X-ray Diffractometers

X-ray diffractometers are designed for obtaining the ultimate quality diffraction data, combined with ease of use and flexibility to quickly switch to different applications.

Our diffractometers are used in many environments, from universities and research institutes to industrial process control labs. Whatever your X-ray diffraction (XRD) need, we offer the right diffractometer, backed up by our worldwide sales and service organization.

Our multipurpose diffractometers are all equipped with PreFIX (pre-aligned, fast interchangeable X-ray) modules, making a change in the optical path effortless for the user. For this reason, we offer the most applications on a single diffractometer platform. Read more in our knowledge center about the many exciting XRD applications you can do with our range of diffractometers.

Contact sales Register now

	Aeris XRD made easy
	More details
Measurement	Crystal structure determination, Phase identification, Phase quantification
X-ray tube anode material	Cu /Co (option)
Technology	X-ray Diffraction (XRD)
	Empyrean range The multipurpose solution for your analytical needs
	More details
Measurement	Particle shape, Particle size, Crystal structure determination, Phase identification, Phase quantification, Contaminant detection and analysis, Epitaxy analysis, Interface roughness, 3D structure / imaging
Goniometer configuration	Vertical goniometer, Θ-Θ and ω-Θ
X-ray tube anode material	Cu, Co,Cr, Mn, Fe, Mo, Ag
Detector	PIXcel1D, PIXcel3D, PIXcel3D 2x2, GaliPIX3D, Proportional counter, Scintilation detector
Technology	X-ray Diffraction (XRD)
	X'Pert³ Powder The next generation cost-effective, multipurpose X-ray diffraction platform
	More details
Measurement	Surface area, Crystal structure determination, Phase identification, Phase quantification, Pore size distribution, Thin film metrology, Contaminant detection and analysis, Residual stress, Interface roughness, 3D structure / imaging
Wafer mapping	No
C-to-C wafer loader	No
Goniometer configuration	Vertical goniometer, Θ-Θ
Minimum step size	0.001º
Detector	PIXcel3D, Proportional counter, Scintilation detector
X-ray tube anode material	Cu, Co,Cr, Mn, Fe, Mo, Ag
Technology	X-ray Diffraction (XRD)
	X'Pert³ MRD XL Versatile materials research diffraction system
	More details
Measurement	Phase identification, Phase quantification, Thin film metrology, Residual stress, Epitaxy analysis, Interface roughness, Texture analysis, Reciprocal space analysis
Wafer mapping	200 mm
C-to-C wafer loader	Yes
Goniometer configuration	Horizontal goniometer, Θ-2Θ
Minimum step size	0.0001º
Detector	PIXcel1D, PIXcel3D, Proportional counter, Scintilation detector
X-ray tube anode material	Cu, Co,Cr, Mn, Fe, Mo
Technology	X-ray Diffraction (XRD)
	CubiX³ Range One solution for multiple industrial applications
	More details
Measurement	Crystal structure determination, Phase identification, Phase quantification, Contaminant detection and analysis
X-ray tube anode material	Cu / Co, Cr, Fe, Mn (option)
Detector	Proportional Counter / PIXcel1D
Goniometer configuration	Vertical goniometer, Θ-Θ
Technology	X-ray Diffraction (XRD)

	Aeris XRD made easy	Empyrean range The multipurpose solution for your analytical needs	X'Pert³ Powder The next generation cost-effective, multipurpose X-ray diffraction platform	X'Pert³ MRD XL Versatile materials research diffraction system	CubiX³ Range One solution for multiple industrial applications
	More details	More details	More details	More details	More details
Measurement	Crystal structure determination, Phase identification, Phase quantification	Particle shape, Particle size, Crystal structure determination, Phase identification, Phase quantification, Contaminant detection and analysis, Epitaxy analysis, Interface roughness, 3D structure / imaging	Surface area, Crystal structure determination, Phase identification, Phase quantification, Pore size distribution, Thin film metrology, Contaminant detection and analysis, Residual stress, Interface roughness, 3D structure / imaging	Phase identification, Phase quantification, Thin film metrology, Residual stress, Epitaxy analysis, Interface roughness, Texture analysis, Reciprocal space analysis	Crystal structure determination, Phase identification, Phase quantification, Contaminant detection and analysis
X-ray tube anode material	Cu /Co (option)	Cu, Co,Cr, Mn, Fe, Mo, Ag	Cu, Co,Cr, Mn, Fe, Mo, Ag	Cu, Co,Cr, Mn, Fe, Mo	Cu / Co, Cr, Fe, Mn (option)
Goniometer configuration		Vertical goniometer, Θ-Θ and ω-Θ	Vertical goniometer, Θ-Θ	Horizontal goniometer, Θ-2Θ	Vertical goniometer, Θ-Θ
Detector		PIXcel1D, PIXcel3D, PIXcel3D 2x2, GaliPIX3D, Proportional counter, Scintilation detector	PIXcel3D, Proportional counter, Scintilation detector	PIXcel1D, PIXcel3D, Proportional counter, Scintilation detector	Proportional Counter / PIXcel1D
Wafer mapping			No	200 mm
C-to-C wafer loader			No	Yes
Minimum step size			0.001º	0.0001º
Technology	X-ray Diffraction (XRD)	X-ray Diffraction (XRD)	X-ray Diffraction (XRD)	X-ray Diffraction (XRD)	X-ray Diffraction (XRD)