Parsum Probes use Spatial Filter Velocimetry to deliver in situ, real-time size and velocity measurements for solid particles suspended in a pneumatic or gravity flow gas stream. Robust, dustproof and waterproof they measure particles in the size range 50-6000 µm with velocities from 0.01-50 m/s and are suitable for any industrial environment.
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- Aeris
- Archimedes
- ASD range
- Axios FAST
- Claisse range
- CNA range
- CubiX3 range
- Empyrean range
- Epsilon range
- Insitec range
- Kinexus range
- Mastersizer range
- MicroCal range
- Morphologi range
- NanoSight range
- OMNISEC
- Parsum range
- Rosand range
- Spraytec
- Viscosizer TD
- Viscotek range
- X'Pert³ range
- Zetasizer range
- Zetium
- 2830 ZT
- Automation solutions
- Calibration standards
- CNA cross-belt analyzers
- Consumables
- Image analyzers
- Liquid chromatography
- Near-infrared spectrometers (NIR)
- Particle size analyzers
- Rheometers
- Sample preparation instruments
- Software for XRF and XRD applications
- Spectroradiometers
- X-ray components
- X-ray diffractometers (XRD)
- X-ray fluorescence spectrometers (XRF)
- X-ray metrology
- X-ray scattering platform
- X-ray tubes
- 3D structure / imaging
- Binding affinity
- Chemical identification
- Contaminant detection and analysis
- Crystal structure determination
- Elemental analysis
- Elemental quantification
- Epitaxy analysis
- Ground truthing
- Interface roughness
- Label-free analysis
- Microrheology
- Moisture content
- Molecular size
- Molecular structure
- Molecular weight
- Particle concentration
- Particle shape
- Particle size
- Phase identification
- Phase quantification
- Protein mobility
- Reciprocal space analysis
- Remote sensing
- Residual stress analysis
- Rheology
- Texture analysis
- Thin film metrology
- Viscosity
- Zeta potential
- Borate fusion
- Gel Permeation Chromatography (GPC)
- Image analysis
- Light scattering
- Microcalorimetry
- Nanoparticle Tracking Analysis (NTA)
- Near-infrared (NIR) spectroscopy
- Pulsed Fast Thermal Neutron Activation (PFTNA)
- Resonant Mass Measurement (RMM)
- Rheometry
- Size Exclusion Chromatography (SEC)
- Spatial filter velocimetry
- Taylor Dispersion Analysis (TDA)
- X-ray diffraction (XRD)
- X-ray fluorescence (XRF)
- X-ray imaging
- X-ray scattering
- Aeris
- Archimedes
- ASD range
- Axios FAST
- Claisse range
- CNA range
- CubiX3 range
- Empyrean range
- Epsilon range
- Insitec range
- Kinexus range
- Mastersizer range
- MicroCal range
- Morphologi range
- NanoSight range
- OMNISEC
- Parsum range
- Rosand range
- Spraytec
- Viscosizer TD
- Viscotek range
- X'Pert³ range
- Zetasizer range
- Zetium
- 2830 ZT
- Automation solutions
- Calibration standards
- CNA cross-belt analyzers
- Consumables
- Image analyzers
- Liquid chromatography
- Near-infrared spectrometers (NIR)
- Particle size analyzers
- Rheometers
- Sample preparation instruments
- Software for XRF and XRD applications
- Spectroradiometers
- X-ray components
- X-ray diffractometers (XRD)
- X-ray fluorescence spectrometers (XRF)
- X-ray metrology
- X-ray scattering platform
- X-ray tubes
- 3D structure / imaging
- Binding affinity
- Chemical identification
- Contaminant detection and analysis
- Crystal structure determination
- Elemental analysis
- Elemental quantification
- Epitaxy analysis
- Ground truthing
- Interface roughness
- Label-free analysis
- Microrheology
- Moisture content
- Molecular size
- Molecular structure
- Molecular weight
- Particle concentration
- Particle shape
- Particle size
- Phase identification
- Phase quantification
- Protein mobility
- Reciprocal space analysis
- Remote sensing
- Residual stress analysis
- Rheology
- Texture analysis
- Thin film metrology
- Viscosity
- Zeta potential
- Borate fusion
- Gel Permeation Chromatography (GPC)
- Image analysis
- Light scattering
- Microcalorimetry
- Nanoparticle Tracking Analysis (NTA)
- Near-infrared (NIR) spectroscopy
- Pulsed Fast Thermal Neutron Activation (PFTNA)
- Resonant Mass Measurement (RMM)
- Rheometry
- Size Exclusion Chromatography (SEC)
- Spatial filter velocimetry
- Taylor Dispersion Analysis (TDA)
- X-ray diffraction (XRD)
- X-ray fluorescence (XRF)
- X-ray imaging
- X-ray scattering
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