This datasheet demonstrates that the Epsilon 5 XRF spectrometer provides the ideal solution for the quantification of Ag in ore materials.

Epsilon 5 combines a high kV X-ray source, polarizing optical path and a wide range of secondary targets to optimize the analysis of heavy elements at trace levels. In particular, the choice of several secondary targets also allows the optimal excitation of Ag while providing a simple means of matrix correction by ratioing the analyte lines to the Compton scatter peaks from the secondary targets. 

Login

Not registered yet?

Sign up for free today. By registering you will have free access to exclusive content including

  • Webinars, presentations and videos
  • Application notes, technical notes, articles, white papers and software downloads

And in addition you will receive

  • Our regular eNews including the latest news, education, events and offers from Malvern Panalytical