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Epsilon 1 for Small Spot Analysis

Focus on the details to capture the bigger picture

Do you need elemental analysis of small objects or small inclusions in electronic appliances, toys, jewelry, rocks or finished products? Epsilon 1 for small spot analysis, a compact X-ray fluorescence spectrometer with an analyzing spot size of 0.8 x 1.2 mm, is the ideal analytical solution for a flexible and precise spot-on analysis.

Due to the self-contained design and small footprint, Epsilon 1 can be placed close to the sample location, making the instrument an ideal solution for any elemental analysis in production facilities, exploration sites, at the shop counter or even at crime sites for forensic investigation. The performance of the spectrometer meets the standard test methods required by different directives and regulations in various industry markets, like RoHS-3 for electronics and CPSIA for many consumer goods.

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Robust and flexible quantification

Spot-on results are provided for a wide range of applications, like RoHS-3, WEEE, ELV,  toys, jewelry, rocks and final product inspection. This is made possible by Omnian, PANalytical’s market-leading standardless analysis software package, also used on the more advanced XRF instruments.  

As an out-of-the-box solution, Omnian can be used to analyze a wide variety of elemental compositions from sodium to americium across the periodic table. 

Periodic Table GENERIC MP style.jpg

With dedicated calibrations, it is possible to follow international test methods, like ASTM F2617 (RoHS), or to screen according to the specifications described by ASTM F963 (toys) and IEC 62123 (electronics).

ASTM F2617-15 compliancy for RoHS-3

XRF is a well-established solution for screening and quantification of toxic metals and compounds. The toxic metal content in electronic goods is regulated by global directives, like RoHS-3, WEEE, ELV, the Administration on the Control of Pollution Caused by Electronic Information Products (Chinese equivalent of RoHS) and other similar directives. All these directives have a slightly different scope, but the commonalities are the restriction of cadmium, lead, mercury, hexavalent chromium and several brominated phenylic flame retardants. ASTM F2617-15 is a well accepted test method to quantify the concentration of the restricted elements and compounds. Our data sheet demonstrates the capabilities of the Epsilon 1 to comply with ASTM F2617-15, even with an analyzing spot size of 0.8 x 1.2 mm.

ASTM F2617-15 compliancy for RoHS-3


Non-destructive analysis

The measurements are carried out directly on the sample itself with little to no sample preparation. Since XRF is a non-destructive technique, the sample can also be measured subsequently by other analytical techniques, if required.
Non-destructive analysis

Small analyzing spot

Small pieces or small inclusions in samples can easily be analyzed with a collimated X-ray beam. The spot size on the sample is typically 0.8 x 1.2 mm.
Small analyzing spot

Sample positioning

With the help of the color camera and crosshair in the picture, the user can manually position the sample on the analyzing spot of the instrument.
Sample positioning

Analysis report

After each analysis, a photograph of the analysis spot is stored on the built-in computer. With a single click an analysis report is generated that includes the photograph.
Analysis report

Key applications

Key applications:

• RoHS-3 (ASTM F2617-15)
• Toys (ASTM F963-16)
• Jewelry
• Heterogeneous rocks
• Polymer inclusions
• Product inspection
• Forensics


Sample handling X-ray tube Detector Software features
Any sample with maximum dimensions of 15x12x10 cm (WxDxH) 15 Watt high-stability semi-ceramic side-window tube High resolution, typically 135 eV Omnian standardless analysis, ready for any sample
Sample positioning with color camera and digital projected crosshair Max current 1.5 mA, to enable maximum sensitivity for traces SDD10 detector with high count rate capacity Automatic storage of camera picture
Dust and damage protection Silver anode, ideal for most elements of the periodic system Highly transparent thin beryllium window Operator mode for easy operation
Max voltage of 50 kV, ideal for analysis of heavier elements Advanced mode to set up dedicated applications


Standards (Reference materials)


Accurate elemental analysis of RoHS restricted materials


Accurate analysis by XRF of toxic elements in polymers and plastics


Claisse is always there to meet your needs!


Epsilon software

Epsilon software is the XRF analysis software platform that is used with PANalytical’s range of Epsilon 1 and Epsilon 4 benchtop EDXRF systems.

Epsilon software


The software provides a rapid, simple and non-destructive means of analyzing coatings, surface layers and multi-layered structures.


Omnian software enables users to achieve the best possible analysis when dedicated methods or certified standards do not exist.



A FingerPrint software module combined with an Epsilon EDXRF system is ideal for material testing when analysis speed is important but the actual composition is not of interest.




Solutions to maximize the return on your investment

To assure that your instrument remains in top condition and performs on the highest level, Malvern Panalytical offers a wide range of services. Our expertise and support services assure an optimal functioning of your instrument.


Service for a lifetime

  • Phone and remote support
  • Preventive maintenance and checkups
  • Flexible Customer Care Agreements
  • Performance certificates
  • Hardware and software upgrades
  • Local and global support


Adding value to your processes 

  • Sample preparation development/optimization
  • Analytical methodologies 
  • Turnkey solutions for XRD 
  • Operations via IQ/OQ/PQ, quality assurance (GLP, ISO17025) or round robins/inter laboratory studies
  • Automation of lab processes
  • Consultancy services

Training and education

  • Training on-site or at our competence centers
  • Broad range of basic and advanced courses on products, applications and software

Analytical services and calibration materials

  • Expert (XRF) analyses services
  • Oxides and trace analysis
  • Customized calibration materials