This application note demonstrates the performance of the Axios FAST XRF spectrometer for the analysis of Al-Si and Al-Mg alloys.
Accurate and fast elemental analysis during the production process of aluminum and its base materials is a critical requirement. Measurements were performed using an Axios FAST simultaneous X-ray fluorescence spectrometer equipped with a 4 kW Rh SST-mAX X-ray tube.
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