Contaminant detection and analysis

Identifying and understanding process issues and assuring product quality and safety

Contaminant detection and analysis

Contamination can prove detrimental to product quality and process efficiency, and may also pose serious public health or environmental safety concerns. Therefore, the levels of hazardous elements in electronic goods and consumer products are limited by health & safety regulations. 

Contaminants or foreign particles come from a wide range of sources, including corroded or damaged equipment parts, catalysts, cross-contamination of a process, packaging, or even from biological origin.

Our instruments

Contaminant detection, enumeration and in some cases contaminant identification, enable process issues to be pinpointed and help assure product safety and quality. 

Malvern Panalytical provides solutions for contaminant analysis that help you understand and monitor both your processes and products. These are used across a range of industries, including forensic science, water treatment, additive manufacturing, pharmaceuticals and biopharmaceuticals, building materialsfood and drinks, fuels and fine chemicals.

How our products compare

  • Morphologi range

    Automated imaging for advanced particle characterization

    Morphologi range

    Technology

    • Image analysis
    • Wavelength Dispersive X-ray Fluorescence (WDXRF)
    • Energy Dispersive X-ray Fluorescence (EDXRF)
    • X-ray Diffraction (XRD)
    • Pulsed Fast Thermal Neutron Activation (PFTNA)
  • Zetium

    High end floor-standing WDXRF spectrometers

    Zetium

    Technology

    • Image analysis
    • Wavelength Dispersive X-ray Fluorescence (WDXRF)
    • Energy Dispersive X-ray Fluorescence (EDXRF)
    • X-ray Diffraction (XRD)
    • Pulsed Fast Thermal Neutron Activation (PFTNA)
  • Epsilon range

    EDXRF benchtop and on-line spectrometers

    Epsilon range

    Technology

    • Image analysis
    • Wavelength Dispersive X-ray Fluorescence (WDXRF)
    • Energy Dispersive X-ray Fluorescence (EDXRF)
    • X-ray Diffraction (XRD)
    • Pulsed Fast Thermal Neutron Activation (PFTNA)
  • Empyrean range

    Multipurpose X-ray diffractometers

    Empyrean range

    Technology

    • Image analysis
    • Wavelength Dispersive X-ray Fluorescence (WDXRF)
    • Energy Dispersive X-ray Fluorescence (EDXRF)
    • X-ray Diffraction (XRD)
    • Pulsed Fast Thermal Neutron Activation (PFTNA)
  • 2830 ZT

    Advanced semiconductor thin film metrology solution

    2830 ZT

    Technology

    • Image analysis
    • Wavelength Dispersive X-ray Fluorescence (WDXRF)
    • Energy Dispersive X-ray Fluorescence (EDXRF)
    • X-ray Diffraction (XRD)
    • Pulsed Fast Thermal Neutron Activation (PFTNA)
  • CNA range

    On-line crossbelt elemental analyzers

    CNA range

    Technology

    • Image analysis
    • Wavelength Dispersive X-ray Fluorescence (WDXRF)
    • Energy Dispersive X-ray Fluorescence (EDXRF)
    • X-ray Diffraction (XRD)
    • Pulsed Fast Thermal Neutron Activation (PFTNA)