From conventional XRD to basic thin film analysis

The TTK 600 chamber is designed for conventional in situ X-ray diffraction on powder samples at low to medium-high temperatures for the study of dynamic crystal structure changes, phase transformations, chemical reactions, etc. Furthermore basic phase composition, basic reflectometry and basic residual stress measurements on relatively thin samples can also be done with this chamber. TTK 600 is suitable for both organic and inorganic materials.

Measuring accurate peak position in non-ambient XRD

Application Note

Automatic analysis of large amounts of X-ray diffraction data with HighScore Plus

Application Note