In materials research, the scientist has many analytical questions related to the crystalline constitution of material samples. X-ray diffraction (XRD) is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness. Materials researchers therefore use XRD to analyze a wide range of materials, from powder X-ray diffraction (XRPD) to solids, thin films and nanomaterials.

Science and industry

Many researchers, in industrial as well as in scientific laboratories, rely on X-ray diffraction (XRD) as a tool to develop new materials or to improve production efficiency. Innovations in X-ray diffraction closely follow the research on new materials, such as in semiconductor technologies or pharmaceutical investigations. Industrial research is directed towards ever-increasing speed and efficiency of production processes. Fully automated X-ray diffraction analysis in mining and building materials production sites results in more cost-effective solutions for production control.

XRD Solutions for analytical questions

X-ray diffraction analysis meets many of the analytical needs of a materials scientist. In powders, chemical phases are identified qualitatively as well as quantitatively. High-resolution X-ray diffraction reveals the layer parameters such as composition, thickness, roughness and density in semiconductor thin films. Small-angle X-ray scattering and pair distribution function (PDF) analysis help to analyze the structural properties of nanomaterials. Stresses and preferred orientation can be determined in a wide range of solid objects and engineered components.

Take a look!

Malvern Panalytical invites you to have a further look at the wide range of applications that X-ray diffraction analysis and using an X-ray diffractometer can support in order to solve analytical problems.

Empyrean range

Empyrean range

Multipurpose X-ray diffractometers for your analytical needs

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Measurement Particle shape, Particle size, Crystal structure determination, Phase identification, Phase quantification, Thin film metrology, Contaminant detection and analysis, Residual stress, Epitaxy analysis, Interface roughness, 3D structure / imaging
Goniometer configuration Vertical goniometer, Θ-Θ and ω-Θ
X-ray tube anode material Cu, Co,Cr, Mn, Fe, Mo, Ag
Detector PIXcel1D, PIXcel3D, PIXcel3D 2x2, GaliPIX3D, Proportional counter, Scintilation detector
Technology X-ray Diffraction (XRD), X-ray Imaging

Aeris

Aeris

XRD made easy

More details
Measurement Crystal structure determination, Phase identification, Phase quantification
X-ray tube anode material Cu /Co (option)
Technology X-ray Diffraction (XRD)

Empyrean range

Empyrean range

Multipurpose X-ray diffractometers for your analytical needs

Aeris

Aeris

XRD made easy

More details More details
Measurement Particle shape, Particle size, Crystal structure determination, Phase identification, Phase quantification, Thin film metrology, Contaminant detection and analysis, Residual stress, Epitaxy analysis, Interface roughness, 3D structure / imaging Crystal structure determination, Phase identification, Phase quantification
Goniometer configuration Vertical goniometer, Θ-Θ and ω-Θ  
X-ray tube anode material Cu, Co,Cr, Mn, Fe, Mo, Ag Cu /Co (option)
Detector PIXcel1D, PIXcel3D, PIXcel3D 2x2, GaliPIX3D, Proportional counter, Scintilation detector  
Technology X-ray Diffraction (XRD), X-ray Imaging X-ray Diffraction (XRD)

Aeris

Empyrean range

X'Pert³ MRD

X'Pert³ MRD XL

Aeris Empyrean range X'Pert³ MRD X'Pert³ MRD XL

Benchtop X-ray diffractometer

Multipurpose X-ray diffractometers for your analytical needs

Versatile research & development XRD system

Versatile research, development & quality control XRD system

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Technology
X-ray Diffraction (XRD)
Measurement type
Particle shape
Particle size
Crystal structure determination
Phase identification
Phase quantification
Contaminant detection and analysis
Epitaxy analysis
Interface roughness
3D structure / imaging
Thin film metrology
Residual stress