X-ray thin film analysis
![]() ZetiumSmart Zetium for reliable results and robust operation |
![]() Axios FASTXRF of choice for highest throughput or shortest measurement time |
![]() 2830 ZTAdvanced semiconductor thin film metrology solution |
![]() Epsilon 4Fast and accurate at-line elemental analysis |
![]() X'Pert³ MRDVersatile research & development XRD system |
![]() X'Pert³ MRD XLVersatile research, development & quality control XRD system |
|
---|---|---|---|---|---|---|
More details | More details | More details | More details | More details | More details | |
Measurement type | ||||||
Thin film metrology | ||||||
Technology | ||||||
Wavelength Dispersive X-ray Fluorescence (WDXRF) | ||||||
X-ray Diffraction (XRD) | ||||||
Energy Dispersive X-ray Fluorescence (EDXRF) |