Epsilon 4 Mining & minerals

Increase your process efficiency and recovery rate

  • Multi-functional benchtop XRF analyzer
  • Designed for mining operations, including remote locations
  • Elemental analysis from fluorine (F) to americium (Am) in areas from R

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Overview

X-ray fluorescence spectroscopy (XRF) has an important and well-established analytical role within the mining and minerals industry. It is used extensively for exploration, grade control, process monitoring and assuring that the composition of waste is within the limits of environmental norms and regulations.

Epsilon 4 benchtop spectrometers are used in mining operations, even at remote locations, for fast elemental analysis of ores, minerals and rocks. The combination of low infrastructural demands and the high analytical performance, enables quick determination of operation strategies in mining locations where utilities are limited.

Discover the possibilities of XRF analysis and reduce your feedback time from hours to minutes by placing the Epsilon 4 benchtop XRF spectrometer next to your mine or processing plant.

Features

  • The power of benchtop XRF: Combining the latest excitation and detection technologies and smart design, the analytical performance of Epsilon 4 approaches that of more powerful and floor-standing spectrometers. Selective excitation and careful matching of the X-ray tube output to the capabilities of the detection system underlie the system’s outstanding performance.

  • Unattended operation: The combination of a 10-position removable sample changer with spinner enables the automatic processing of sample batches without the need for operator attention. Continuous rotation of the sample during measurement minimizes any errors caused by non-homogeneity or surface irregularities within individual samples and provides more accurate results. Automatic transfer of data to a central location gives you access to the latest results.

  • Fast and sensitive: Fast measurements are achieved by using the latest silicon drift detector technology that produces significantly higher intensities. Unique detector electronics enable a linear count rate capacity to over 1,500,000 cps (at 50% dead time) and a count rate independent resolution typically better than 135 eV for better separation of analytical lines in the spectrum. This allows the Epsilon 4 spectrometer to run at full power and therefore realizes a much higher sample throughput compared to traditional EDXRF benchtop instruments.

  • Reduce helium consumption: The high performance of Epsilon 4 enables many applications to be operated in air atmosphere, without longer overhead time and costs involved for helium or maintenance of vacuum system. When measuring in air, low-energy X-ray photons characteristic of sodium, magnesium and aluminium, are sensitive to variations in air pressure and temperature. Built-in temperature and air-pressure sensors compensate for these environmental variations, ensuring excellent results whatever the weather.

Flexible wide-range oxide solution (WROXI)

Malvern Panalytical has developed a unique set of 15 synthetic, multi-element wide-range oxide (WROXI) certified reference materials (CRM). Together with Epsilon 4, WROXI can be used for the analysis of major and minor elements in fused beads. 

With the FP algorithm in the Epsilon software, the WROXI application can determine concentrations of up to 11 common oxides in a wide range of rocks, ores and minerals.

Value beyond compliance

X-ray fluorescence spectroscopy (XRF) is a safe, cost-effective, and highly reliable method that is well-established within the mining and minerals industry.

Using the Epsilon 4 in at-line mineral processing operations provides quick, efficient steering in mineral beneficiation plants.

Key applications

Epsilon 4 spectrometers can handle a large variety of sample types, weighing from a few milligrams to larger bulk samples. Samples can be measured as:

  • Solids
  • Pressed powders
  • Loose powders
  • Liquids
  • Fused beads
  • Slurries
  • Granules
  • Filters
  • Films and coatings

Great tool. Quick analysis, easy-to-use repeatable. Very helpful and competent assistance.

Omar Scaccabarozzi — Analyst

Specification

Sample handling

Sample capacity 10-position removable sample changer
Sample size Spectrometer can accommodate samples up to 52 mm (2 inch) in diameter
Features Spinner is included for better accuracy of air filter analysis

X-ray tube

Features Metal-ceramic side window for maximum stability
50 micrometers thin beryllium window for high sensitivity for light elements (Na, Mg, Al, Si)
Tube setting Ag anode X-ray tube for best performance of P, S and Cl analysis

Detector

Detector type High-resolution silicon drift detector (SDD), typically 135 eV @ Mn-Kα
Features Max count rate of 1,500,000 counts/s at 50% dead time
Thin-entrance detector window for high sensitivity

Software

Software
  • Elemental screening with Omnian standardless analysis solution
  • PASS/FAIL analysis with FingerPrint solution
  • Enhanced Data Security for regulated environments
  • Stratos for multi-layered samples
  • One flexible calibration for wear metals in fresh and used lubricating oils using Oil-Trace

Accessories

Software

Epsilon software

Analytical EDXRF software package for Epsilon benchtop systems

Epsilon software is the XRF analysis software platform that is used with PANalytical’s range of Epsilon 1 and Epsilon 4 benchtop EDXRF systems. The software offers all the functions required to set up and operate an Epsilon benchtop system. The analytical program assembly is greatly facilitated by the high degree of intelligence built into the software, allowing users to benefit from half a century of applications expertise. Daily XRF analysis is a routine task that can be readily carried out by inexperienced personnel after a minimum of instruction. Many features are present to enhance the usability of the software.

