Characterizing material Properties for Additive Manufacturing

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00:00:00 Welcome
00:00:09 Agenda
00:04:43 Laser diffraction particle size analysis for additive manufacturing
00:05:58 Overview
00:06:27 Additive Manufacturing: advantages
00:07:14 Additive Manufacturing: Challenges
00:08:18 Additive Manufacturing: Powder bed processing
00:09:20 Additive Manufacturing: Powder bed processing
00:11:26 Measuring particle size using laser diffraction
00:11:40 How does laser diffraction work?
00:12:25 Particle size analysis using laser diffraction
00:13:39 How does the instrument work?
00:14:35 How does the instrument work?
00:15:31 The Mastersizer 3000
00:16:16 Laser diffraction results
00:17:16 Laser diffraction examples
00:17:27 Particle size analysis
00:19:29 Additive Manufacturing: recycling powder
00:20:59 Particle size analysis
00:22:03 In-process laser diffraction
00:23:08 In-process laser diffraction
00:23:47 Comparison of Mastersizer and Insitec
00:24:07 InnovateUK: Powdercleanse
00:24:38 InnovateUk: Powdercleanse
00:25:08 Any questions?
00:25:30 Analytical Imaging for Additive Layer ManufactureDr Robert TaylorTechnical Specialist – Analytical Imaging and Laser Diffraction
00:27:10 Morphologi 4 & 4ID Hardware
00:28:24 Morphological imaging workflow
00:29:45 Morphological results
00:30:25 Morphological shape descriptors
00:31:27 Result interpretation
00:31:46 How can particle shape be measured?
00:32:56 Sample Presentation
00:33:58 Result interpretation
00:34:57 Result interpretation
00:37:23 Additive Layer Manufacture
00:37:28 Additive Manufacturing: Powder Bed Formation
00:38:46 Additive Manufacturing: Powder Bed Formation
00:40:04 Additive Manufacturing: Powder Bed Formation
00:41:12 Additive Manufacturing: Powder Bed Formation
00:42:00 Particle Size and Shape Analysis
00:42:13 Sample Preparation
00:42:57 Particle Classification
00:44:30 Particle Classification Continued
00:45:03 Classification Charts
00:46:00 Comparison of Fines
00:47:10 The analysis of metal powder, using XRF.
00:49:24 The analysis of metal powder, using XRF
00:50:09 What is X-Ray Fluorescence (XRF)
00:51:02 The tube spectrum
00:52:07 Sample spectrum
00:52:44 Typical XRF Spectrometer types
00:54:39 Why use XRF?
00:55:35 Powder samples: how to analyse?
00:57:34 Powder samples: how to analyse?
00:58:30 Analysis according ASTM norms
00:58:45 Powder analysis of a metal powder: FeSi
00:59:50 Why this spread?
01:00:30 Particle size and metallurgical effects
01:01:18 Fused bead analysis of FeSi
01:02:01 Calibration: Fused beads vs pressed powder
01:02:48 Fused beads vs. pressed powder
01:04:02 Sample preparation summary
01:04:56 Fused bead reproducibility (Zetium 1kW)
01:06:45 Comparison of LLD’s in WD-XRF
01:07:24 But what about ED-XRF?
01:07:44 Calibrations on Epsilon 3 ED-XRF
01:08:18 Repeatability on pressed powder
01:08:51 ED-XRF, now fully capable of routine analysis
01:09:19 Recent developments
01:10:07 Conclusion
01:11:15 Using X-rays to see inside your powdered metal materials and processes
01:13:07 Overview
01:13:29 Introduction
01:15:00 What information can be derived from XRF/XRD?
01:16:35 X-ray diffraction (XRD)
01:17:29 X-ray diffraction (XRD)
01:20:12 Equipment
01:20:15 XRD systems
01:21:29 Application Examples
01:21:43 Phase analysis
01:23:44 Phase analysis – Rietveld full pattern analysis
01:25:28 Phase analysis – Ferrite-Martensite-Austenite-Cementite
01:26:13 Phase analysis – Ferrite-Martensite-Austenite-Cementite
01:27:13 Application Examples
01:27:23 Line profile analysis
01:28:42 Crystallite size & microstrain analysis
01:29:44 Crystallite size & microstrain analysis
01:30:30 Application Examples
01:30:38 AM Case Study 1
01:31:57 AM Case Study 1
01:33:16 AM Case Study 2
01:34:11 AM Case Study 2
01:35:43 Thank you for your attentionSend your questions
01:36:01 Questions and Thank You!

Up to one third of the production cost of an additive manufacturing component produced by powder bed processes (particularly metals) is the cost of the powder used, with commercial viability resting on establishing a robust supply chain and effective powder recycling strategies. More importantly, the chemical and physical properties of the powder directly impact the build process and final component quality and must be controlled and optimized to ensure process robustness and consistency. To achieve this, powder properties must be characterized at various stages in the supply chain, from new alloy development through to powder recycling. 

This online seminar, with a duration of 1h 45min, will provide an overview of four key analytical techniques that are commonly used to characterise additive manufacturing powders, including laser diffraction, automated image analysis, X-ray fluorescence and X-ray diffraction, and the benefits they offer.


Anne Virden Ph.D. 

Product Technical Specialist for Diffraction and Analytical Imaging. Anne joined Malvern in 2007 with a PhD in Physics from the University of York. She has since been supporting Malvern’s Mastersizer and Spraytec customers and has built up wide ranging experience of particle sizing in industries including paints and pigments, pharmaceuticals, mining and minerals, and is a particular expert in the measurement of spray systems. Anne has also recently taken on responsibility for Malvern’s Analytical Imaging systems.

Marco Sommariva

Marco Sommariva is currently Team Leader XRD in the Malvern Panalytical Application Competence Center, in Almelo, The Netherlands. He studied Material Science in Milan (Italy), with a thesis on synthesis and characterization of solid electrolytes for lithium batteries. Marco then moved on as a post-doc at the Rutherford Laboratory in the UK, working on a project about complex hydrides for hydrogen storage, before joining PANalytical in 2011 as application specialist XRD, in Almelo (the Netherlands).

Robert Taylor Ph.D. 

Having spent nearly 4 postgraduate years firing lasers at precious metals, Rob moved into developing electrochemical and spectroscopic applications in pharmaceutical development. The following 8 years was a journey in understanding physicochemical properties of drugs. Since joining Malvern Panalytical as an imaging Technical Specialist, Rob is now discovering the applications of particle size and shape in, not only pharmaceutical products, but also food and advanced materials.

Armand Jonkers

Armand Jonkers is currently senior application specialist XRF in the Malvern Panalytical Application Competence Center, in Almelo (the Netherlands). He studied analytical chemistry in Eindhoven, the Netherlands, where his thesis handled about the analysis of metals in organic solutions using Inductively Coupled Plasma (ICP). After he started working at Philips IE (now Malvern Panalytical), where he was active in Optical Emission techniques (ICP, Spark-OES, Arc-OES, GDL-OES). In 1992 he moved to the XRF department, where he is still active and specialized in thin-film and metal analysis. Besides that, he is responsible for OQ procedures for XRF.