(This webinar will be conducted in Mandarin)
In materials research, the scientist has many analytical questions related to the crystalline constitution of material samples. X-ray diffraction (XRD) is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness. Materials researchers therefore use XRD to analyze a wide range of materials, from powder X-ray diffraction (XRPD) to solids, thin films and nanomaterials.
Interested to improve your materials characterization analysis and interpretation? Join our series of XRD webinars which are focused on helping you achieve better XRD data. This requires users to be aware about proper sampling, sample preparation, XRD instrument set up and configuration based on the type of sample you wish to analyse. Data collection is just the first step. Refining the data and making sense of its implications is crucial towards decisions regarding your R and D.
During this webinar, Dr Plex Lee, Malvern Panalytical's application specialist will be providing an introduction to the XRD technique. Use this session to equip yourself with a good foundation of XRD, from the theory of Braggs law through to the physics of the X-ray diffractometer.
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想增進您對材料分析和數據判讀的專業能力嗎？參加我們一系列的XRD線上研討會，能幫助您獲得更好的數據。從樣品類型分析，製備，取樣到XRD光學模組配置，實驗的每一個細節都對數據的品質至關重要。而在數據收集後，完善且專業的數據分析則是您的研發決策上不可或缺的一環。
在這次線上研討會中，Malvern Panalytical的資深應用專家Plex Lee博士將為您介紹XRD技術，從布拉格定律的基礎理論到X光繞射的實驗原理，本課程都能為您在XRD應用上奠定良好的基礎。
Speakers
Dr Plex Lee (李秉中), Applications Engineer at Malvern Panalytical, Taiwan
Dr. Plex Lee joins the Taiwan team as an applications engineer. Dr Lee has a PhD in Engineering and System Science. His expertise is on nano science, thin-film analysis, thermoelectric material, PLD and low temperature physics research. He has multiple years of experience in providing experimental consultancy and data analysis guidance using X-ray diffraction and X-ray fluorescence to numerous research realms. These include quantum-material, superconductor, magnetic thin film, nano-bio materials and more. Dr Lee has conducted research using powder, thin film, single crystal X-ray diffraction and is well versed in Rietveld refinement, elemental composition analysis, grain size and residual stress research. Prior to joining Malvern Panalytical, he worked in the Institute of Physics at Academia Sinica for close to 13 years. He took on various roles as an X-ray analysis laboratory manager and postdoctoral fellow.
李秉中博士近日以應用專家的身分加入Malvern Panalytical X光分析團隊,李博士擁有工程與系統科學博士學位,主要研究領域為奈米科學,薄膜分析,熱電材料以及低溫物理相關主題.他在X光材料分析領域也擁有多年經驗,包含X光繞射分析以及X光螢光分析.在中研院物理所擔任博士後研究以及X光實驗室主任期間,對於各研究團隊所需X光材料分析多有著墨,材料的型態涵蓋粉末,薄膜,單晶繞射以及Rietveld結構精算分析,而領域則含括量子材料,超導材料,磁性薄膜,奈米生物材料等.
FAQ
誰該參加？
- 從事材料表徵分析的研究人員，希望擴展在X光繞射上的知識
- 相關行業包括（但不限於）電池、粉末冶金、水泥、採礦和礦產、環境監測、製藥等領域的研究
- 負責選擇最佳的分析方法的研發或製造的主管們