Compound semiconductor functionality is all about the layer structure. But unlike a cake, it’s rare that you wish to slice up your wafer to see what is going on inside.
Fortunately, though, in this instance you can turn to metrology technologies, such as X-ray diffractometry (XRD), to generate accurate and precise structural metrology in a non-destructive manner. Here, advanced capabilities beyond the rocking curves are becoming ever more important for the production of epitaxial wafers.
Production of compound semiconductor wafers continues to rise, as our society seeks to unlock the potential of these materials that offer significant sustainability benefits. If you are a regular reader of this magazine, you will know all too well about the energy savings that come from the widespread deployment of compound semiconductors in LEDs or power converters. Increasing manufacturing excellence of compound semiconductors lowers cost so that these chips can feature in even more electronic products shipped and sold around the globe.
The epitaxial growth these devices is monitored by XRD techniques – but what does the maturation of the compound semiconductor industry mean for analytical XRD instruments and those who use them?