Epsilon 4 Polymers plastics and paints
Increase your polymer product consistency
Your customers demand superior consistency of your polymer performance and consumer safety regardless of production location. The Epsilon 4, an energy dispersive X-ray fluorescence (EDXRF) benchtop spectrometer, provides elemental analysis with superior repeatability and accuracy, satisfying your customer’s consistency demands.
Ease-to-use measurement procedures and limited utility requirements enables reproducible analysis close to production lines and across multiple production sites. The Epsilon 4 delivers reliable results for months without recalibration. Guaranteeing your product quality was never easier.
Overview
Focus on product quality and consistency
Illustrated below are places in the polymer production process where Epsilon 4 offers its added value to its users.
Features
The power of benchtop XRF
Combining the latest excitation and detection technologies and smart design, the analytical performance of Epsilon 4 approaches that of more powerful and floor-standing spectrometers. Selective excitation and careful matching of the X-ray tube output to the capabilities of the detection system underlie the system’s outstanding performance.
Unique polymer application solutions
Fast and sensitive
Unique detector electronics enable a linear count rate capacity to over 1,500,000 cps (at 50% dead time) and a count rate independent resolution typically better than 135 eV for better separation of analytical lines in the spectrum. This allows the Epsilon 4 spectrometer to run at full power and therefore realizes a much higher sample throughput compared to traditional EDXRF benchtop instruments.e
Low running costs
Epsilon 4 does not require the use of expensive acids, gasses and fume hoods, like in ICP and AAS. The only requirement is mains electricity and in some cases the use of helium to boost the sensitivity for light elements in the sample. Also, the individual components in XRF spectrometers are not exposed to friction or heat and therefore last for many years.
Non-destructive analysis
Measurements with Epsilon 4 are carried out directly on loose powders or end products, with little to no sample preparation. Since XRF is a non-destructive technique, the sample can also be measured subsequently by other analytical techniques, if required.
Specification
| Sample handling | X-ray tube | Detector | Software |
|---|---|---|---|
| 10-position removable sample changer | Metal-ceramic side window for maximum stability | High-resolution silicon drift detector (SDD), typically 135 eV @ Mn-Kα | Elemental screening with Omnian standardless analysis solution |
| Spectrometer can accommodate samples (loose powders, liquids, slurries and solids) up to 52 mm in diameter | 50 micrometers thin beryllium window for high sensitivity for light elements (Na, Mg, Al, Si) | Max. count rate of 1,500,000 counts/s at 50% dead time | PASS/FAIL analysis with FingerPrint solution |
| Spinner is included for more accurate results of liquids, slurries and powders | Ag anode X-ray tube for best performance of P, S and Cl analysis | Thin-entrance detector window for high sensitivity | Audit trail software option for enhanced data security in compliance with FDA 21 CFR Part 11 |
Accessories
Standards (Reference materials)
ADPOL
Accurate elemental analysis by XRF of functional polymer additivesRoHS
Accurate elemental analysis of RoHS restricted materialsTOXEL
Accurate analysis by XRF of toxic elements in polymers and plasticsCRMs
Claisse is always there to meet your needs!Software
Epsilon software
Epsilon software is the XRF analysis software platform that is used with PANalytical’s range of Epsilon 1 and Epsilon 4 benchtop EDXRF systems.
Omnian
Omnian software enables users to achieve the best possible analysis when dedicated methods or certified standards do not exist.
Stratos
The software provides a rapid, simple and non-destructive means of analyzing coatings, surface layers and multi-layered structures.Enhanced Data Security
Securing your data and satisfying regulators.FingerPrint
A FingerPrint software module combined with an Epsilon EDXRF system is ideal for material testing when analysis speed is important but the actual composition is not of interest.
Support
Services
Solutions to maximize the return on your investment
To assure that your instrument remains in top condition and performs on the highest level, Malvern Panalytical offers a wide range of services. Our expertise and support services assure an optimal functioning of your instrument.
Support
Service for a lifetime
- Phone and remote support
- Preventive maintenance and checkups
- Flexible Customer Care Agreements
- Performance certificates
- Hardware and software upgrades
- Local and global support
Expertise
Adding value to your processes
- Sample preparation development/optimization
- Analytical methodologies
- Turnkey solutions for XRD
- Operations via IQ/OQ/PQ, quality assurance (GLP, ISO17025) or round robins/inter laboratory studies
- Automation of lab processes
- Consultancy services
Training and education
- Training on-site or at our competence centers
- Broad range of basic and advanced courses on products, applications and software
Analytical services and calibration materials
- Expert (XRF) analyses services
- Oxides and trace analysis
- Customized calibration materials
Key applications
Epsilon 4 spectrometers can handle a large variety of sample types weighing from a few milligrams to larger bulk samples.
Samples can be measured as:
- Solids
- Pressed powders
- Loose powders
- Liquids
- Fused beads
- Slurries
- Granules
- Filters
- Films and coatings