SDCOM

Able to measure any single crystal with a diameter between 2 mm to 300 mm, the SDCOM uses the azimuthal scan method to precisely determine the complete lattice orientation of single crystals in just one measuring rotation – taking only a few seconds. 

Suitable for both research, production and quality control, the versatile and accessible SDCOM fits easily into a wide range of wafer and ingot process steps while having minimal operational costs due to no requirement for water cooling.