Epsilon 4 Polymers plastics and paints

Increase your polymer product consistency

Your customers demand superior consistency of your polymer performance and consumer safety regardless of production location. The Epsilon 4, an energy dispersive X-ray fluorescence (EDXRF) benchtop spectrometer, provides elemental analysis with superior repeatability and accuracy, satisfying your customer’s consistency demands. 

Ease-to-use measurement procedures and limited utility requirements enables reproducible analysis close to production lines and across multiple production sites. The Epsilon 4 delivers reliable results for months without recalibration. Guaranteeing your product quality was never easier.

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Focus on product quality and consistency

The Epsilon 4 offers directly its value to producer of polymers, plastics and paints. Enable full traceability by fast and direct analysis throughout and close to production processes. Validate the quality of incoming raw materials and analyse the presence of additives, catalyst residues and toxic elements in final products. Malvern Panalytical unique calibration solutions ADPOL, TOXEL and RoHS supports its users to realize consumer safety and a consistent and high-end product quality and performance.

Illustrated below are places in the polymer production process where Epsilon 4 offers its added value to its users.



The power of benchtop XRF

Combining the latest excitation and detection technologies and smart design, the analytical performance of Epsilon 4 approaches that of more powerful and floor-standing spectrometers. Selective excitation and careful matching of the X-ray tube output to the capabilities of the detection system underlie the system’s outstanding performance.

The power of benchtop XRF

Unique polymer application solutions

Access to the right calibration samples is key in XRF. For the plastic & polymer industry we developed unique calibration solutions to accurately analyse for additives and catalyst residues (ADPOL), toxic elements (TOXEL) and to ensure RoHS compliancy (RoHS) in accordance with ASTM F2617 and IEC 62321-3-1.
Unique polymer application solutions

Fast and sensitive

Fast measurements are achieved by using the latest silicon drift detector technology that produces significantly higher intensities. 
Unique detector electronics enable a linear count rate capacity to over 1,500,000 cps (at 50% dead time) and a count rate independent resolution typically better than 135 eV for better separation of analytical lines in the spectrum. This allows the Epsilon 4 spectrometer to run at full power and therefore realizes a much higher sample throughput compared to traditional EDXRF benchtop instruments.e
Fast and sensitive

Low running costs

Epsilon 4 does not require the use of expensive acids, gasses and fume hoods, like in ICP and AAS. The only requirement is mains electricity and in some cases the use of helium to boost the sensitivity for light elements in the sample. Also, the individual components in XRF spectrometers are not exposed to friction or heat and therefore last for many years.

Low running costs

Non-destructive analysis

Measurements with Epsilon 4 are carried out directly on loose powders or end products, with little to no sample preparation. Since XRF is a non-destructive technique, the sample can also be measured subsequently by other analytical techniques, if required.

Non-destructive analysis


Sample handling X-ray tube Detector Software
10-position removable sample changer Metal-ceramic side window for maximum stability High-resolution silicon drift detector (SDD), typically 135 eV @ Mn-Kα Elemental screening with Omnian standardless analysis solution
Spectrometer can accommodate samples (loose powders, liquids, slurries and solids) up to 52 mm in diameter 50 micrometers thin beryllium window for high sensitivity for light elements (Na, Mg, Al, Si) Max. count rate of 1,500,000 counts/s at 50% dead time PASS/FAIL analysis with FingerPrint solution
Spinner is included for more accurate results of liquids, slurries and powders Ag anode X-ray tube for best performance of P, S and Cl analysis Thin-entrance detector window for high sensitivity Audit trail software option for enhanced data security in compliance with FDA 21 CFR Part 11


Standards (Reference materials)


Accurate elemental analysis by XRF of functional polymer additives


Accurate elemental analysis of RoHS restricted materials


Accurate analysis by XRF of toxic elements in polymers and plastics


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Epsilon software

Epsilon software is the XRF analysis software platform that is used with PANalytical’s range of Epsilon 1 and Epsilon 4 benchtop EDXRF systems.

Epsilon software


Omnian software enables users to achieve the best possible analysis when dedicated methods or certified standards do not exist.



The software provides a rapid, simple and non-destructive means of analyzing coatings, surface layers and multi-layered structures.


A FingerPrint software module combined with an Epsilon EDXRF system is ideal for material testing when analysis speed is important but the actual composition is not of interest.




Solutions to maximize the return on your investment

To assure that your instrument remains in top condition and performs on the highest level, Malvern Panalytical offers a wide range of services. Our expertise and support services assure an optimal functioning of your instrument.


Service for a lifetime

  • Phone and remote support
  • Preventive maintenance and checkups
  • Flexible Customer Care Agreements
  • Performance certificates
  • Hardware and software upgrades
  • Local and global support


Adding value to your processes 

  • Sample preparation development/optimization
  • Analytical methodologies 
  • Turnkey solutions for XRD 
  • Operations via IQ/OQ/PQ, quality assurance (GLP, ISO17025) or round robins/inter laboratory studies
  • Automation of lab processes
  • Consultancy services

Training and education

  • Training on-site or at our competence centers
  • Broad range of basic and advanced courses on products, applications and software

Analytical services and calibration materials

  • Expert (XRF) analyses services
  • Oxides and trace analysis
  • Customized calibration materials

Key applications

Epsilon 4 spectrometers can handle a large variety of sample types weighing from a few milligrams to larger bulk samples.

Samples can be measured as:

  • Solids
  • Pressed powders
  • Loose powders
  • Liquids
  • Fused beads
  • Slurries
  • Granules
  • Filters
  • Films and coatings