The preferred orientation of crystallites constituting polycrystalline solid materials such as metals, ceramics or composites significantly influences the intrinsic properties of the respective solid. In material sciences this preferred orientation is commonly known as texture and describes the orientation of all crystallites in a sample with respect to a reference frame defined by the sample orientation.
Using X-ray diffraction (XRD) the texture of a sample is usually measured using the approach developed by Schulz (1949) where the intensity of certain (hkl) reflections is measured as a function of the sample orientation. This is conventionally done by rotating (ϕ) and tilting the sample in axial plane (𝜒). Hence, point focus optics as well as an Eulerian cradle are required.
In contrast to the conventional Schulz-technique, in the ω-texture approach different sample tilts in the equatorial plane are accessed by applying a ω-offsett to the goniometer while keeping the sample horizontal and rotating it in ϕ (Fig. 1). Therefore ω-texture allows measurements of complete pole figures in line focus without the need for an Eulerian cradle and point focus optics.