Malvern Panalytical has a range of unique, market leading, products that are protected by the following patent and patent applications

Mastersizer

Patent NumbersPatent TitleInstruments
EP1167946B1 (GB, FR, DE60135521D1)Sample handling systemHydro MV, Hydro LV, Hydro EV
GB2364774B
US6800251B2
Sample handling system for use in a particle characterisation apparatusHydro MV, Hydro LV
GB2494735BApparatus for measuring particle-size distribution by light scatteringMS3000, MS3000E
CN104067105B
EP2756283B1 (GB, FR, DE602012015707.0)
US9869625B2
JP6154812B
Apparatus and method for measuring particle-size distribution by light scatteringMS3000, MS3000E
US10837889B2
GB2494734B
Apparatus and method for measuring particle-size distribution by light scatteringMS3000, MS3000E

Zetasizer

Patent NumbersPatent TitleInstruments
US7217350B2
Mobility and Effects Arising from Surface ChargeZetasizer Advance Range, Nano ZS, Nano Z, Nano ZS90, Nano ZSP, Helix
EP2467701A1
CN102575984B
US9279765B2
JP5669843B2
US10317339B2
US20200096443A1
Dynamic Light Scattering Based Microrheology of Complex Fluids with Improved Single-Scattering Mode DetectionZetasizer Advance Range, Nano ZSP, Helix
CN103608671B
CN105891304B
EP2721399B1 (BE, CH+LI, DK, FR, GB, NL, DE602012031338.2, IT502017000050268)
JP06023184B2
US9829525B2
US10274528B2
US20200072888A1
Surface Charge MeasurementZeta Plate Cell Accessory
US8702942B2
CN103339500B
EP2652490B1 (GB, FR, DE602011046775.1)
JP06006231B2
JP06453285B2
US10648945B2
Laser Doppler Electrophoresis Using a Diffusion BarrierZetasizer Advance Range, Nano ZS, Nano S, Nano ZS90, S90, Nano ZSP
EP2742337B1 (GB, FR, DE602012018122.2)
US9816922B2
Dual mode characterization of particulatesZetasizer Helix
US10197485B2
US10520412B2
US10845287B2
EP3353527A1
JP2018535429A
CN108291861A
Particle characterizationZetasizer Advance range
US10119910B2Particle characterization instrumentZetasizer Advance: Ultra and Pro
US8675197B2
JP6059872B2
EP2404157B1
Particle characterizationZetasizer Advance accessory
EP3521806A1
US20210063295A1
CN111684261A
WO2019154882A1
Multi-angle dynamic light scatteringZetasizer Advance: Ultra

Insitec

Patent NumbersPatent TitleInstruments
US7418881B2
EP1592957B1 (GB)
Dilution system and methodInsitec (some products)
US7871194B2
EP1869429A2
Dilution system and methodInsitec (some products)
EP2640499B1 (GB)In-line disperser and powder mixing methodInsitec dry

Morphologi

Patent NumbersPatent TitleInstruments
EP2106536B1 (GB, FR, DE602008039489.1)
US8111395B2
US8564774B2
Spectrometric Investigation of hetrogeneityMorphologi G3-ID
GB2522735B
JP6560849B2
Method and Apparatus for Powder DispersionMorphologi G3-ID, Morphologi G3

Viscosizer

Patent NumbersPatent TitleInstruments
US2018067901A1
JP2018511129A
EP3274864A1
CN107430593A
Multi-Component Model ParameterisationViscosizer TD

Hydro Sight

Patent NumbersPatent TitleInstruments
US8456633B2Spectrometric Process MonitoringHydro Sight
CN104704343B
EP2864760A2
US10509976B2
Heterogeneous Fluid Sample CharacterisationHydro Sight

NanoSight

Patent NumbersPatent TitleInstruments
US7751053B2
JP04002577B2
EP1499871B1 (FR, DE60335872.1)
GB2388189B
US7399600B2
Optical Detection for Analysis of ParticlesNanoSight NS300
NanoSight NS500
NanoSight LM10
EP3071944B1 (GB, FR, DE602014059002.0)
US9909970B2
JP6505101B2
CN105765364A
Improvements in or relating to calibration of instrumentsNanoSight NS300

