記録された日時: November 19 2013
Grazing incidence small-angle X-ray scattering (GISAXS) is a surface sensitive method for investigating nanostructure in thin films. GISAXS data provide information about nanostructure dimensions, distributions and structural ordering in thin films.
GISAXS was once considered a method exclusive to synchrotron beam lines, and made its way towards dedicated laboratory instruments. Now the Medipix2 detector with photon-counting technology enables PANalytical’s PIXcel3D area detectors to collect noise-free images, making good use of lab source intensities to obtain high quality images on the Empyrean multi-purpose diffractometer.
In this webinar there will be an introduction to GISAXS technique together with few application examples.