8 years was a journey in understanding physicochemical properties of drugs. Since joining Malvern Panalytical as an imaging Technical Specialist, Rob is now discovering the applications of particle size and shape in, not only pharmaceutical products, but also food and advanced materials.

Armand Jonkers

Armand Jonkers is currently senior application specialist XRF in the Malvern Panalytical Application Competence Center, in Almelo (the Netherlands). He studied analytical chemistry in Eindhoven, the Netherlands, where his thesis handled about the analysis of metals in organic solutions using Inductively Coupled Plasma (ICP). After he started working at Philips IE (now Malvern Panalytical), where he was active in Optical Emission techniques (ICP, Spark-OES, Arc-OES, GDL-OES). In 1992 he moved to the XRF department, where he is still active and specialized in thin-film and metal analysis. Besides that, he is responsible for OQ procedures for XRF.