MicroCal ITC

Patent NumbersPatent TitleInstruments
CN101855541B
EP2208057A1
JP05542678B2
US8449175C1
US8827549C1
Isothermal Titration Microcalorimeter apparatus and method of useMicroCal ITC Range
CN102232184B
EP2352993B1 (CH+LI, GB, FR, DE602009044685.1)
JP5476394B2
US9103782B2
US9404876B2
US10036715B2
US10254239B2
EP3144666B1 (CH+LI, GB, FR, DE602009059932.1)
US20200025698A1
EP3647776A1
Automatic Isothermal Titration Microcalorimeter Apparatus and method of UseMicroCal ITC Range

MicroCal DSC

Patent NumbersPatent TitleInstruments
US8635045B2
CN103221808B
EP2646811A1
IN336472
JP5925798B2
Method for Automatic Peak Finding in Calorimetric DataMicroCal DSC Range

OMNISEC

Patent NumbersPatent TitleInstruments
US9759644B2
US10551291B2
Balanced Capillary Bridge ViscometerOMNISEC
US9612183B2
EP2619543B1 (GB, FR, DE602011011174.4)
JP05916734B2
CN103168223B
IN341558
Modular Capillary Bridge ViscometerOMNISEC

Floor standing XRF

Patent NumbersPatent TitleInstruments
US8210000B2
JP5554163B2
CN101941789B
EP2270410B1 (GB, FR, NL, DE602009003389.1)
Bead furnaceZetium
Axios FAST
Epsilon5
US6823043B2Determination of material parameters
Zetium*
Axios FAST*
2830 ZT (wafer analyser)*
Epsilon5*
SEMYOS*
US7949092B2
Device and method for performing X-ray analysis
Zetium*
Axios FAST*
2830 ZT (wafer analyser)*
Epsilon5*
SEMYOS
US6574305B2
Device and method for the inspection of the condition of a sampleZetium*
Axios FAST*
2830 ZT (wafer analyser)*
Epsilon5*
SEMYOS*
JP4111336B2Device for testing the sample with X-ray
Epsilon5

US7042978B2Examination of material samplesZetium*
Axios FAST*
Epsilon5
SEMYOS*
JP5782451B2
EP2510397B1 (GB, FR, NL, DE602010021859.7)
Method for manufacturing a multilayer structure with a lateral pattern for application in the xuv wavelength range, and bf and Imag structures manufactured according to this methodZetium*
Axios FAST
2830 ZT (wafer analyser)*
Epsilon5*
SEMYOS*
US9658352B2
CN104833557B
JP656263B2
JP6804594B2
Method of making a standardZetium
Axios FAST
EP2787342B1 (GB, FR, NL, DE602013028642.6)
JP6360151B2
Preparation of sample-pellets by pressingZetium
Axios FAST
US10107551B2
EP2966039B1 (GB, FR, NL, DE602014024004.2)
JP6559486B2
CN105258987B
Preparation of samples for XRF using flux and platinum crucibleZetium
Axios FAST
US9784699B2
JP6861469B2
CN105937890B
EP3064931B1 (GB, FR, NL, CH, DE)
Quantitative X-ray Analysis - Matrix thickness correctionZetium*
Axios FAST
US9739730B2
JP6706932B2
CN105938113B
EP3064933B1 (GB, FR, NL, CH, DE)
Quantitative X-ray Analysis - Multi optical path instrumentZetium*
Axios FAST
US9851313B2
JP6762734B2
CN105938112B 
EP3064932B1 (GB, FR, NL, CH+LI, DE602016024126.9)
Quantitative X-ray Analysis - Ratio correctionZetium*
Axios FAST
JP3936912B2Sample container with floating cover for x-ray analysis of liquidsZetium
Axios FAST
2830 ZT (wafer analyser)
Epsilon5
SEMYOS
US9239305B2Sample holderZetium*
Axios FAST*
Epsilon5
US7978820B2
X-ray diffraction and fluorescenceZetium
Axios FAST*
2830 ZT (wafer analyser)*
Epsilon5*
SEMYOS*
US7720192B2
JP5574575B2
CN101311708B
X-ray fluorescence apparatusZetium*
Axios FAST*
2830 ZT (wafer analyser)*
Epsilon5*
SEMYOS*
US7194067B2
X-ray optical systemZetium
Axios FAST*
2830 ZT (wafer analyser)*
Epsilon5*
SEMYOS*
US8223923B2
JP5266310B2
CN101720491B
EP1983547B1 (GB, FR, NL, DE602008000361D1)
X-ray source with metal wire cathodeZetium
Axios FAST
2830 ZT (wafer analyser)
Epsilon5
SEMYOS
US9911569B2
JP2016131150A
CN105810541B
EP3043371B2 (GB, FR, NL, DE602015012421.9)
X-ray Tube Anode Arrangement
Zetium
Axios FAST
2830 ZT (wafer analyser)
Epsilon5
SEMYOS
US10281414B2
EP3330701B1 (CH+LI, GB, FR, NL, DE602017006751.2)
EP3480587A1
US10393683B2
JP6767961B2
CN108132267A
Conical collimator for X-ray measurementsZetium*
*· Optional / not standard in product

