記録された日時: July 24 2018

Duration: 26 minutes 05 seconds

Discover the capabilities of the X-ray diffraction (XRD) Benchtop Aeris instrument, with ease of use and market leading performance.

Key topics include:

  • How can you benefit from XRD
  • Best-in-class data quality
  • Aeris in action
  • Data and results export
  • Using advanced mode of Aeris
  • Creating measurement program
Table of contents
1. Demo at your desk – X-ray diffraction (XRD) Bench top Aeris
02:23
2. Poll Question
00:00
3. Demo at your desk – X-ray diffraction (XRD) Bench top Aeris
00:42
4. Poll Answer
00:00
5. Outline of the demo
00:37
6. X-ray diffraction (XRD) in a nut-shell
00:23
7. Crystal structure
01:34
8. Bragg’S Law
01:00
9. X-Ray Powder diffraction pattern
00:57
10. How can you benefit from XRD…
00:40
11. How can you benefit from XRD…
00:55
12. How can you benefit from XRD…
00:43
13. How can you measure XRD?
00:56
14. Best-in-class data quality
00:16
15. Best-in-class data quality
00:17
16. Best-in-class data quality
00:23
17. Lets look at Aeris in action
00:07
18. Demo 1: using Aeris as a black box
00:42
19. Demo 1: using Aeris as a black box
00:00
20. Data and results export
00:19
21. Demo 2: using advanced mode of Aeris
00:56
22. Demo 2: using advanced mode of Aeris
00:00
23. Demo 2: using advanced mode of Aeris
00:14
24. Demo 3: creating measurement program
00:00
25. Summary and Q&A
11:34
26. Question & Answer Session
00:27