Stratos

Determination of composition and thickness of coatings and multi-layers

The Stratos software module features an algorithm which enables simultaneous determination of chemical composition and thickness of layered materials from measurements taken. The software provides a rapid, simple and non-destructive means of analyzing coatings, surface layers and multi-layered structures. The Virtual Analyst provides intelligence during the setup of measurement programs for complicated stacks. 


Available for both the Epsilon 4 EDXRF and Zetium XRF spectrometers, Stratos delivers fast and reliable results regardless of sample type or matrix.

Omnian

Standardless analysis of all types of samples

Omnian enables users to achieve the best possible analysis when dedicated methods or certified standards do not exist. A trendsetting standardless analysis package, Omnian incorporates state-of-the-art software and setup samples that transcend technologies. Available for Epsilon 1, Epsilon 4 and Zetium spectrometers, Omnian delivers fast and reliable results regardless of sample type or matrix.

Oil-Trace

Accurate trace element analysis

Oil-Trace is a software package consisting of a suite of standards which enables users to perform accurate and reliable elemental analysis of liquids using WDXRF and EDXRF. Oil-Trace solves two problems when analyzing liquids:

1) Adequate matrix correction in the presence of an unknown mix of CHON elements

2) Correcting for errors due to variations in the volume of the sample being analyzed

By effectively tackling these problems, Oil-Trace brings significant benefits to petroleum analysis.

FingerPrint

Instant material identification

A FingerPrint software module combined with an Epsilon 4 EDXRF system is ideal for material testing when analysis speed is important but the actual composition is not of interest. FingerPrinting generally involves little to no sample preparation and is non-destructive.

Enhanced Data Security

Securing your data and satisfying auditors

The Enhanced Data Security (EDS) module is a software option that provides enhanced trust in results for users of the Zetium XRF spectrometer (through the SuperQ software) and the Epsilon XRF spectrometer. With capabilities including advanced user management, action logging, data protection, and application status assignment, EDS helps you strengthen your audit trail, minimize the risk of error, and prove that your XRF instrument is working as expected.

Standards (Reference materials)

ADPOL

Accurate and trustworthy XRF elemental composition of your polymers, compounds and plastics, obtained in minutes. 

More information

WROXI

Accurate wide-range oxide analysis of minerals

WROXI CRM is a synthetic, high-quality Certified Reference Materials kit that covers a wide range of oxide materials such as ores, rocks, and geological materials.

More information

LAS: Low Alloy Steel

Low alloy steel analysis with Malvern Panalytical XRF spectrometers.

Low Alloy Steel (LAS) package for the sequential and simultaneous XRF spectrometers Zetium and Axios FAST, is based on >90 CRMs covering up to 21 elements, and 4 monitor samples for drift- and sample preparation correction.

More information

RoHS

Accurate elemental analysis of RoHS restricted materials.

The RoHS calibration module helps manufacturers and research laboratories comply with the requirements of RoHS 2 legislation. Accurate elemental analysis using RoHS Calibration Standards can save you money and support compliance with international regulations like REACH.

More information

TOXEL

Accurate analysis by XRF of toxic elements in polymers and plastics

The TOXEL module enables easy and accurate elemental analysis of toxic elements in polyolefins, including many kinds of PP and PE.

More information

CRMs

Certified reference materials, including XRF calibration modules and reference materials

More information

Sample preparation

Claisse LeNeo

Keeping ahead through Claisse expertise in fusion.

Claisse LeNeo fusion instrument prepares glass disks for XRF as well as borate and peroxide solutions for AA analysis and ICP analysis. LeNeo is a single-position electrical instrument.

More information
Claisse LeNeo

User manuals

Software downloads

Please contact support for the latest software version.

Support

Solutions to maximize the return on your investment

To assure that your instrument remains in top condition and performs on the highest level, Malvern Panalytical offers a wide range of services. Our expertise and support services assure an optimal functioning of your instrument.

Support

Service for a lifetime

  • Phone and remote support
  • Preventive maintenance and checkups
  • Flexible Customer Care Agreements
  • Performance certificates
  • Hardware and software upgrades
  • Local and global support

Expertise

Adding value to your processes 

  • Sample preparation development/optimization
  • Analytical methodologies 
  • Turnkey solutions for XRD 
  • Operations via IQ/OQ/PQ, quality assurance (GLP, ISO17025) or round robins/inter laboratory studies
  • Consultancy services

Training and education

  • Training on-site or at our competence centers
  • Broad range of basic and advanced courses on products, applications and software
Elemental analysis in minutes.

Elemental analysis in minutes.

Choose Epsilon 4 for fast elemental analysis of ores, minerals and rocks in mining operations, even at remote locations.

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