Benchtops XRF

Patent NumbersPatent TitleInstruments
US8210000B2
JP5554163B2
CN101941789B
EP2270410B1 (GB, FR, NL, DE602009003389.1)
Bead furnaceEpsilon 1 range
Epsilon 3X spectrometers
Epsilon 4 Air Quality edition
US6823043B2Determination of material parameters
Epsilon 1 range*
Epsilon 3X spectrometers*
Epsilon 4 Air Quality edition*
US7949092B2
Device and method for performing X-ray analysis
Epsilon 1 range*
Epsilon 3X spectrometers*
Epsilon 4 Air Quality edition*
US6574305B2
Device and method for the inspection of the condition of a sampleEpsilon 1 range*
Epsilon 3X spectrometers*
Epsilon 4 Air Quality edition*
US7042978B2Examination of material samplesEpsilon 1 range*
Epsilon 3X spectrometers*
Epsilon 4 Air Quality edition*
US9658352B2
CN104833557B 
JP6562635B2
JP6804594B2
Method of making a standardEpsilon 1 range
Epsilon 3X spectrometers
Epsilon 4 Air Quality edition
EP2787342B1 (GB, FR, NL, DE602013028642.6)
JP6360151B2
Preparation of sample-pellets by pressingEpsilon 1 range
Epsilon 3X spectrometers
Epsilon 4 Air Quality edition
US10107551B2
JP6559486B2
CN105258987B 
EP2966039B1 (GB, FR, NL, DE602014024004.2)
Preparation of samples for XRF using flux and platinum crucibleEpsilon 1 range
Epsilon 3X spectrometers
Epsilon 4 Air Quality edition
US9784699B2
JP6861469B2
CN105937890B
EP3064931B1 (GB, FR, NL, CH, DE)
Quantitative X-ray Analysis - Matrix thickness correctionEpsilon 1 range*
Epsilon 3X spectrometers*
Epsilon 4 Air Quality edition*
US9739730B2
JP6706932B2
CN105938113B 
EP3064933B1 (GB, FR, NL, CH, DE602016056347.9)
Quantitative X-ray Analysis - Multi optical path instrumentEpsilon 1 range*
Epsilon 3X spectrometers*
Epsilon 4 Air Quality edition*
US9851313B2
JP6762734B2
CN105938112B 
EP3064932B1 (GB, FR, NL, CH+LI, DE602016024126.9)
Quantitative X-ray Analysis - Ratio correctionEpsilon 1 range*
Epsilon 3X spectrometers*
Epsilon 4 Air Quality edition*
JP3936912B2Sample container with floating cover for x-ray analysis of liquidsEpsilon 1 range
Epsilon 3X spectrometers
Epsilon 4 Air Quality edition
US9239305B2Sample holderEpsilon 1 range*
Epsilon 3X spectrometers*
Epsilon 4 Air Quality edition*
US9547094B2
CN104849295B
EP2908127B1 (CH+LI, GB, FR, NL, DE602014011398.2)
JP6526983B2
X-ray analysis apparatus
Epsilon 1 range
Epsilon 3X spectrometers
Epsilon 4 Air Quality edition
US7978820B2
X-ray diffraction and fluorescenceEpsilon 1 range*
Epsilon 3X spectrometers*
Epsilon 4 Air Quality edition*
US7194067B2
X-ray optical systemEpsilon 1 range*
Epsilon 3X spectrometers*
Epsilon 4 Air Quality edition*
US8223923B2
JP5266310B2
CN101720491B
EP1983547B1 (GB, FR, NL, DE602008000361D1)
X-ray source with metal wire cathodeEpsilon 1 range*
Epsilon 3X spectrometers*
Epsilon 4 Air Quality edition*
US9911569B2
JP2016131150A
CN105810541B
EP3043371B2 (GB, FR, NL, DE602015012421.9)
X-ray Tube Anode Arrangement
Epsilon 1 range*
Epsilon 3X spectrometers*
Epsilon 4 Air Quality edition*
* Optional / not standard in product

