For X-ray diffraction at extremely low temperatures

The PheniX cryostat is designed for in situ powder X-ray diffraction studies of both organic and inorganic compounds. Typical applications of the PheniX cryostat are dynamic structural changes, phase transformations, structure imperfections at temperatures down to 12 K. Furthermore, the reflection geometry enables basic measurements of thin films and solids (phase identification, residual stress and basic reflectometry).