Any macroscopic property of a material is directly related to its structural property (e.g. crystallographic symmetry, crystallite size, vacancies, size and shape of nanoparticles or pores). Temperature, pressure, varying gas atmosphere and mechanical stress trigger phase transformation, chemical reactions, recrystallization and so on.
X-ray diffraction (XRD) and X-ray scattering techniques are the first and sometimes the only choice for the correct and accurate in situ characterization of these changes. Whether it is for an optimization of a manufacturing process or tuning of a synthesis procedure, or for state-of-the-art research and creation of new materials, in situ X-ray analysis is the most comprehensive tool for problem solving.
For advanced thin film analysis, stress, texture and basic powder XRD in reflection at temperatures to 1100 ºC.
Anton Paar BTS 150 and BTS 500 benchtop heating stages, a low cost solution for in situ XRD (-10 °C to +500 °C).
Download the leaflet for an overview of the non ambient attachments and their field of application.