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Do you need elemental analysis of small objects or small inclusions in electronic appliances, toys, jewelry, rocks or finished products?
Epsilon 1 for small spot analysis, a compact X-ray fluorescence spectrometer with an analyzing spot size of 0.8 x 1.2 mm, is the ideal analytical solution for a flexible and precise spot-on analysis.
Due to the self-contained design and small footprint, Epsilon 1 can be placed close to the sample location, making the instrument an ideal solution for any elemental analysis in production facilities, exploration sites, at the shop counter or even at crime sites for forensic investigation.
The performance of the spectrometer meets the standard test methods required by different directives and regulations in various industry markets, like RoHS-3 for electronics and CPSIA for many consumer goods.
Non-destructive analysis: measurements are carried out directly on the sample with little to no sample preparation. Since XRF is a non-destructive technique, the sample can be measured subsequently by other analytical techniques, if required.
Small analyzing spot: Small pieces or small inclusions in samples can easily be analyzed with a collimated X-ray beam. The spot size on the sample is typically 0.8 x 1.2 mm.
Sample positioning: With the help of the color camera and crosshair in the picture, the user can manually position the sample on the analyzing spot of the instrument.
Analysis report: After each analysis, a photograph of the analysis spot is stored on the built-in computer. With a single click an analysis report is generated that includes the photograph.
Spot-on results are provided for a wide range of applications, like RoHS-3, WEEE, ELV, toys, jewelry, rocks and final product inspection.
This is made possible by Omnian, our market-leading standardless analysis software package, also used on the more advanced XRF instruments.
As an out-of-the-box solution, Omnian can be used to analyze a wide variety of elemental compositions from sodium to americium across the periodic table.
With dedicated calibrations, it is possible to follow international test methods, like ASTM F2617 (RoHS), or to screen according to the specifications described by ASTM F963 (toys) and IEC 62123 (electronics).
XRF is a well-established solution for screening and quantification of toxic metals and compounds.
The toxic metal content in electronic goods is regulated by global directives, like RoHS-3, WEEE, ELV, the Administration on the Control of Pollution Caused by Electronic Information Products (Chinese equivalent of RoHS) and other similar directives. All these directives have a slightly different scope, but the commonalities are the restriction of cadmium, lead, mercury, hexavalent chromium and several brominated phenylic flame retardants. ASTM F2617-15 is a well accepted test method to quantify the concentration of the restricted elements and compounds.
Our data sheet demonstrates the capabilities of the Epsilon 1 to comply with ASTM F2617-15, even with an analyzing spot size of 0.8 x 1.2 mm.
Epsilon 1 for Small Spot Analysis is used for a wide range of applications around the world, including:
| Sample loading | Sample positioning with color camera and digital projected crosshair |
|---|---|
| Sample size | Any sample with maximum dimensions of 15x12x10 cm (WxDxH) |
| Safety | Dust and damage protection |
| Features | 15 Watt high-stability semi-ceramic side-window tube
Silver anode, ideal for most elements of the periodic system |
|---|---|
| Current | Max current 1.5 mA, to enable maximum sensitivity for traces |
| Voltage | Max voltage of 50 kV, ideal for analysis of heavier elements |
| Resolution | High-resolution, typical 135 eV |
|---|---|
| Features | SDD10 detector with high count rate capacity
Highly transparent thin beryllium window |
| Software | Omnian standardless analysis, ready for any sample |
|---|---|
| Storage | Automatic storage of camera picture |
| Interface | Operator mode for easy operation
Advanced mode to set up dedicated applications
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Claisse provides its customers with quality Certified Reference Materials (CRM) and Reference Materials (RM) from around the world at competitive prices. Whatever your needs, Claisse strives to provide you with the all around services needed to obtain the perfect solution for your XRF, AA and ICP spectroscopy analysis.
Epsilon software is the XRF analysis software platform that is used with PANalytical’s range of Epsilon 1 and Epsilon 4 benchtop EDXRF systems. The software offers all the functions required to set up and operate an Epsilon benchtop system. The analytical program assembly is greatly facilitated by the high degree of intelligence built into the software, allowing users to benefit from half a century of applications expertise. Daily XRF analysis is a routine task that can be readily carried out by inexperienced personnel after a minimum of instruction. Many features are present to enhance the usability of the software.
The Stratos software module features an algorithm which enables simultaneous determination of chemical composition and thickness of layered materials from measurements taken. The software provides a rapid, simple and non-destructive means of analyzing coatings, surface layers and multi-layered structures. The Virtual Analyst provides intelligence during the setup of measurement programs for complicated stacks.
Available for both the Epsilon 4 EDXRF and Zetium XRF spectrometers, Stratos delivers fast and reliable results regardless of sample type or matrix.
Omnian enables users to achieve the best possible analysis when dedicated methods or certified standards do not exist. A trendsetting standardless analysis package, Omnian incorporates state-of-the-art software and setup samples that transcend technologies. Available for Epsilon 1, Epsilon 4 and Zetium spectrometers, Omnian delivers fast and reliable results regardless of sample type or matrix.
A FingerPrint software module combined with an Epsilon 4 EDXRF system is ideal for material testing when analysis speed is important but the actual composition is not of interest. FingerPrinting generally involves little to no sample preparation and is non-destructive.
The Enhanced Data Security (EDS) module is a software option that provides enhanced trust in results for users of the Zetium XRF spectrometer (through the SuperQ software) and the Epsilon XRF spectrometer. With capabilities including advanced user management, action logging, data protection, and application status assignment, EDS helps you strengthen your audit trail, minimize the risk of error, and prove that your XRF instrument is working as expected.
Claisse LeNeo fusion instrument prepares glass disks for XRF as well as borate and peroxide solutions for AA analysis and ICP analysis. It is a single position electrical instrument.
When correctly installed, your new Epsilon 1 will give you reliable analysis results. Installing an Epsilon 1 is straightforward: unpack the system, plug it in and follow the instructions, which we will guide you through. Finally, a simple radiation test completes the installation and confirms that your system is working safely. Yes, it is that easy to start using your Epsilon 1. And, more importantly, you can rest assured that your system is supplied with the necessary safety certification.
Smart install ensures you can get new instruments up and running even when unexpected circumstances or remote locations prevent an engineer from accessing your facility. For the Epsilon 1, we offer a guided smart installation, enabling you to install the system yourself and maintain the integrity of the instrument and its safety certification.
The advantages of guided smart install:
Find out more about Smart Install.
Version number: 1
Version number: 5
Version number: 5
Please contact support for the latest software version.
Take a look at our basic instruction video series to learn more about Epsilon 1:
To assure that your instrument remains in top condition and performs on the highest level, Malvern Panalytical offers a wide range of services. Our expertise and support services assure an optimal functioning of your instrument.
Service for a lifetime
Adding value to your processes
Fully integrated EDXRF analysis. Pre-calibrated for your industry. Ready for fast quantification in the lab - or to take on the road with you.
