An application of Stratos is the analysis of InxSy buffer layers that are deposited as coating layers on glass components of solar cells. The determination of thickness of layers is of crucial importance. Another important variable is the stochiometry of the S in the compound which can be varied to obtain specific efficiencies.
The analysis of thin films is not straightforward because the concentration of the elements present in the thin films as well as the thickness of the layers affect the intensity of the fluorescence lines. In addition to this, the interlayer absorption can affect intensities, making the setup of the measurement program more complex. With Stratos making use of the Virtual Analyst these challenges are easily overcome.
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