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Zetium

X-ray fluorescence spectrometry (XRF) is capable of elemental analysis of a wide range of materials, including solids, liquids and loose powders. Designed to meet the most demanding process control and R&D applications, the Zetium XRF spectrometer leads the market in high-quality design and innovative features for sub ppm to percentage analysis of Be to Am. 

Building on years of experience and success with our extensive analytical X-ray portfolio, Zetium represents a revolutionary step in materials analysis. The platform embodies SumXcore technology – an integration of WDXRF and EDXRF. This unique combination of possibilities puts Zetium in a class of its own with respect to analytical power, speed and task flexibility in multiple environments.

Dedicated industry editions of the Zetium XRF spectrometer are offered for specific industries: cementmineralsmetalspetrochemicals and polymers & plastics. The Ultimate edition configuration meets the most demanding requirements regardless of industry.

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Events and training

All events

10:00 - 11:00 | Portuguese

Webinar: Desvendando a cadeia analítica das tintas e revestimentos: da matéria-prima à aplicação final

Products:
Zetium, Mastersizer range, Zetasizer range, Epsilon range, OMNISEC system
Technology:
Light Scattering, X-ray Fluorescence (XRF), Gel Permeation Chromatography, Multi-Angle Dynamic Light Scattering (MADLS)
Measurement type:
Molecular size, Molecular weight, Viscosity, Particle size, Elemental analysis, Particle shape
Webinar: Desvendando a cadeia analítica das tintas e revestimentos: da matéria-prima à aplicação final

Trade Show & Expo |

XXII B-MRS MEETING 2024

Products:
Aeris range, Empyrean range, Epsilon range, Mastersizer range, Zetium
Technology:
X-ray Fluorescence (XRF), X-ray Diffraction (XRD), X-ray Scattering, Light Scattering
Measurement type:
Chemical identification, Crystal structure determination, Elemental analysis, Elemental quantification, Particle size, Phase identification, Phase quantification, Residual stress, Texture analysis, Thin film metrology
XXII B-MRS MEETING 2024

Meeting & Networking |

38e Séminaire OMA - Bureau de Québec

Products:
Aeris range, Claisse range, Epsilon range, Insitec range, Mastersizer range, Zetium
Technology:
X-ray Fluorescence (XRF), X-ray Diffraction (XRD), Laser Diffraction, Borate fusion, X-ray Scattering
Measurement type:
Elemental analysis, Elemental quantification, Particle size, Contaminant detection and analysis, Phase identification, Phase quantification, Residual stress, Texture analysis
38e Séminaire OMA - Bureau de Québec

16:00 - 16:50 | English

Services that work for you: Unleash the full potential of your Malvern Panalytical solution

Products:
Axios, Crystal orientation range, Empyrean, Revontium, Zetium
Technology:
Grating-coupled interferometry (GCI), Image analysis, Light Scattering, Microfluidics, Multi-Angle Dynamic Light Scattering (MADLS), Nanoparticle Tracking Analysis, Near-infrared Spectroscopy (NIR), Raman spectroscopy, X-ray Diffraction (XRD), X-ray Fluorescence (XRF), X-ray Imaging, X-ray Scattering
Measurement type:
Binding affinity, Binding kinetics, Chemical identification, Crystal structure determination, Elemental analysis, Elemental quantification, Particle concentration, Particle shape, Particle size, Phase identification, Phase quantification, Powder flow, Thin film metrology, Zeta potential
Services that work for you: Unleash the full potential of your Malvern Panalytical solution