Floor standing XRD

Patent NumbersPatent TitleInstruments
US6815684B2
Analytical X-ray apparatus provided with a solid state position sensitive X-ray detectorEmpyrean
X'Pert³ Powder
X'Pert³ MRD (XL)
CubiX³ range
US6823043B2Determination of material parameters
Empyrean*
X'Pert³ Powder*
X'Pert³ MRD (XL)*
CubiX³ range*
US6574305B2
Device and method for the inspection of the condition of a sampleEmpyrean*
X'Pert³ Powder*
X'Pert³ MRD (XL)*
CubiX³ range*
US9506880B2
CN104251870B
EP2818851A1
JP6403452B2
Diffraction imagingEmpyrean*
X'Pert³ Powder*
X'Pert³ MRD (XL)*
CubiX³ range*
US7116754B2DiffractometerEmpyrean*
X'Pert³ Powder*
X'Pert³ MRD (XL)*
CubiX³ range*
US8488740B2
JP6009156B2
CN102565108B
EP2455747B1 (GB, FR, NL, DE602011022779.3)
Diffractometer
Empyrean*
X'Pert³ Powder*
X'Pert³ MRD (XL)*
CubiX³ range*
US7858945B2
JP5254066B2
CN101521246B
EP2088451B1 (GB, FR, NL, DE602008041760.3)
Imaging DetectorEmpyrean*
X'Pert³ Powder*
X'Pert³ MRD (XL)*
CubiX³ range*
EP2088625B1 (GB, FR, NL, CH + LI, DE602009040563.2)Imaging detectorEmpyrean*
X'Pert³ Powder*
X'Pert³ MRD (XL)*
CubiX³ range*
US9110003B2
CN103383363B
EP2634566B1 (GB, FR, NL, DE602012058202.2)
JP6198406B2
Microdiffraction
Empyrean
X'Pert³ Powder
X'Pert³ MRD (XL)
CubiX³ range
US6704390B2
X-ray analysis apparatus provided with a multilayer mirror and an exit collimatorEmpyrean*
X'Pert³ Powder*
X'Pert³ MRD (XL)*
CubiX³ range*
US9640292B2
CN104777179B
EP2896960B1 (GB, FR, NL, DE602014012155.1)
JP6564683B2
X-ray apparatus
Empyrean
X'Pert³ Powder
CubiX³ range
US7756248B2
JP5145263B2
CN101545873B
EP2090883B1 (GB, FR, NL, DE602008002143D1)
X-ray detection in packaging
Empyrean
X'Pert³ Powder
X'Pert³ MRD (XL)
US8477904B2
JP5752434B2
CN102253065B
EP2365319B1 (GB, FR, NL, DE602011055847.1)
X-ray diffraction and computed tomographyEmpyrean
X'Pert³ Powder*
X'Pert³ MRD (XL)*
CubiX³ range*
US7542547B2
JP5280057B2
CN101256160B
EP1947448B1 (CH+LI, GB, FR, NL, DE602007031351.1)
X-ray diffraction equipment for X-ray scattering
X'Pert³ Powder*
X'Pert³ MRD (XL)*
EP1287342B1 (GB, FR, DE60147121.0)X-ray diffractometerEmpyrean*
X'Pert³ Powder*
X'Pert³ MRD (XL)*
CubiX³ range*
US7477724B2
EP1703276B1 (GB, FR, NL, DE602005033962.0)
X-ray instrumentEmpyrean*
X'Pert³ Powder*
X'Pert³ MRD (XL)*
CubiX³ range
US7194067B2
X-ray optical systemEmpyrean*
X'Pert³ Powder*
X'Pert³ MRD (XL)*
CubiX³ range*
US8437451B2
JP5999901B2
CN102610290B
EP2477191B1 (CH+LI, GB, FR, NL, DE602011035906.1)
X-ray shutter arrangementEmpyrean
X'Pert³ Powder
X'Pert³ MRD (XL)
CubiX³ range
US9911569B2
JP2016131150A
CN105810541B
EP3043371B1 (GB, FR, NL, DE602015012421.9)
X-ray Tube Anode Arrangement
Empyrean*
X'Pert³ Powder*
X'Pert³ MRD (XL)*
CubiX³ range*
EP3553508A2
US20190317030A1
JP2019184609A
CN110389142A
X-ray analysis apparatus and methodEmpyrean*
US10359376B2
EP3273229A1
JP6701133B2
CN107643308A
Sample holder for X-ray analysisEmpyrean*
* Optional / not standard in product

