Date recorded: October 29 2020

(This webinar will be conducted in Mandarin)

In materials research, the scientist has many analytical questions related to the crystalline constitution of material samples. X-ray diffraction (XRD) is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness. Materials researchers therefore use XRD to analyze a wide range of materials, from powder X-ray diffraction (XRPD) to solids, thin films and nanomaterials.

Interested to improve your materials characterization analysis and interpretation? Join our series of XRD webinars which are focused on helping you achieve better XRD data. This requires users to be aware about proper sampling, sample preparation, XRD instrument set up and configuration based on the type of sample you wish to analyse. Data collection is just the first step. Refining the data and making sense of its implications is crucial towards decisions regarding your R and D.

During this webinar, Dr Plex Lee, Malvern Panalytical's application specialist will be providing an introduction to the XRD technique. Use this session to equip yourself with a good foundation of XRD, from the theory of Braggs law through to the physics of the X-ray diffractometer.

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在材料分析研究中,樣品的晶體結構組成一直是一門重要的課題,而X光繞射實驗(XRD)則是唯一一種能提供樣品晶體結構資訊的實驗室分析技術。除了晶體結構分析外,XRD亦能幫助判讀化學成分、晶粒尺寸、材料應變、優選晶向和薄膜厚度等資訊。因此材料研究人員經常會應用XRD來分析各式各樣的材料,從X光粉末繞射(XRPD)到固體、薄膜和奈米材料。

想增進您對材料分析和數據判讀的專業能力嗎?參加我們一系列的XRD線上研討會,能幫助您獲得更好的數據。從樣品類型分析,製備,取樣到XRD光學模組配置,實驗的每一個細節都對數據的品質至關重要。而在數據收集後,完善且專業的數據分析則是您的研發決策上不可或缺的一環。

在這次線上研討會中,Malvern Panalytical的資深應用專家Plex Lee博士將為您介紹XRD技術,從布拉格定律的基礎理論到X光繞射的實驗原理,本課程都能為您在XRD應用上奠定良好的基礎。