This application note describes reflectivity measurements on non-ideal sample surfaces. It demonstrates the improvement of the reflectivity curves by the use of a beam knife in measurements on curved glass samples and shows the necessity of the beam knife to get accurate data from this kind of sample.

Grazing incidence X-ray reflectivity extends the area of analytical methods for thin layers. It allows the determination of many important characteristic parameters as layer thickness, interface roughness, layer density and interdiffusion effects between layers. 

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