記録された日時: October 29 2020
(This webinar will be conducted in Mandarin)
In materials research, the scientist has many analytical questions related to the crystalline constitution of material samples. X-ray diffraction (XRD) is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness. Materials researchers therefore use XRD to analyze a wide range of materials, from powder X-ray diffraction (XRPD) to solids, thin films and nanomaterials.
Interested to improve your materials characterization analysis and interpretation? Join our series of XRD webinars which are focused on helping you achieve better XRD data. This requires users to be aware about proper sampling, sample preparation, XRD instrument set up and configuration based on the type of sample you wish to analyse. Data collection is just the first step. Refining the data and making sense of its implications is crucial towards decisions regarding your R and D.
During this webinar, Dr Plex Lee, Malvern Panalytical's application specialist will be providing an introduction to the XRD technique. Use this session to equip yourself with a good foundation of XRD, from the theory of Braggs law through to the physics of the X-ray diffractometer.
在這次線上研討會中，Malvern Panalytical的資深應用專家Plex Lee博士將為您介紹XRD技術，從布拉格定律的基礎理論到X光繞射的實驗原理，本課程都能為您在XRD應用上奠定良好的基礎。