In situ X-ray diffraction (XRD) is a well-established and commonly used tool to characterize the change of material properties caused by environmental change (temperature, pressure, gas atmosphere, et cetera). However, XRD has its limitations and sometimes other analytical techniques are required for better understanding of a sample behavior at non-ambient conditions. In this webinar a number of application examples featuring in situ small-angle X-ray scattering (SAXS) and total X-ray scattering (for pair distribution function analysis, PDF) experiments performed on Malvern Panalytical’s diffractometers will be discussed.
- Olga Narygina - application specialist XRD
Olga studied Physics at the Ural State University (Russia). After completing her master thesis on high-pressure high-temperature study of carbon nanotubes Olga moved to Bayerisches Geoinstitut, University of Bayreuth (Germany) to obtain her PhD degree working on high-pressure high-temperature research of Fe-containing silicates and alloys. This was followed by a post-doc position at the University of Edinburgh (The United Kingdom), where Olga carried on with the material property research at extreme pressure-temperature conditions with the focus on the structural properties of alkali metals. In 2011 Olga joined Malvern Panalytical as an application specialist XRD.