Epsilon 4 Food & environment

Trust your product quality

  • Multi-functional benchtop XRF analyzer 
  • Tailored for food and environment applications
  • Fast, reliable elemental analysis

Looking for more information?

To request a quote, more information or download a brochure select an option below.


Overview

Growing populations increase the need for better handling of our Earth’s resources. The Epsilon 4, an energy dispersive X-ray fluorescence (EDXRF) spectrometer, is a powerful analytical tool to obtain useful elemental information to maximize crop growth and ensure product and environmental safety.

The latest advances in excitation and detection technologies in Epsilon 4 open possibilities for challenging applications that are traditionally performed by ICP and AAS. Switching from ICP to EDXRF significantly reduces the use of consumables, utilities and time.

Features

  • Optional EPA IO-3.3 factory calibration: For easy adoption and implementation of the XRF method, Malvern Panalytical offers a factory calibration compliant with EPA IO-3.3 regulations for their Epsilon 4 benchtops. The spectrometer will be set up for the analysis of 46 elements, ranging from Na up to U. There is no need to invest in and acquire expensive and fragile standards.

  • The power of benchtop XRF: Combining the latest excitation and detection technologies and smart design, the analytical performance of Epsilon 4 approaches that of more powerful and floor-standing spectrometers. Selective excitation and careful matching of the X-ray tube output to the capabilities of the detection system underlie the system’s outstanding performance.

  • Fast and sensitive: Fast measurements are achieved by using the latest silicon drift detector technology that produces significantly higher intensities. Unique detector electronics enable a linear count rate capacity to over 1,500,000 cps (at 50% dead time) and a count rate independent resolution typically better than 135 eV for better separation of analytical lines in the spectrum. This allows the Epsilon 4 spectrometer to run at full power and therefore realizes a much higher sample throughput compared to traditional EDXRF benchtop instruments.

  • Reduce helium consumption: The high performance of Epsilon 4 enables many applications to be operated in air atmosphere, without longer overhead time and costs involved for helium or maintenance of vacuum system. When measuring in air, low-energy X-ray photons characteristic of sodium, magnesium and aluminium, are sensitive to variations in air pressure and temperature. Built-in temperature and air-pressure sensors compensate for these environmental variations, ensuring excellent results whatever the weather.

Low running costs

  • No need for expensive acids
  • No need for liquid nitrogen
  • No sample preparation, just place the sample directly into the spectrometer.
  • Expensive standards (like air filters) are not destroyed after the analysis and can be re-used as quality control or validation samples.
  • Low maintenance through high-quality X-ray tube and silicon drift detector

Accurate results

  • Powerful deconvolution algorithm in Epsilon software ensures accurate results even when element peaks are overlapping in the XRF spectrum
  • Blank subtraction in Epsilon software provides flexibility and accuracy when analyzing air filters with different backing material
  • Continuous rotation of the sample during measurement minimizes any errors caused by non-homogeneity and provides more accurate results

Value beyond compliance

Epsilon 4 is used to control nutrients in animal feed to keep cattle healthy and minimize manure-related greenhouse gases. 

Other applications include the monitoring of elemental composition of particle matter in ambient air (EPA IO3-3) or of nutrients and salt content in food products. 

Soil and fertilizer can be analyzed to optimize growth conditions and to ensure the absence of toxic elements according to ISO 18227, ISO 15309 and ASTM C1255.

Key applications

Epsilon 4 spectrometers can handle a large variety of sample types, weighing from a few milligrams to larger bulk samples. Samples can be measured as:

  • Solids
  • Pressed powders
  • Loose powders
  • Liquids
  • Fused beads
  • Slurries
  • Granules
  • Filters
  • Films and coatings

Specification

Sample handling

Sample capacity 10-position removable sample changer
Sample size Spectrometer can accommodate samples (soils, liquids, solids and air filters) up to 52 mm in diameter
Features Spinner is included for better accuracy of air filter analysis

X-ray tube

Features Metal-ceramic side window for maximum stability
50 micrometers thin beryllium window for high sensitivity for light elements (Na, Mg, Al, Si)
Tube setting Ag anode X-ray tube for best performance of P, S and Cl analysis

Detector

Detector type High-resolution silicon drift detector (SDD), typically 135 eV @ Mn-Kα
Features Max count rate of 1,500,000 counts/s at 50% dead time
Thin-entrance detector window for high sensitivity

Software

Software
  • Elemental screening with Omnian standardless analysis solution
  • Audit trail software option for enhanced data security in compliance with FDA 21 Cfr part 11
  • PASS/FAIL analysis with FingerPrint solution

Accessories

Software

Epsilon software

Analytical EDXRF software package for Epsilon benchtop systems

Epsilon software is the XRF analysis software platform that is used with PANalytical’s range of Epsilon 1 and Epsilon 4 benchtop EDXRF systems. The software offers all the functions required to set up and operate an Epsilon benchtop system. The analytical program assembly is greatly facilitated by the high degree of intelligence built into the software, allowing users to benefit from half a century of applications expertise. Daily XRF analysis is a routine task that can be readily carried out by inexperienced personnel after a minimum of instruction. Many features are present to enhance the usability of the software.

Omnian

Standardless analysis of all types of samples

Omnian enables users to achieve the best possible analysis when dedicated methods or certified standards do not exist. A trendsetting standardless analysis package, Omnian incorporates state-of-the-art software and setup samples that transcend technologies. Available for Epsilon 1, Epsilon 4 and Zetium spectrometers, Omnian delivers fast and reliable results regardless of sample type or matrix.

Enhanced Data Security

Securing your data and satisfying auditors

The Enhanced Data Security (EDS) module is a software option that provides enhanced trust in results for users of the Zetium XRF spectrometer (through the SuperQ software) and the Epsilon XRF spectrometer. With capabilities including advanced user management, action logging, data protection, and application status assignment, EDS helps you strengthen your audit trail, minimize the risk of error, and prove that your XRF instrument is working as expected.

FingerPrint

Instant material identification

A FingerPrint software module combined with an Epsilon 4 EDXRF system is ideal for material testing when analysis speed is important but the actual composition is not of interest. FingerPrinting generally involves little to no sample preparation and is non-destructive.

Standards (Reference materials)

Omnian

Omnian for standardless elemental analysis of a wide range of materials. More information
Omnian

CRMs

Certified reference materials, including XRF calibration modules and reference materials

More information

User manuals

Software downloads

Please contact support for the latest software version.

Support

Solutions to maximize the return on your investment

To assure that your instrument remains in top condition and performs on the highest level, Malvern Panalytical offers a wide range of services. Our expertise and support services assure an optimal functioning of your instrument.

Support

Service for a lifetime

  • Phone and remote support
  • Preventive maintenance and checkups
  • Flexible Customer Care Agreements
  • Performance certificates
  • Hardware and software upgrades
  • Local and global support

Expertise

Adding value to your processes 

  • Sample preparation development/optimization
  • Analytical methodologies 
  • Turnkey solutions for XRD 
  • Operations via IQ/OQ/PQ, quality assurance (GLP, ISO17025) or round robins/inter laboratory studies
  • Consultancy services

Training and education

  • Training on-site or at our competence centers
  • Broad range of basic and advanced courses on products, applications and software
Powerful at-line elemental analysis.

Powerful at-line elemental analysis.

The latest technology for XRF analysis. Maximize crop growth and ensure product and environmental safety with fast, reliable analysis.

Contact sales Request a quote Request a demo