This work demonstrates the analytical capabilities of the Epsilon 1 to measure a range of compounds found in glass. Glass and its precursor raw materials are commonly measured using X-ray fluorescence (XRF) for process control. As glass is normally very homogeneous, sample preparation will not be needed or otherwise a simple polishing step is sufficient. Three different measuring times were used to demonstrate the typical precisions that can be obtained with Epsilon 1 for soda glass analysis.
The results display the capabilities of the Epsilon 1 for the analysis of major, minor and trace compounds in soda glass.
Precision in XRF can be managed through the selection of measuring time. These data demonstrate the typical precision that can be obtained on this instrument with a selection of different measuring times.
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