International standards in particle characterization

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00:00:00 International standards in particle characterization
00:01:13 "International standards in particle characterization"
00:02:34 Abstract
00:03:09 Overview
00:04:01 Obligatory Opening Quotation (O2Q)
00:05:14 Interesting map
00:05:49 “How Much and How Many”The story of weights and measures
00:06:21 Jeanne Bendick (1919 – 2014)http://www.theday.com/article/20140403/NWS11/140409834/-1/zip06details&town=Guilford&template=zip06art
00:06:46 Introduction
00:07:21 Standards
00:09:04 ISO TC24/SC4 Particle Characterizationhttp://www.iso.org/iso/standards_development/technical_committees/other_bodies/iso_technical_committee.htm?commid=47176
00:11:17 TC24/SC4 – Participating and observing countries
00:11:54 Leaders of country delegations
00:12:28 ISO TC24/SC4 – Sub-committees
00:13:29 TC24/SC4 - overall
00:14:06 Key TC24/SC4 standards
00:15:15 Non-specific to technique (WG11 and WG1)
00:15:38 Imaging (WG8)
00:16:01 Zeta potential (WG17)(ISO 13099-3 in progress)
00:16:06 Sedimentation (WG2)
00:16:12 Particle Counting (WG12)
00:16:32 Light scattering (WG6 & WG7)
00:17:38 ISO 13320:2009 Particle size analysis -- Laser diffraction methods
00:18:48 ISO TC 229 Nanotechnologies http://www.iso.org/iso/iso_technical_committee?commid=381983
00:20:01 TC 229 – full ISO standards
00:20:25 ISO TC229 Structure
00:21:01 The British influence…
00:21:54 80004 series
00:22:03 ASTM International
00:24:14 Why ASTM International?
00:24:53 ASTM: my committees…
00:25:33 ASTM – Collaboration workspaces
00:26:18 ILS ASTM News November/December 2009
00:26:40 Precision and bias statement
00:27:30 ASTM E29 Particle and Spray Characterization
00:28:21 ASTM E29 Committee Scope
00:28:31 Flyer - 1
00:28:44 Flyer - 2
00:28:52 ASTM E56 Nanotechnology
00:29:13 ASTM E56 - Standards
00:29:57 Work items
00:30:41 IEC - International Electrotechnical Commission
00:31:06 OECD - Organization for Economic Co-operation and Development
00:31:51 Studying materials (BIAC = The Business and Industry Advisory Committee to the OECD)
00:32:26 CEN - Comité Européen de Normalisation
00:33:22 IEEE - Institute of Electrical and Electronics Engineers
00:33:28 Standards (materials manufacturers)
00:34:07 Reference Material
00:36:27 Reminder
00:36:52 QAS – 2 pages (“certified” results and protocols)
00:37:28 Certified Reference Material
00:37:33 NBS 1003cMaterial + protocolGlass beads
00:37:42 NBS1003cMeasured by sieves, diffraction and EZS
00:37:59 It may be that we need other parameters with secondary methods – e.g. RIOptical propertiesImportant even at 40mm!
00:38:42 ISO/REMCO
00:39:17 USP & EP
00:39:59 JP
00:40:14 The offspring of ISO 13320-1: 1999
00:40:45 Note the relationship of USP with EP
00:40:58 Standards are child’s play….
00:41:13 References
00:42:11 The ‘old’ BS 3406 series
00:42:59 BS 3406 – still current
00:43:25 Blatant advertising - my plenary talk at PSA 2014
00:43:43 Previous webinars
00:44:06 Thank you!
00:44:40 Contact Information
We will talk about the large number of international standards (ISO TC24/SC4 and ASTM E29/E56 in particular but also dealing with USP) in particle characterization.