Stress analysis

Residual stress analysis using X-ray diffraction

Malvern Panalytical's Stress software is dedicated to X-ray diffraction (XRD) analysis of residual stress. Values are calculated according to the well-known single-{hkl} sin²ψ method. User-configurable defaults and instant recalculation of results based on a change of input parameters make Stress ideal for both routine analysis and research applications.

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Features

The most comprehensive classical single-{hkl} sin²ψ stress analysis

The software performs sin²ψ residual stress analysis using both classical single-directional and multi-directional (full stress tensor) techniques. Both chi-stress and omega-stress measurement techniques are incorporated.

Intuitive user interface, automatable analysis

Stress calculates all intermediate results and final stress data instantly. The influence of all parameters is therefore directly reflected in the final result, allowing both novice and expert users to directly judge the influence of changes in the result coming from e.g. peak position determination or application of corrections. 

The Stress software comes with an extensive on-line Help, and a Quick Start Guide. 

User-configurable defaults and instant recalculation of results based on a change of input parameters make Stress ideal for both routine analysis and research applications. The analysis of residual stresses can be fully automated according to predefined strategies using the Automatic Processing Program which is included in the Data Collector software.

Elastic constants database

A dedicated XEC database contains more than 400 verified entries backed up with literature references and a built-in XEC calculator. Data retrieval is possible for isotropic elastic constants, X-ray elastic constants and single-crystal elastic constants.

Reliable results

Stress software contains routines for dealing with minor misalignments and finite accuracies of hardware. Minor misalignments are analyzed based on measurements on a stress-free sample, and can be used to apply corresponding corrections in the analysis of unknown samples. The complete process is documented in the software’s Help system.  

Specification

Measurement systems 

The following systems can be used for collecting and storing stress data:

  • Empyrean with Data Collector 4.0 and higher
  • X’Pert PRO with X’Pert Data Collector 1.3 or 2.0 and higher
  • X’Pert³ with the latest version of Data Collector 4.3 and higher

Recommended system configuration

Designed for and running on Windows 8.1 (64-bit) and Windows 10 (64-bit) Current Branch for Business operating systems.

A PC configuration matching the (minimum) hardware requirements for the desired Windows operation system will be sufficient.

Current version 2.3