QualitySpec 7000

Patent NumbersPatent TitleInstruments
US8164747B2
CA2667650C
EP2092296B1 (CH+LI, NL, SE, DK, DE602007045593.6)
Apparatus, system and method for optical spectroscopic measurementsQualitySpec 7000

TerraSpec Halo

Patent NumbersPatent TitleInstruments
US9207118B2Apparatus, system and method for scanning monochromator and diode array spectrometer instrumentationTerraSpec Halo

QualitySpec Trek

Patent NumbersPatent TitleInstruments
US9207118B2Apparatus, system and method for scanning monochromator and diode array spectrometer instrumentationQualitySpec Trek

Benchtops XRD

Patent NumbersPatent TitleInstruments
US6815684B2
Analytical X-ray apparatus provided with a solid state position sensitive X-ray detectorAeris*
US6823043B2Determination of material parameters
Aeris*
US9506880B2
CN104251870B
EP2818851A1
JP6403452B2
Diffraction imagingAeris*
US7116754B2DiffractometerAeris*
US8488740B2
JP6009156B2
CN102565108B
EP2455747B1 (GB, FR, NL, DE602011022779.3)
DiffractometerAeris*
US7858945B2
JP5254066B2
CN101521246B
EP2088451B1 (GB, FR, NL, DE602008041760.3)
Imaging DetectorAeris*
EP2088625B1 (CH+LI, GB, FR, NL, DE602009040563.2)Imaging detectorAeris*
US6704390B2
X-ray analysis apparatus provided with a multilayer mirror and an exit collimatorAeris*
US9640292B2
JP6564572B2
CN104777179B
EP2896960B1 (GB, FR, NL, DE602014012155.1)
X-ray apparatusAeris
US8477904B2
JP5752434B2
CN102253065B
EP2365319B1 (GB, FR, NL, DE602011055847.1)
X-ray diffraction and computed tomographyAeris*
US7542547B2
JP5280057B2
CN101256160B
EP1947448B1 (CH+LI, GB, FR, NL, DE602007031351.1)
X-ray diffraction equipment for X-ray scattering
Aeris*
EP1287342B1 (GB, FR, DE60147121.0)X-ray diffractometerAeris*
US7477724B2
EP1703276B1 (GB, FR, NL, DE602005033962.0)
X-ray instrumentAeris*
US7194067B2
X-ray optical systemAeris*
US8437451B2
JP5999901B2
CN102610290B
EP2477191B1 (CH+LI, GB, FR, NL, DE602011035906.1)
X-ray shutter arrangementAeris
US9911569B2
JP2016131150A
CN105810541B
EP3043371B1 (GB, FR, NL, DE602015012421.9)
X-ray Tube Anode Arrangement
Aeris*

* Optional / not standard in product