X-ray diffractometers are designed for obtaining the ultimate quality diffraction data, combined with ease of use and flexibility to quickly switch to different applications.

Malvern Panalytical's X-ray diffractometers are used in many environments, from universities and research institutes to industrial process control labs. Whatever your X-ray diffraction (XRD) need, we offer the right diffractometer, backed up by our worldwide sales and service organization.

All our multipurpose diffractometers are all equipped with PreFIX (pre-aligned, fast interchangeable X-ray) modules, making a change in the optical path effortless for the user. For this reason, we offer the most applications on a single diffractometer platform. Read more in our knowledge center about the many exciting XRD applications you can do with our benchtop and floorstanding X-ray diffractometers.

Empyrean range

Empyrean range

Multipurpose X-ray diffractometers for your analytical needs

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Measurement Particle shape, Particle size, Crystal structure determination, Phase identification, Phase quantification, Thin film metrology, Contaminant detection and analysis, Residual stress, Epitaxy analysis, Interface roughness, 3D structure / imaging
Goniometer configuration Vertical goniometer, Θ-Θ and ω-Θ
X-ray tube anode material Cu, Co,Cr, Mn, Fe, Mo, Ag
Detector PIXcel1D, PIXcel3D, PIXcel3D 2x2, GaliPIX3D, Proportional counter, Scintilation detector
Technology X-ray Diffraction (XRD), X-ray Imaging

Aeris

Aeris

XRD made easy

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Measurement Crystal structure determination, Phase identification, Phase quantification
X-ray tube anode material Cu /Co (option)
Technology X-ray Diffraction (XRD)

Empyrean range

Empyrean range

Multipurpose X-ray diffractometers for your analytical needs

Aeris

Aeris

XRD made easy

More details More details
Measurement Particle shape, Particle size, Crystal structure determination, Phase identification, Phase quantification, Thin film metrology, Contaminant detection and analysis, Residual stress, Epitaxy analysis, Interface roughness, 3D structure / imaging Crystal structure determination, Phase identification, Phase quantification
Goniometer configuration Vertical goniometer, Θ-Θ and ω-Θ  
X-ray tube anode material Cu, Co,Cr, Mn, Fe, Mo, Ag Cu /Co (option)
Detector PIXcel1D, PIXcel3D, PIXcel3D 2x2, GaliPIX3D, Proportional counter, Scintilation detector  
Technology X-ray Diffraction (XRD), X-ray Imaging X-ray Diffraction (XRD)

Aeris

Empyrean range

X'Pert³ MRD

X'Pert³ MRD XL

Aeris Empyrean range X'Pert³ MRD X'Pert³ MRD XL

Benchtop X-ray diffractometer

Multipurpose X-ray diffractometers for your analytical needs

Versatile research & development XRD system

Versatile research, development & quality control XRD system

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Technology
X-ray Diffraction (XRD)
Measurement type
Particle shape
Particle size
Crystal structure determination
Phase identification
Phase quantification
Contaminant detection and analysis
Epitaxy analysis
Interface roughness
3D structure / imaging
Thin film metrology
Residual stress