DDCOM
Ultra-fast, bottom surface measuring crystal orientation in a compact package
- Measurement
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Crystal structure determination
- Technology
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X-ray Diffraction (XRD)
Crystal orientation range
Fast, accurate crystal orientation
Fast, accurate crystal orientation
Our Crystal Orientation solutions are designed with boule, ingot, puck and wafer applications in mind. Our products offer simple, ultra-fast crystal orientation in a range of environments.
From fully automated on-line analysis to quick quality checks, we have you covered.
