Robust and flexible quantification
Spot-on results are provided for a wide range of applications, like RoHS-3, WEEE, ELV, toys, jewelry, rocks and final product inspection. This is made possible by Omnian, PANalytical’s market-leading standardless analysis software package, also used on the more advanced XRF instruments.
As an out-of-the-box solution, Omnian can be used to analyze a wide variety of elemental compositions from sodium to americium across the periodic table.
With dedicated calibrations, it is possible to follow international test methods, like ASTM F2617 (RoHS), or to screen according to the specifications described by ASTM F963 (toys) and IEC 62123 (electronics).
ASTM F2617-15 compliancy for RoHS-3
XRF is a well-established solution for screening and quantification of toxic metals and compounds. The toxic metal content in electronic goods is regulated by global directives, like RoHS-3, WEEE, ELV, the Administration on the Control of Pollution Caused by Electronic Information Products (Chinese equivalent of RoHS) and other similar directives. All these directives have a slightly different scope, but the commonalities are the restriction of cadmium, lead, mercury, hexavalent chromium and several brominated phenylic flame retardants. ASTM F2617-15 is a well accepted test method to quantify the concentration of the restricted elements and compounds. Our data sheet demonstrates the capabilities of the Epsilon 1 to comply with ASTM F2617-15, even with an analyzing spot size of 0.8 x 1.2 mm.
Non-destructive analysisThe measurements are carried out directly on the sample itself with little to no sample preparation. Since XRF is a non-destructive technique, the sample can also be measured subsequently by other analytical techniques, if required.
Small analyzing spotSmall pieces or small inclusions in samples can easily be analyzed with a collimated X-ray beam. The spot size on the sample is typically 0.8 x 1.2 mm.
Sample positioningWith the help of the color camera and crosshair in the picture, the user can manually position the sample on the analyzing spot of the instrument.
Analysis reportAfter each analysis, a photograph of the analysis spot is stored on the built-in computer. With a single click an analysis report is generated that includes the photograph.
|Sample handling||X-ray tube||Detector||Software features|
|Any sample with maximum dimensions of 15x12x10 cm (WxDxH)||15 Watt high-stability semi-ceramic side-window tube||High resolution, typically 135 eV||Omnian standardless analysis, ready for any sample|
|Sample positioning with color camera and digital projected crosshair||Max current 1.5 mA, to enable maximum sensitivity for traces||SDD10 detector with high count rate capacity||Automatic storage of camera picture|
|Dust and damage protection||Silver anode, ideal for most elements of the periodic system||Highly transparent thin beryllium window||Operator mode for easy operation|
|Max voltage of 50 kV, ideal for analysis of heavier elements||Advanced mode to set up dedicated applications|
Standards (Reference materials)
Epsilon software is the XRF analysis software platform that is used with PANalytical’s range of Epsilon 1 and Epsilon 4 benchtop EDXRF systems.
Omnian software enables users to achieve the best possible analysis when dedicated methods or certified standards do not exist.
A FingerPrint software module combined with an Epsilon EDXRF system is ideal for material testing when analysis speed is important but the actual composition is not of interest.
Solutions to maximize the return on your investment
To assure that your instrument remains in top condition and performs on the highest level, Malvern Panalytical offers a wide range of services. Our expertise and support services assure an optimal functioning of your instrument.
Service for a lifetime
- Phone and remote support
- Preventive maintenance and checkups
- Flexible Customer Care Agreements
- Performance certificates
- Hardware and software upgrades
- Local and global support
Adding value to your processes
- Sample preparation development/optimization
- Analytical methodologies
- Turnkey solutions for XRD
- Operations via IQ/OQ/PQ, quality assurance (GLP, ISO17025) or round robins/inter laboratory studies
- Automation of lab processes
- Consultancy services
Training and education
- Training on-site or at our competence centers
- Broad range of basic and advanced courses on products, applications and software
Analytical services and calibration materials
- Expert (XRF) analyses services
- Oxides and trace analysis
- Customized calibration materials