Inclusion in aluminum products is usually analyzed and identified by using Scanning Electron Microscope (SEM) and Optical Metallurgical Microscope, in order to find out the root causes of the inclusion source and prevent the recurrence in future. In absence of SEM and Metallurgical Microscope, it is extremely difficult to identify the source of inclusion, which affect the quality of aluminum final products and lead to customer complaints. In this study, a new analytical method is developed using Energy Dispersive XRF (EDXRF) to support the investigation of inclusion’s root causes. The developed method was able to identify one type of aluminum final product inclusion, which is titanium borides. The method is able to provide quantitate analysis successfully.
Inclusion in aluminum products is usually analyzed and identified by using Scanning Electron Microscope (SEM) and Optical Metallurgical Microscope, in order to find out the root causes of the inclusion source and prevent the recurrence in future. In absence of SEM and Metallurgical Microscope, it is extremely difficult to identify the source of inclusion, which affect the quality of aluminum final products and lead to customer complaints. In this study, a new analytical method is developed using Energy Dispersive XRF (EDXRF) to support the investigation of inclusion’s root causes. The developed method was able to identify one type of aluminum final product inclusion, which is titanium borides. The method is able to provide quantitate analysis successfully.
